基本信息:
- 专利标题： Lens inspection device
- 专利标题（中）：装置用于测试光学透镜
- 申请号：EP06025845.6 申请日：2001-04-30
- 公开(公告)号：EP1816467A3 公开(公告)日：2009-11-18
- 发明人： Morita, Masaya , Mori, Ryo , Yuito, Fumio
- 申请人： Fujifilm Corporation
- 申请人地址： 26-30 Nishiazabu 2-chome Minato-ku Tokyo JP
- 专利权人： Fujifilm Corporation
- 当前专利权人： Fujifilm Corporation
- 当前专利权人地址： 26-30 Nishiazabu 2-chome Minato-ku Tokyo JP
- 代理机构： Klunker . Schmitt-Nilson . Hirsch
- 优先权： JP2000131944 20000501; JP2000279874 20000914
- 主分类号： G01N21/958
- IPC分类号： G01N21/958 ; G01N21/88
摘要：
The lens inspection system permits detecting scratches, extraneous objects, such as stains, and other kinds of defects of an optical member with high accuracy.
A light beam is projected from one side onto a lens to inspect, and a light transmitted and scattered through the lens is photo-electrically detected as a dark field image of the lens on the other side of the lens, and when the intensity of the photoelectric signal detected from an inspection range of a photoelectric imaging device goes above a preset level, the lens is judged to be defective.
A light beam is projected from one side onto a lens to inspect, and a light transmitted and scattered through the lens is photo-electrically detected as a dark field image of the lens on the other side of the lens, and when the intensity of the photoelectric signal detected from an inspection range of a photoelectric imaging device goes above a preset level, the lens is judged to be defective.
公开/授权文献:
- EP1816467A2 Lens inspection device 公开/授权日：2007-08-08
IPC结构图谱:
| G | 物理 |
| --G01 | 测量；测试 |
| ----G01N | 借助于测定材料的化学或物理性质来测试或分析材料 |
| ------G01N21/00 | 利用光学手段，即利用红外光、可见光或紫外光来测试或分析材料 |
| --------G01N21/01 | .便于进行光学测试的装置或仪器 |
| ----------G01N21/88 | ..测试瑕疵、缺陷或污点的存在 |
| ------------G01N21/95 | ...特征在于待测物品的材料或形状 |
| --------------G01N21/958 | ....检测透明材料 |