发明公开
EP1793410A4 SPHERICAL ABERRATION CORRECTION ELECTROSTATIC LENS, INPUT LENS, ELECTRON SPECTROSCOPIC DEVICE, PHOTOELECTRON MICROSCOPE, AND MEASUREMENT SYSTEM
有权
![SPHERICAL ABERRATION CORRECTION ELECTROSTATIC LENS, INPUT LENS, ELECTRON SPECTROSCOPIC DEVICE, PHOTOELECTRON MICROSCOPE, AND MEASUREMENT SYSTEM](/ep/2009/10/21/EP1793410A4/abs.jpg.150x150.jpg)
基本信息:
- 专利标题: SPHERICAL ABERRATION CORRECTION ELECTROSTATIC LENS, INPUT LENS, ELECTRON SPECTROSCOPIC DEVICE, PHOTOELECTRON MICROSCOPE, AND MEASUREMENT SYSTEM
- 专利标题(中):静电透镜校正球面像差,输入镜头,电子分光设备,光电子显微镜和测量系统
- 申请号:EP04822204 申请日:2004-11-09
- 公开(公告)号:EP1793410A4 公开(公告)日:2009-10-21
- 发明人: DAIMON HIROSHI , MATSUDA HIROYUKI , KATO MAKOTO , KUDO MASATO
- 申请人: NAT UNIV CORP NARA INST , JEOL LTD
- 专利权人: NAT UNIV CORP NARA INST,JEOL LTD
- 当前专利权人: NAT UNIV CORP NARA INST,JEOL LTD
- 优先权: JP2004208926 2004-07-15
- 主分类号: H01J37/244
- IPC分类号: H01J37/244 ; G01N23/227 ; H01J37/12 ; H01J37/285
IPC结构图谱:
H | 电学 |
--H01 | 基本电气元件 |
----H01J | 放电管或放电灯 |
------H01J37/00 | 有把物质或材料引入使受到放电作用的结构的电子管,如为了对其检验或加工的 |
--------H01J37/02 | .零部件 |
----------H01J37/244 | ..检测器;所采用的组件或电路 |