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    • 1. 发明申请
    • MACHINE FOR EMPTYING A MOULD
    • 机器用于模具
    • WO2006109130A1
    • 2006-10-19
    • PCT/IB2006/000825
    • 2006-04-10
    • C & G S.P.A.LUMINI, FrancoSPINOGLIO, Dario, Francesco
    • LUMINI, FrancoSPINOGLIO, Dario, Francesco
    • A23G1/28A23G3/02
    • A23G1/28A23G1/24A23G1/26A23G3/0278A23G3/0284A23G3/2046A23G3/2053
    • Machine for emptying a mould is equipped with inlet means (2) to adduce mould (M), provided with recesses (R) positioned upward and containing products (P) formed therein, to a turning means (3) of the mould, fit to turn the recesses (R) downward. The machine 1 comprises advancing means (4) and an emptying means (5) of the tilted mould and transporting means (6) below for the products detached from the moulds. The advancing means (4) comprises guiding means (7) positioned downstream in respect to the adduction motion (F) of the turning means (3) to house in sliding manner the moulds (M) extracted from the turning means (3) and mutually pushed along the guiding means (7) by means of linear actuator means (8) nearly aligned and opposed, in respect to the turning means (3) , to said guiding means (7).
    • 用于排空模具的机器配备有引入模具(M)的入口装置(2),其具有向上定位的凹部(R)并且包含形成在其中的产品(P))到模具的转动装置(3),适合于 向下转动凹槽(R)。 机器1包括下方的倾斜模具和输送装置(6)的推进装置(4)和排空装置(5),用于从模具分离的产品。 推进装置(4)包括相对于转动装置(3)的内推运动(F)位于下游的引导装置(7),以滑动方式容纳从转动装置(3)中提取的模具(M) 通过相对于转动装置(3)几乎对准和相对的线性致动器装置(8)沿着引导装置(7)推动到所述引导装置(7)。
    • 2. 发明申请
    • DEVICE AND METHOD FOR MEASURING A THICKNESS
    • 用于测量厚度的装置和方法
    • WO2006109129A1
    • 2006-10-19
    • PCT/IB2006/000823
    • 2006-04-10
    • C & G S.P.A.LUMINI, Franco
    • LUMINI, Franco
    • G01B7/06G01B11/06
    • G01B11/0616
    • A method for measuring the thickness of a layer (L) of a material (M) on a support (S) comprises: in an initial condition, in which the support (S) is not covered with the layer (L), to provide the control means, by means of at least a first sensor (3), with at least a signal of the distance between the first sensor and the support (S); to memorize by means of the control means at least a value of the at least a signal of the distance between the first sensor and the support (S); in an operational condition in which the support (S) is covered with the layer (L), to provide the control means, by means of at least a first sensor (3), with signals of the distance from the first sensor to the layer (L); to subtract, by means of the control means, the at least a value of the at least a signal of the distance between the first sensor and the support (S) from at least a signal value of the distance from the first sensor to the layer (L) in order to obtain the thickness values of the layer (L).
    • 用于测量支撑体(S)上的材料(M)的层(L)的厚度的方法包括:在初始状态下,支撑体(S)未被层(L)覆盖,以提供 所述控制装置借助于至少第一传感器(3)至少具有所述第一传感器和所述支撑件(S)之间的距离的信号; 通过所述控制装置存储所述第一传感器和所述支撑件(S)之间的距离的至少一个信号的值的至少一个值; 在支撑体(S)被层(L)覆盖的操作状态下,通过至少第一传感器(3)提供具有从第一传感器到层的距离的信号的控制装置 (L); 通过所述控制装置从至少从所述第一传感器到所述层的距离的信号值减去所述第一传感器和所述支撑件(S)之间的距离的所述至少一个信号的至少一个值 (L),以获得层(L)的厚度值。