基本信息:
- 专利标题： Lens inspection device
- 专利标题（中）：Vorrichtung zumPrüfenvon optischen Linsen
- 申请号：EP06025845.6 申请日：2001-04-30
- 公开(公告)号：EP1816467A2 公开(公告)日：2007-08-08
- 发明人： Morita, Masaya , Mori, Ryo , Yuito, Fumio
- 申请人： Fujifilm Corporation
- 申请人地址： 26-30 Nishiazabu 2-chome Minato-ku Tokyo JP
- 专利权人： Fujifilm Corporation
- 当前专利权人： Fujifilm Corporation
- 当前专利权人地址： 26-30 Nishiazabu 2-chome Minato-ku Tokyo JP
- 代理机构： Klunker . Schmitt-Nilson . Hirsch
- 优先权： JP2000131944 20000501; JP2000279874 20000914
- 主分类号： G01N21/958
- IPC分类号： G01N21/958
摘要：
The lens inspection system permits detecting scratches, extraneous objects, such as stains, and other kinds of defects of an optical member with high accuracy.
A light beam is projected from one side onto a lens to inspect, and a light transmitted and scattered through the lens is photo-electrically detected as a dark field image of the lens on the other side of the lens, and when the intensity of the photoelectric signal detected from an inspection range of a photoelectric imaging device goes above a preset level, the lens is judged to be defective.
摘要（中）：
A light beam is projected from one side onto a lens to inspect, and a light transmitted and scattered through the lens is photo-electrically detected as a dark field image of the lens on the other side of the lens, and when the intensity of the photoelectric signal detected from an inspection range of a photoelectric imaging device goes above a preset level, the lens is judged to be defective.
透镜检查系统能够高精度地检测光学构件的划痕，异物等污渍等各种缺陷。 将光束从一侧投影到透镜上以检查，并且通过透镜透射和散射的光被光电检测为透镜的另一侧上的透镜的暗视场图像，并且当强度为 从光电成像装置的检查范围检测到的光电信号超过预设值，判断为有缺陷。
公开/授权文献:
- EP1816467A3 Lens inspection device 公开/授权日：2009-11-18
IPC结构图谱:
| G | 物理 |
| --G01 | 测量；测试 |
| ----G01N | 借助于测定材料的化学或物理性质来测试或分析材料 |
| ------G01N21/00 | 利用光学手段，即利用红外光、可见光或紫外光来测试或分析材料 |
| --------G01N21/01 | .便于进行光学测试的装置或仪器 |
| ----------G01N21/88 | ..测试瑕疵、缺陷或污点的存在 |
| ------------G01N21/95 | ...特征在于待测物品的材料或形状 |
| --------------G01N21/958 | ....检测透明材料 |