![一种旋转式铁谱仪谱片光密度测量分析系统及方法](/CN/2016/1/168/images/201610842608.jpg)
基本信息:
- 专利标题: 一种旋转式铁谱仪谱片光密度测量分析系统及方法
- 专利标题(英):System and method for measuring and analyzing optical density of spectrum film of rotary ferrograph
- 申请号:CN201610842608.8 申请日:2016-09-22
- 公开(公告)号:CN106248539A 公开(公告)日:2016-12-21
- 发明人: 刘同冈 , 程干 , 张海聪 , 赵金宝 , 魏巍宏
- 申请人: 中国矿业大学
- 申请人地址: 江苏省徐州市大学路1号中国矿业大学南湖校区
- 专利权人: 中国矿业大学
- 当前专利权人: 中国矿业大学
- 当前专利权人地址: 江苏省徐州市大学路1号中国矿业大学南湖校区
- 代理机构: 南京经纬专利商标代理有限公司
- 代理人: 姜慧勤
- 主分类号: G01N15/04
- IPC分类号: G01N15/04 ; G01N3/56
The invention discloses a system and a method for measuring and analyzing optical density of a spectrum film of a rotary ferrograph. The system comprises a trinocular microscope, an electric object stage, a motor driver, a photoelectric sensor, a trans-impedance amplifier, a multifunctional board card and an upper computer, wherein the trinocular microscope comprises a light source and an object lens, and the electric object stage provided with a limit switch is arranged between the light source and the object lens; a third ocular lens of the trinocular microscope is connected with the photoelectric sensor, an illumination receiving surface of the photoelectric sensor is vertical to a light path of the third ocular lens, and the center of the illumination receiving surface of the photoelectric sensor is arranged on the axis of the light path of the third ocular lens; and the photoelectric sensor is connected with the multifunctional board card by virtue of the trans-impedance amplifier, the multifunctional board card is also respectively connected with the upper computer and the motor driver, and the motor driver is connected with the electric object stage provided with the limit switch. The method disclosed by the invention has the advantages that abrasive particle coverage area percentages at different positions of the spectrum film can be automatically measured, labour intensity of operating personnel is reduced, and testing efficiency and test data accuracy are improved.
公开/授权文献:
- CN106248539B 一种旋转式铁谱仪谱片光密度测量分析系统及方法 公开/授权日:2023-07-18
IPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01N | 借助于测定材料的化学或物理性质来测试或分析材料 |
------G01N15/00 | 测试颗粒的特性;测试多孔材料的渗透性,孔隙体积或者孔隙表面积 |
--------G01N15/04 | .测试悬浮颗粒的沉积 |