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    • 2. 发明申请
    • METHOD OF FABRICATING A PROBE DEVICE FOR A METROLOGY INSTRUMENT AND PROBE DEVICE PRODUCED THEREBY
    • 制作计量仪器的探针装置和生产的探针装置的方法
    • WO2009086534A1
    • 2009-07-09
    • PCT/US2008/088479
    • 2008-12-29
    • VEECO INSTRUMENTS INC.WANG, WeijieNAGLE, Steven
    • WANG, WeijieNAGLE, Steven
    • G12B21/08
    • G01Q60/38G01Q70/10
    • A method of producing a probe device 50 for a metrology instrument such as an AFM includes providing a substrate and forming a stock extending upwardly from the substrate. The stock 60 is preferably FIB milled to form a tip 76 of the probe device. The tip preferably has a high aspect ratio, with a height that is at least about 1 micron for performing critical dimension (e.g., deep trench) atomic force microscopy. The stock is preferably pedestal shaped having a distal end 68 that is substantially planar which can be machined into a tip in at least less than about 2 minutes. With the preferred embodiments, the FIB milling step can be completed in substantially fewer and less complicated steps than known techniques to produce a high aspect ratio tip suitable for DT-AFM in less than about one minute.
    • 制造用于诸如AFM的计量仪器的探针装置50的方法包括提供基底并形成从基底向上延伸的原料。 坯料60优选地被研磨以形成探针装置的尖端76。 尖端优选具有高纵横比,高度为至少约1微米,用于执行临界尺寸(例如,深沟槽)原子力显微镜。 坯料优选地是基座形的,其具有大致平面的远端68,其可以在至少小于约2分钟内被加工成尖端。 利用优选实施例,可以以比已知技术更少且更简单的步骤完成FIB研磨步骤,以在小于约一分钟内产生适用于DT-AFM的高纵横比尖端。