
基本信息:
- 专利标题: PARTICLE IMAGE ANALYSIS DEVICE
- 专利标题(中):VORRICHTUNG ZUR PARTIKELBILDANALYSE
- 申请号:EP10804341.5 申请日:2010-07-23
- 公开(公告)号:EP2461153A1 公开(公告)日:2012-06-06
- 发明人: SUZUKI Akiko , OOWADA Norio , TAKI Miki , MITSUYAMA Satoshi , MANRI Chihiro
- 申请人: Hitachi High-Technologies Corporation
- 申请人地址: 24-14, Nishi Shimbashi 1-chome Minato-ku Tokyo 105-8717 JP
- 专利权人: Hitachi High-Technologies Corporation
- 当前专利权人: HITACHI HIGH-TECH CORPORATION, JP
- 当前专利权人地址: HITACHI HIGH-TECH CORPORATION, JP
- 代理机构: Buchetmann, Dominik
- 优先权: JP2009175994 20090729
- 国际公布: WO2011013595 20110203
- 主分类号: G01N21/27
- IPC分类号: G01N21/27 ; G01N15/14 ; G01N21/47
摘要:
A conventional flow type particle analysis apparatus could not detect both a human error, such as leaving behind a sample, a shortage of the sample, or a shortage of a reagent, and an abnormality of a flow path system by an inexpensive and simple method. A particle analysis apparatus according to the present invention includes means that perform processes upon image processing of images (110) acquired in a measurement of the sample, simultaneously with a normal image processing for classifying target particles. The means included are: image processing means (110a) for calculating information of RGB density distributions of each whole image; abnormal state determination processing means (110c) for determining whether or not the acquired images are in an abnormal state according to tendencies of the RGB density distributions; and an abnormality judgment process means for making final determination of the existence of an abnormality by calculating an appearance frequency of abnormal images after all measurements for the one sample is completed. These means allow diagnosis of abnormalities to be conducted simultaneously with normal analysis without changing the configuration of the conventional apparatus.
摘要(中):
传统的流式粒子分析装置通过廉价且简单的方法不能同时检测诸如留下样品,样品短缺或试剂短缺以及流路系统异常的人为错误。 根据本发明的粒子分析装置包括在用于分类目标粒子的正常图像处理的同时,对在样本的测量中获取的图像(110)进行图像处理的处理。 包括的装置是:用于计算每个整个图像的RGB浓度分布的信息的图像处理装置(110a) 用于根据RGB密度分布的趋势确定所获取的图像是否处于异常状态的异常状态确定处理装置(110c); 以及异常判断处理装置,用于通过在完成所述一个样本的所有测量之后计算异常图像的出现频率来最终确定异常的存在。 这些装置允许诊断异常与正常分析同时进行,而不改变常规装置的结构。
公开/授权文献:
- EP2461153B1 PARTICLE IMAGE ANALYSIS DEVICE 公开/授权日:2019-10-02
IPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01N | 借助于测定材料的化学或物理性质来测试或分析材料 |
------G01N21/00 | 利用光学手段,即利用红外光、可见光或紫外光来测试或分析材料 |
--------G01N21/01 | .便于进行光学测试的装置或仪器 |
----------G01N21/21 | ..影响偏振的性质 |
------------G01N21/27 | ...利用光电检测 |