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1. 发明申请

WO2016071053A1 PROCESS AND ASSEMBLY FOR TESTING ELECTRICAL AND OPTICAL PARAMETERS OF A PLURALITY OF LIGHT-EMITTING DEVICES 审中-公开
标题翻译：用于测试多种发光设备的电气和光学参数的过程和组件
公开(公告)号：WO2016071053A1
公开(公告)日：2016-05-12
申请号：PCT/EP2015/072559
申请日：2015-09-30
申请人： RASCO GMBH , ISMECA SEMICONDUCTOR HOLDING SA
发明人： SCARPELLA, Massimo , NESTOROVIC, Sasa
IPC分类号： G01R31/26
CPC分类号： G01R31/2635 , G01B11/02 , G01B11/24 , G01R31/2601 , G01R31/2653 , G06T2207/30148
摘要： According to the present invention there is provided a method for testing electrical and optical parameters of a group of light-emitting devices, the method comprising the steps of, bringing the group of devices to a test position wherein light emitted by the devices in the group can be received into an integrating sphere; performing, electrical testing of the devices in the group in parallel, so that electrical parameters of each of the devices in the group can be determined; performing, in a sequential device-by-device manner, optical testing of the devices in the group, so that optical parameters of each of the devices in the group can be determined. There is further provided a corresponding assembly.
摘要翻译：根据本发明，提供了一种用于测试一组发光器件的电气和光学参数的方法，所述方法包括以下步骤：将所述器件组放置在测试位置，其中由所述组中的器件发射的光可以接收到一个积分球; 对组中的设备进行并行的电测试，从而可以确定组中每个设备的电参数; 以逐个逐个装置的方式执行组中的设备的光学测试，使得可以确定组中的每个设备的光学参数。还提供了相应的组件。

2. 发明申请

WO2013117265A1 NEST FOR TESTING ELECTRICAL COMPONENTS 审中-公开
标题翻译：测试电气部件
公开(公告)号：WO2013117265A1
公开(公告)日：2013-08-15
申请号：PCT/EP2012/074397
申请日：2012-12-05
申请人： ISMECA SEMICONDUCTOR HOLDING SA
发明人： VIENOT, Sylvain , VIVERGE, Philippe , SCARPELLA, Massimo , ROY, Philippe
IPC分类号： G01R31/28 , G01R1/04 , G01R31/26
CPC分类号： G01R1/0408 , G01R31/2635 , G01R31/2865 , G01R31/2893
摘要： A nest (1) comprising, a fix part (3), and a movable part (5), wherein the fix (part 3) and movable part (5) are configured to cooperate so as to define a (pocket 7) which can receive at least a part of an electrical component (25), wherein the movable part (5) is moveable between a first position and a second position, wherein in the first position the pocket (7) is open so that at least part of the electrical component can be moved into the pocket (7), and in the second position the pocket (7) is closed so that the at least part of the electrical component (25) positioned in the pocket is secured within the pocket, wherein the nest (1) further comprises a biasing means (9) which is arranged to bias the movable part (5) towards its second position. There is further provided a nest assembly, a component handling assembly, and a table comprising said nest.
摘要翻译：一种包括固定部分（3）和可移动部分（5）的嵌套（1），其中所述固定件（3）和可移动部件（5）构造成协作以便限定（口袋7）接收电气部件（25）的至少一部分，其中所述可移动部件（5）可在第一位置和第二位置之间移动，其中在所述第一位置，所述口袋（7）是敞开的，使得所述至少一部分电气部件可以移动到口袋（7）中，并且在第二位置，口袋（7）被关闭，使得定位在口袋中的电气部件（25）的至少一部分被固定在口袋内，其中，嵌套（1）还包括偏置装置（9），其被设置成朝向其第二位置偏压可动部分（5）。还提供了一个嵌套组件，部件处理组件以及包括所述嵌套的工作台。

3. 发明申请

WO2016071124A1 AN ASSEMBLY AND METHOD FOR TESTING OPTICAL DEVICES 审中-公开
标题翻译：用于测试光学器件的组件和方法
公开(公告)号：WO2016071124A1
公开(公告)日：2016-05-12
申请号：PCT/EP2015/074606
申请日：2015-10-23
申请人： RASCO GMBH , ISMECA SEMICONDUCTOR HOLDING SA
发明人： SCARPELLA, Massimo , NESTOROVIC, Sasa
IPC分类号： G01R31/26
CPC分类号： G01R31/2635 , G01B11/02 , G01B11/24 , G01R31/2601 , G01R31/2653 , G06T2207/30148
摘要： According to the present invention there is provided an assembly for testing optical devices, the assembly comprising, a light integrating sphere (5a); a mask member (160) defining an inlet window (51) for the light integrating sphere (5a); and a plurality of inlet adaptor members (170), each of which can be selectively arranged to cooperate with the mask member (160) so as to modify the amount of the inlet window (51 ) through which light can pass into the light integrating sphere (5a), and wherein each the plurality of inlet adaptor members (170) comprise openings (171) having different shapes and/or dimensions. There is further provided a corresponding method for testing parameters of a group of optical devices using the assembly.
摘要翻译：根据本发明，提供了一种用于测试光学器件的组件，该组件包括：光积分球（5a）; 限定用于所述光积分球（5a）的入口窗（51）的掩模构件（160）; 以及多个入口适配器构件（170），每个入口适配器构件（170）可以选择性地布置成与掩模构件（160）配合，以便改变入射窗（51）的量，光可以通过该入口窗口（51）进入光积分球（5a），并且其中每个所述多个入口适配器构件（170）包括具有不同形状和/或尺寸的开口（171）。还提供了用于使用该组件测试一组光学装置的参数的相应方法。

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