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    • 2. 发明申请
    • EXPLOITING PCM WRITE ASYMMETRIES TO ACCELERATE WRITE
    • 开发PCM写入不对称以加速写入
    • WO2014107335A1
    • 2014-07-10
    • PCT/US2013/076913
    • 2013-12-20
    • UNIVERSITY OF MAINE SYSTEM BOARD OF TRUSTEES
    • ZHU, YifengYUE, Jianhui
    • G11C11/00
    • G11C13/0004G11C13/0061G11C13/0069G11C2211/5642G11C2211/5647
    • To improve the write performance of PCM, the disclosed technology, in certain embodiments, provides a new write scheme, referred to herein as two-stage-write, which leverages the speed and power asymmetries of writing a zero bit and a one bit. Writing a data block to PCM is divided into two separated stages, i.e., write-0 stage and write-1 stage. Without violating power constraints, during the write-0 stage, all zero bits in this data block are written to PCM at an accelerated speed; during the write-1 stage, all one bits are written to PCM, with more bits being written concurrently. In certain embodiments, the disclosed technology provides a new coding scheme to improve the speed of the write-1 stage by further increasing the number of bits that can be written to PCM in parallel.
    • 为了提高PCM的写入性能,在某些实施例中,所公开的技术提供了一种新的写入方案,这里称为两级写入,其利用写零位和一位的速度和功率不对称性。 将数据块写入PCM被划分为两个分离的阶段,即写入0阶段和写入阶段。 没有违反功率限制,在写0阶段,该数据块中的所有零位都以加速的速度写入PCM; 在写-1阶段,所有一个位都写入PCM,同时写入更多位。 在某些实施例中,所公开的技术提供了一种新的编码方案,以通过进一步增加可并行写入PCM的比特数来提高写入级的速度。
    • 5. 发明申请
    • SENSE AMPLIFIER FOR FLASH MEMORIES
    • 感应放大器用于闪存
    • WO99014758A1
    • 1999-03-25
    • PCT/US1998/014797
    • 1998-07-17
    • G11C16/06G11C7/06G11C11/56G11C16/02G11C16/28G11C7/00
    • G11C16/28G11C7/06G11C7/062G11C7/065G11C11/5621G11C11/5642G11C2211/5642
    • A sense amplifier (800) for a nonvolative writeable memory is described. The sense amplifier (800) has preamplifier (802) coupled to receive a signal from a grounded-gate p-channel metal-oxide semiconductor input stage. A differential input latch (804) is coupled to the preamplifier output. The differential input latch (804) uses a pair of cross-coupled inverters. A logic device (806) is coupled to the differential input latch output and provides the sense amplifier output signal. The logic device (806) reduces the offset in the differential input latch (804) and provides an output indicative of one of a number of stages or voltage levels of the cell.
    • 描述了用于非易失性可写存储器的读出放大器(800)。 读出放大器(800)具有耦合以从接地栅p沟道金属氧化物半导体输入级接收信号的前置放大器(802)。 差分输入锁存器(804)耦合到前置放大器输出端。 差分输入锁存器(804)使用一对交叉耦合的反相器。 逻辑器件(806)耦合到差分输入锁存器输出并提供读出放大器输出信号。 逻辑器件(806)减小差分输入锁存器(804)中的偏移,并且提供指示单元的多个级或电压电平之一的输出。
    • 6. 发明申请
    • PAGE MODE FLOATING GATE MEMORY DEVICE STORING MULTIPLE BITS PER CELL
    • 页面模式浮动栅格存储器设备存储每个单元的多个位
    • WO1997048098A1
    • 1997-12-18
    • PCT/US1996010374
    • 1996-06-14
    • MACRONIX INTERNATIONAL CO., LTD.HUNG, Chun-HsiungWAN, Ray-LinCHENG, Yao-Wu
    • MACRONIX INTERNATIONAL CO., LTD.
    • G11C07/00
    • G11C16/3445G11C11/5621G11C11/5628G11C11/5642G11C16/10G11C16/3436G11C16/3459G11C2211/5622G11C2211/5642G11C2216/14
    • An array (10) of multi-level floating gate memory cells includes wordlines (18) connected to memory cells along a row in the array, and bit lines (12) connected to memory cells along a column in the array. A wordline voltage source (27) is included which supplies selectively wordline voltages corresponding to respective threshold voltages of the memory cells in the array. A plurality of bit latches form a page buffer (11). Bit latches are coupled to corresponding bit lines, and have a first state and a second state. The bit latches include circuits (213-216) to change the bit latches from the first state to the second state in response to signals on the corresponding bit lines that are generated in response to a wordline voltage on a selected wordline being greater than or equal to the threshold voltage of a memory cell on the corresponding bit line connected to the selected wordline. Logic (21) controls the wordline voltage source and the bit latches to apply in a sequence the wordline voltages, and to sense the state of the bit latches after applying each wordline voltage in the sequence to determine the threshold voltages of the memory cells.
    • 多级浮动栅极存储单元的阵列(10)包括连接到阵列中的行的存储单元的字线(18)和沿列阵列的存储单元连接的位线(12)。 包括字线电压源(27),其选择性地提供对应于阵列中的存储器单元的各个阈值电压的字线电压。 多个位锁存器形成页缓冲器(11)。 位锁存器耦合到对应的位线,并且具有第一状态和第二状态。 比特锁存器包括响应于所选择的字线上的字线电压响应于相应位线上响应的信号而将位锁存器从第一状态改变到第二状态的电路(213-216)大于或等于 到连接到所选字线的相应位线上的存储器单元的阈值电压。 逻辑(21)控制字线电压源和位锁存器以序列施加字线电压,并且在施加序列中的每个字线电压以确定存储器单元的阈值电压之后感测位锁存器的状态。
    • 7. 发明申请
    • MULTI-LEVEL NON-VOLATILE DATA STORAGE
    • 多级非易失性数据存储
    • WO1997007513A1
    • 1997-02-27
    • PCT/US1996013211
    • 1996-08-14
    • LEXAR MICROSYSTEMS, INC.
    • LEXAR MICROSYSTEMS, INC.ASSAR, MahmudKESHTBOD, Parviz
    • G11C11/56
    • G11C16/0483G11C11/5621G11C11/5628G11C11/5642G11C2211/5621G11C2211/5634G11C2211/5642
    • A multi-level NAND architecture non-volatile memory device reads and programs memory cells, each cell storing more than one bit of data, by comparing to a constant current level while selectively adjusting the gate voltage on the cell or cells being read or programmed. A plurality of read and write reference cells are provided each programmed to correspond to one each of the multi-level programming wherein during reading of the memory cells, the read reference cells provide the constant current level and during writing to the memory cells, the write reference cells provide the same. Furthermore, during a read operation, corresponding write reference cells are coupled to read reference cells to gauge the reading time associated with reading of memory cells.
    • 多级NAND架构非易失性存储器件通过与恒定电流电平进行比较来读取和编程存储单元,每个存储单元存储多于一位的数据,同时选择性地调整读或编程的单元或单元上的栅极电压。 提供多个读取和写入参考单元,每个编程为对应于多级编程中的每一个,其中在读取存储器单元期间,读取的参考单元提供恒定电流电平,并且在写入存储器单元期间,写入 参考细胞提供相同的。 此外,在读取操作期间,将相应的写入参考单元耦合到读取参考单元以测量与读取存储器单元相关联的读取时间。