![伴随粒子中子检测的自动时间标定方法](/CN/2018/1/326/images/201811631306.jpg)
基本信息:
- 专利标题: 伴随粒子中子检测的自动时间标定方法
- 申请号:CN201811631306.1 申请日:2018-12-28
- 公开(公告)号:CN109632837B 公开(公告)日:2020-05-19
- 发明人: 郑玉来 , 王强 , 王国宝 , 李永 , 郭凤美 , 杨璐 , 田利军 , 刘超 , 田星皓 , 颜静儒
- 申请人: 中国原子能科学研究院
- 申请人地址: 北京市房山区新镇三强路1号院
- 专利权人: 中国原子能科学研究院
- 当前专利权人: 中国原子能科学研究院
- 当前专利权人地址: 北京市房山区新镇三强路1号院
- 代理机构: 中科专利商标代理有限责任公司
- 代理人: 张成新
- 主分类号: G01N23/00
- IPC分类号: G01N23/00 ; G01V5/10
The invention provides an automatic time calibration method along with particle neutron detection. The time calibration method comprises the following steps: placing a graphite block at a certain distance in front of a neutron generator; controlling the neutron generator to emit neutron beams to the graphite block; measuring an alpha-gamma conformance flight time spectrum based on an associated particle detection technology; determining a spectrum peak formed by directly acting neutrons on the graphite block according to the measured alpha-gamma conformance flight time spectrum, and taking theconformance time corresponding to the spectrum peak as measurement reference time; and carrying out neutron detection on a detection object to determine content characteristics of related elements inthe detection object. According to the method, the problem that the calibration time of a Si semiconductor detector used for measuring the accompanying particles along with temperature and time changes is unstable is solved, the detection positioning precision of the to-be-detected object is ensured, and accurate analysis of element characteristics in a detection area is realized.
公开/授权文献:
- CN109632837A 伴随粒子中子检测的自动时间标定方法 公开/授权日:2019-04-16
IPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01N | 借助于测定材料的化学或物理性质来测试或分析材料 |
------G01N23/00 | 利用未包括在G01N21/00或G01N22/00组内的波或粒子辐射来测试或分析材料,例如X射线、中子 |