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    • 3. 发明申请
    • A PROBE FOR NON-DESTRUCTIVE TESTING
    • 非破坏性测试的探索
    • WO2005038449A1
    • 2005-04-28
    • PCT/AU2004/001431
    • 2004-10-18
    • COMMONWEALTH SCIENTIFIC AND INDUSTRIAL RESEARCH ORGANISATION
    • DICKINSON, LaurenceWAGNER, Stewart
    • G01N29/26
    • G01N29/265G01N29/07G01N2291/044G01N2291/101G01N2291/263
    • The present invention provides a probe (10) for non-destructive testing of an item. The probe is movable over a surface of the item and comprises a receiver (12, 14) for receiving a return signal for the non-destructive testing of the item. The probe also comprises a displacement means (16) for providing a displacement signal indicative of a spatial displacement of the probe over the item as the probe is moved over the item. Further, the probe comprises a support structure (20) for holding the displacement means and the receiver over the surface of the item. At least one of the displacement means and the receiver is moveable relative to at least a portion of the support structure whereby testing of an item having a curved surface is facilitated.
    • 本发明提供一种用于物品的非破坏性测试的探针(10)。 探头可以在物品的表面上移动并且包括用于接收用于物品的非破坏性测试的返回信号的接收器(12,14)。 探头还包括位移装置(16),用于当探针在物品上移动时,提供指示探针在物品上的空间位移的位移信号。 此外,探针包括用于将移位装置和接收器保持在物品表面上的支撑结构(20)。 位移装置和接收器中的至少一个相对于支撑结构的至少一部分是可移动的,从而便于具有弯曲表面的物品的测试。