会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明申请
    • METHOD AND APPARATUS TO CALIBRATE INTENSITY AND DETERMINE FRINGE ORDER FOR INTERFEROMETRIC MEASUREMENT OF SMALL SPACINGS
    • 用于校准强度的方法和装置,并确定用于小间距干涉测量的FRINGE ORD
    • WO1995017646A1
    • 1995-06-29
    • PCT/US1994014676
    • 1994-12-14
    • PHASE METRICS
    • PHASE METRICSLACEY, ChristopherROSS, Edward, W.
    • G01C09/02
    • G11B21/12G01B11/14G11B21/21G11B33/10
    • The apparatus and method for measuring a small spacing down to contact uses interferometric fringe intensity calibration to calibrate maximum and minimum intensity of two or more monochromatic of quasi-monochromatic interference patterns caused by a spacing between two articles (10, 12), one of which is transparent (10). The intensity calibration is done by measuring maximum and minimum fringe intensity of each color (81, 82) while altering the spacing by at least 1/4 of the wavelength of the light or other electromagnetic radiation being used. The calibration by changing spacing allows the fringe order to be calculated for each wavelength of the radiation being used. This calibration procedure allows the maximum and minimum intensity of the radiation to be known, as well as the fringe order of the interference patterns to be calculated. With the maximum and minimum intensities and the fringe orders known, the spacing is readily calculated from the interferometric theory.
    • 用于测量向下接触的小间距的装置和方法使用干涉条纹强度校准来校准由两个物品(10,12)之间的间隔引起的两个或更多个单色的准单色干涉图案的最大和最小强度,其中之一 是透明的(10)。 通过测量每种颜色(81,82)的最大和最小条纹强度,同时将间距改变为所使用的光或其他电磁辐射的至少1/4波长来进行强度校准。 通过改变间隔的校准允许针对所使用的辐射的每个波长计算条纹顺序。 该校准程序允许了解辐射的最大和最小强度以及要计算的干涉图案的边缘顺序。 利用已知的最大和最小强度和边缘级,可以从干涉测量理论中容易地计算间距。
    • 2. 发明申请
    • OPTICAL SURFACE DETECTION FOR MAGNETIC DISKS
    • 磁性光盘的光学表面检测
    • WO1997034124A1
    • 1997-09-18
    • PCT/US1997003814
    • 1997-03-12
    • PHASE METRICS, INC.
    • PHASE METRICS, INC.BREZOCZKY, BlasiusPOGREBINSKY, Vladimir
    • G01C09/02
    • G01N21/88
    • An automatic surface inspection apparatus (10) comprises a light source (12) that provides a coherent light beam (20) that is split (14) and then recombined in a prism (21) to generate an interference pattern. A cylindrical lens (26) projects the interference pattern onto the surface of a disk (30) as a line of light (50). A linear detection array (45) converts the reflected line of light into an electrical signal that has a magnitude which varies dependent upon the reflected light intensity. Defects present on the surface of the disk cause variations in the reflected light intensity manifested as differences in the electrical signal output by the detection array (45).
    • 自动表面检查装置(10)包括提供相干光束(20)的光源(12),所述相干光束(20)被分离(14),然后在棱镜(21)中重新组合以产生干涉图案。 柱面透镜(26)将干涉图案作为光线(50)突出到盘(30)的表面上。 线性检测阵列(45)将反射的光线转换成具有取决于反射光强度而变化的幅度的电信号。 存在于盘的表面上的缺陷导致反射光强度的变化,表现为由检测阵列(45)输出的电信号的差异。
    • 4. 发明申请
    • ALIGNMENT DEVICE
    • 对齐设备
    • WO1991017410A1
    • 1991-11-14
    • PCT/GB1991000675
    • 1991-04-29
    • SMITH, Michael, John
    • G01C09/02
    • G01C9/28G01C9/02
    • An alignment device comprises a body (10) with two reference faces at right angles. A cord (15) has one end attached to the interior of the body (10) and extends out through an aperture (17) in the body. Position sensing means are mounted in the body for sensing and indicating any deviation of the angular position of the cord (15) from a reference position relative to the reference faces. The device also includes level sensing means for levelling the device, these level sensing means being mounted in a plate (11) which is rotatably mounted in the device. The position sensing means and the level sensing means may both be mechanical, electrical, or electronic. The cord may engage with a pulley coupled to a revolution counter.
    • 对准装置包括具有两个参考面成直角的主体(10)。 线(15)的一端连接到主体(10)的内部并且延伸穿过主体中的孔(17)。 位置检测装置安装在本体中,用于检测并指示绳索(15)的角位置相对于参考面的参考位置的任何偏离。 该装置还包括用于调平装置的液位感测装置,这些液位传感装置安装在可旋转地安装在装置中的板(11)中。 位置检测装置和液位检测装置可以都是机械的,电的或电子的。 绳索可以与连接到转台的皮带轮啮合。