摘要:
An excimer laser system with an automatic fluorine control system to permit precise control of the fluorine concentration within an F2 "sweet spot" in a gas discharge laser chamber. This is done with a computer control system which monitors laser parameters, determines DELTA E/ DELTA V, the change of pulse energy with voltage, and automatically and precisely controls the fluorine concentration based on DELTA E/ DELTA V without the need to actually measure the fluorine concentration. The present invention is especially useful in lithography environments in which photo resist having a wide range of sensitivity are used. The present invention permits operation of the laser at substantially maximum efficiency over a wide range of pulse energy outputs.