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    • 1. 发明申请
    • PROJECTION LENS, PROJECTION EXPOSURE APPARATUS AND PROJECTION EXPOSURE METHOD FOR EUV MICROLITHOGRAPHY
    • 投影镜头,投影曝光装置和投影曝光方法
    • WO2016041805A1
    • 2016-03-24
    • PCT/EP2015/070391
    • 2015-09-07
    • CARL ZEISS SMT GMBH
    • ANDRÉ, StephanGOLDE, DanielGRUNER, ToralfRUOFF, JohannesWABRA, NorbertSCHNEIDER, RicardaSCHNEIDER, Sonja
    • G03F7/20
    • G03F7/70266G03F7/7015G03F7/70233G03F7/70258
    • A projection lens (PO) for imaging a pattern arranged in an object plane (OS) of the projection lens into an image plane (IS) of the projection lens by means of electromagnetic radiation having an operating wavelength λ from the extreme ultraviolet range (EUV) comprises a multiplicity of mirrors (M1 - M6) having mirror surfaces which are arranged in a projection beam path between the object plane and the image plane in such a way that a pattern of a mask (M) that is arranged in the object plane is imagable into the image plane by means of the mirrors. A first imaging scale in a first direction (y-direction) running parallel to a scan direction is smaller in terms of absolute value than a second imaging scale in a second direction (x-direction) perpendicular to the first direction. Provision is made of a dynamic wavefront manipulation system for correcting astigmatic wavefront aberration portions caused by reticle displacement.
    • 一种投影透镜(PO),用于通过具有来自极紫外线范围的工作波长λ(EUV)的电磁辐射,将布置在投影透镜的物平面(OS)中的图案成像为投影透镜的像平面(IS) )包括多个反射镜(M1-M6),其具有布置在物平面和图像平面之间的投影光束路径中的镜面,使得布置在物平面中的掩模(M)的图案 通过镜子可以进入图像平面。 在与第一方向垂直的第二方向(x方向)上,在与扫描方向平行的第一方向(y方向)上的第一成像刻度在绝对值上小于第二成像刻度。 提供了一种用于校正由掩模版位移引起的散光波前像差部分的动态波前操纵系统。
    • 2. 发明申请
    • ILLUMINATION AND DISPLACEMENT DEVICE FOR A PROJECTION EXPOSURE APPARATUS
    • 投影曝光装置的照明和位移装置
    • WO2013075930A1
    • 2013-05-30
    • PCT/EP2012/071846
    • 2012-11-05
    • CARL ZEISS SMT GMBH
    • SCHNEIDER, SonjaWABRA, NorbertVON HODENBERG, MartinBITTNER, BorisSCHNEIDER, Ricarda
    • G03F7/20
    • G03F7/2002G03F7/70191G03F7/70558
    • An illumination and displacement device for a projection exposure apparatus (1) comprises an illumination optical unit (25) for illuminating an illumination field (18). An object holder (17a) serves for mounting an object (17) in such a way that at least one part of the object (17) can be arranged in the illumination field (18). An object holder drive (17b) serves for displacing the object (17) during illumination in an object displacement direction (y). A correction device (23) serves for the spatially resolved influencing of an intensity of the illumination at least of sections of the illumination field (18), wherein there is a spatial resolution of the influencing of the intensity of the illumination of the illumination field (18) at least along the object displacement direction (y). This results in an illumination and displacement device in which field-dependent imaging aberrations which are present during the projection exposure do not undesirably affect a projection result.
    • 投影曝光装置(1)的照明和位移装置包括用于照明照明场(18)的照明光学单元(25)。 物体保持器(17a)用于安装物体(17),使得物体(17)的至少一部分可以布置在照明区域(18)中。 物体保持器驱动器(17b)用于在物体移动方向(y)的照射期间使物体(17)移动。 校正装置(23)用于对照明场(18)的至少部分的照明强度进行空间分辨的影响,其中存在影响照明场照明强度的空间分辨率( 18)至少沿着物体位移方向(y)。 这导致照明和位移装置,其中在投影曝光期间存在的场依赖的成像像差不会不期望地影响投影结果。
    • 4. 发明申请
    • PROJECTION EXPOSURE METHOD AND PROJECTION EXPOSURE APPARATUS FOR MICROLITHOGRAPHY
    • 投影曝光方法和投影曝光装置
    • WO2015049319A1
    • 2015-04-09
    • PCT/EP2014/071096
    • 2014-10-01
    • CARL ZEISS SMT GMBH
    • BITTNER, BorisWABRA, NorbertVON HODENBERG, MartinSCHNEIDER, Sonja
    • G03F7/20
    • G03F7/70083G03F7/70258G03F7/70525G03F7/706G03F7/70891
    • Projection exposure method for exposing a radiation-sensitive substrate (W) with at least one image of a pattern comprises the following steps: providing the pattern between an illumination system (ILL) and a projection lens (PO) of a projection exposure apparatus (WSC) in such a way that the pattern is arranged in the region of an object plane (OS) of the projection lens and can be imaged by means of the projection lens into an image plane (IS) of the projection lens, said image plane being optically conjugate with respect to the object plane, wherein imaging-relevant properties of the pattern can be characterized by pattern data; illuminating an illumination region of the pattern with an illumination radiation provided by the illumination system (ILL) in accordance with an illumination setting which is specific to a use case and which can be characterized by illumination setting data; characterized by: determining use case data which are specific to the use case and which comprise pattern data and/or illumination setting data; determining imaging specification data using the use case data; controlling controllable optical components of the projection lens (PO) by means of a control unit (CU) of the projection lens in a manner dependent on the imaging specification data for the purpose of adapting the imaging behaviour of the projection lens to the use case; imaging the pattern onto the substrate with the aid of the projection lens adapted to the use case.
