![一种低压集抄功耗带载及互换性功能的自动测试装置](/CN/2018/1/105/images/201810525389.jpg)
基本信息:
- 专利标题: 一种低压集抄功耗带载及互换性功能的自动测试装置
- 专利标题(英):Automatic test device with low-voltage collection and power consumption loading and interchangeability function
- 申请号:CN201810525389.X 申请日:2018-05-28
- 公开(公告)号:CN108508308A 公开(公告)日:2018-09-07
- 发明人: 肖勇 , 李鹏 , 金鑫 , 张乐平 , 胡珊珊 , 王吉 , 万路
- 申请人: 南方电网科学研究院有限责任公司 , 中国南方电网有限责任公司电网技术研究中心
- 申请人地址: 广东省广州市萝岗区科学城科翔路11号J1栋3、4、5楼及J3栋3楼
- 专利权人: 南方电网科学研究院有限责任公司,中国南方电网有限责任公司电网技术研究中心
- 当前专利权人: 南方电网科学研究院有限责任公司,中国南方电网有限责任公司电网技术研究中心中国南方电网有限责任公司
- 当前专利权人地址: 广东省广州市萝岗区科学城科翔路11号J1栋3、4、5楼及J3栋3楼
- 代理机构: 北京集佳知识产权代理有限公司
- 代理人: 张春水; 唐京桥
- 主分类号: G01R31/00
- IPC分类号: G01R31/00 ; G01R35/04
The invention provides an automatic test device with a low-voltage collection and power consumption loading and interchangeability function. The device comprises a first body, a second body, a first test bottom plate and a second test bottom plate; the first body is provided with a first slot position for mounting a low-voltage collection terminal to be tested and a second slot position for installing a standard communication module; the first slot position is electrically connected to the second slot position; a first test bottom plate includes a standard communication module pin header, a first MCU and a first control detection circuit; the standard communication module pin header, the first control detection circuit and the first MCU are sequentially connected; the standard communication module pin header and the first MCU are all connected with an upper monitor; the first control detection circuit is connected with the standard communication module through the standard communication module pin header; the second test bottom plate includes a third slot position, a second MCU and a second control detection circuit; the second body is used for pressing the communication module tobe tested into the third slot position; the third slot position and the second MCU are connected to the upper monitor; the third slot position, the second control detection circuit and the second MCUare sequentially connected.
IPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01R | 测量电变量;测量磁变量(通过转换成电变量对任何种类的物理变量进行测量参见G01类名下的 |
------G01R31/00 | 电性能的测试装置;电故障的探测装置;以所进行的测试在其他位置未提供为特征的电测试装置 |