
基本信息:
- 专利标题: 一种局部放电特高频传感器的性能测试装置与测试方法
- 专利标题(英):Performance testing device and testing method for partial discharge ultra-high frequency sensor
- 申请号:CN201510131413.8 申请日:2015-03-25
- 公开(公告)号:CN104777443A 公开(公告)日:2015-07-15
- 发明人: 陈孝信 , 钱勇 , 许永鹏 , 舒博 , 张一鸣 , 魏翀 , 盛戈皞 , 江秀臣
- 申请人: 上海交通大学
- 申请人地址: 上海市闵行区东川路800号
- 专利权人: 上海交通大学
- 当前专利权人: 上海驹电电气科技有限公司
- 当前专利权人地址: 上海市闵行区东川路800号
- 代理机构: 上海新天专利代理有限公司
- 代理人: 张宁展
- 主分类号: G01R35/00
- IPC分类号: G01R35/00
The invention discloses a performance testing device for a partial discharge ultra-high frequency sensor. The device comprises a gigahertz transverse electromagnetic cell, a vector network analyzer, a polytetrafluoroethylene cover plate, a data processing computer, a checking antenna and the ultra-high frequency sensor to be tested. The vector network analyzer is used simultaneously as signal input and output ends, so that the device is high in cost performance and convenient to implement. The invention further provides a method for testing the performance of the sensor by utilizing the testing device. Time-domain and frequency-domain parameters representative of the performance of the sensor can be simultaneously given, and the advantages of reliability, accuracy and the like are achieved.
公开/授权文献:
- CN104777443B 一种局部放电特高频传感器的性能测试装置与测试方法 公开/授权日:2017-09-29
IPC结构图谱:
G | 物理 |
--G01 | 测量;测试 |
----G01R | 测量电变量;测量磁变量(通过转换成电变量对任何种类的物理变量进行测量参见G01类名下的 |
------G01R35/00 | 包含在本小类其他组中的仪器的测试或校准 |