    • 用于使图案的至少一个图像曝光于辐射敏感基板(W)的投影曝光方法包括以下步骤:在投影曝光装置(WSC)的照明系统(ILL)和投影透镜(PO)之间提供图案 ),使得图案布置在投影透镜的物平面(OS)的区域中,并且可以通过投影透镜成像到投影透镜的像平面(IS)中,所述图像平面是 相对于物平面光学共轭,其中图案的成像相关特性可以通过图案数据表征; 利用照明系统(ILL)提供的照明辐射来照射图案的照明区域,该照明区域根据用例特有的照明设置,并且可以通过照明设置数据表征; 其特征在于:确定用例特有的用例数据,其中包括图案数据和/或照明设置数据; 使用所述用例数据确定成像规格数据; 通过投影透镜的控制单元(CU)以取决于成像指定数据的方式控制投影透镜(PO)的可控光学部件,以将投影透镜的成像行为适应于用例; 借助于适合用例的投影透镜将图案成像到基板上。
    • 5. 发明申请
    • OPTICAL ASSEMBLY
    • 光学装置
    • WO2015007832A1
    • 2015-01-22
    • PCT/EP2014/065357
    • 2014-07-17
    • CARL ZEISS SMT GMBH
    • PAULS, WalterWAGNER, HendrikAHLES, FlorianWALD, ChristianFRITZSCHE, SteffenWABRA, NorbertBITTNER, BorisSCHNEIDER, SonjaSCHNEIDER, Ricarda
    • G03F7/20
    • G03F7/70058G03F7/70258G03F7/7085
    • The invention relates to an optical assembly (100), in particular for a lithography system for imaging lithographic micro- or nanostructures, comprising at least two optical elements (101, 103) arranged successively in a beam path of the optical assembly (100), an acquisition device (110) designed to acquire radiation signals (131) from marking elements (414, 424, 720, 721, 722, 723) on or at the at least two optical elements (101, 103), the marking elements (414, 424) being fitted outside of optically active regions (102, 104) of the at least two optical elements (101, 103), wherein the acquisition device (110) is arranged outside a beam path (132) between a first optical element (101) and a last optical element (103) of the at least two optical elements (101, 103), wherein the radiation signals (131) contain information about one or a plurality of properties of an optically active surface (102, 104) of the at least two optical elements (101, 103), and a control device (120), which is coupled to the acquisition device (110) and which is designed to determine the plurality of properties of the optically active surface (102, 104) of the at least two optical elements (101, 103) as a function of the information contained in the radiation signals (131) originating from the marking elements. The invention additionally relates to a method for operating the optical assembly (100).
    • 本发明涉及一种光学组件(100),特别涉及用于成像光刻微观或纳米结构的光刻系统,其包括依次布置在光学组件(100)的光束路径中的至少两个光学元件(101,103) 设计用于从所述至少两个光学元件(101,103)上或所述至少两个光学元件(101,103)上的标记元件(414,424,720,721,722,723)获取辐射信号(131)的采集设备(110),所述标记元件 ,424)被安装在所述至少两个光学元件(101,103)的光学活性区域(102,104)之外,其中所述采集装置(110)布置在第一光学元件 101)和所述至少两个光学元件(101,103)的最后一个光学元件(103),其中所述辐射信号(131)包含关于光学活性表面(102,104)的一个或多个特性的信息 所述至少两个光学元件(101,103)和控制装置(120) 耦合到所述采集装置(110)并被设计成根据所述辐射中包含的信息确定所述至少两个光学元件(101,103)的所述光学活性表面(102,104)的多个属性 来自标记元件的信号(131)。 本发明还涉及一种用于操作光学组件(100)的方法。