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1. 发明申请

WO2008032983A1 TRAY HANDLING APPARATUS AND SEMICONDUCTOR DEVICE INSPECTING METHOD USING THE SAME 审中-公开
标题翻译：托盘处理装置和半导体装置检测方法
公开(公告)号：WO2008032983A1
公开(公告)日：2008-03-20
申请号：PCT/KR2007/004399
申请日：2007-09-12
申请人： INTEKPLUS CO., LTD. , IM, Ssang-geun , LEE, Sang-yun , KO, Seung-gyu , KIM, Youn-soo
发明人： IM, Ssang-geun , LEE, Sang-yun , KO, Seung-gyu , KIM, Youn-soo
IPC分类号： H01L21/677
CPC分类号： G01R31/2893 , H01L21/673 , H01L21/67742
摘要： Disclosed is a tray handling apparatus in which the conveyance and inversion of a tray can be performed simultaneously to thereby achieve a rapid inspecting operation and a simplified apparatus configuration, and a semiconductor device inspecting method using the tray handling apparatus. The tray handling apparatus includes an inverting unit to turn the tray, in which objects are received, upside down, and a transfer device to convey the object receiving tray from one conveyor to another conveyor while being reciprocally moved above a body of the apparatus. The inverting unit is integrally provided at a lower end of the transfer device, to allow the conveyance and inversion of the tray to be performed simultaneously.
摘要翻译：公开了一种托盘处理装置，其中可以同时执行托盘的输送和倒转，从而实现快速检查操作和简化的装置构造，以及使用托盘处理装置的半导体装置检查方法。托盘处理装置包括翻转单元，用于转动托盘，其中物体被接收，上下颠倒，以及传送装置，用于将物体接收托盘从一个传送器传送到另一个传送器，同时在设备的主体上方往复移动。翻转单元一体地设置在转印装置的下端，以允许托盘的输送和反转同时进行。

2. 发明申请

WO2008111758A1 APPARATUS FOR INSPECTION OF SEMICONDUCTOR DEVICE AND METHOD FOR INSPECTION BY THE SAME 审中-公开
标题翻译：用于检查半导体器件的装置及其检测方法
公开(公告)号：WO2008111758A1
公开(公告)日：2008-09-18
申请号：PCT/KR2008/001260
申请日：2008-03-05
申请人： INTEKPLUS CO., LTD , KO, Seung-Gyu , LIM, Ssang-gun , LEE, Sang-yun , SONG, Kyoung-Soo
发明人： KO, Seung-Gyu , LIM, Ssang-gun , LEE, Sang-yun , SONG, Kyoung-Soo
IPC分类号： H01L21/66
CPC分类号： G06T7/0004 , G01N21/94 , G06T2207/30148
摘要： An apparatus for inspection of semiconductor device and method for inspection by the same are disclosed. The apparatus for inspection of semiconductor device includes air cleaners and a brush cleaner to automatically remove contaminants present on the exterior of the semiconductor devices, prior to performing vision inspections using the vision inspecting device, thereby reducing the number of semiconductor devices which have been determined to be defective due to contaminants, and consequently, improving a yield of semiconductor devices.
摘要翻译：公开了一种半导体装置的检查装置及其检查方法。在使用视觉检查装置进行视觉检查之前，半导体装置的检查装置包括空气净化器和刷子清洁器，以自动去除存在于半导体器件外部的污染物，从而减少已经确定为由于污染物而有缺陷，因此提高了半导体器件的产量。

3. 发明申请

WO2008066335A1 APPARATUS OF TRANSFERRING SEMICONDUCTOR PACKAGE 审中-公开
标题翻译：传输半导体封装的设备
公开(公告)号：WO2008066335A1
公开(公告)日：2008-06-05
申请号：PCT/KR2007/006091
申请日：2007-11-29
申请人： INTEKPLUS CO., LTD. , IM, Ssang-gun , LEE, Sang-yun , KO, Seung-gyu , KANG, Sung-yong
发明人： IM, Ssang-gun , LEE, Sang-yun , KO, Seung-gyu , KANG, Sung-yong
IPC分类号： H01L21/68
CPC分类号： H01L21/6838
摘要： Disclosed is an apparatus of transferring a semiconductor package in which includes a plurality of picker modules to pick up and invert the semiconductor package for the transfer of the semiconductor package. Each picker module includes a vertical bracket, a cylinder block attached to a lower end portion of the vertical bracket, a cylinder rod penetrated through the cylinder block and having a lower end inserted into a cylinder rod mount, to vertically move the cylinder rod mount by upward and downward movements thereof, and a picker penetrated through the cylinder block and integrally coupled with the cylinder rod mount, to be vertically moved according to the vertical movement of the cylinder rod mount, so as to pick up and rotate the semiconductor package. A rotating device is integrally mounted on the top of the cylinder block, to rotate the picker by operation of a motor.
摘要翻译：公开了一种转移半导体封装的装置，其中包括多个拾取器模块以拾取和反转用于半导体封装的传输的半导体封装。每个拾取器模块包括一个垂直支架，一个连接到垂直支架下端部分的气缸体，一个穿过气缸体的气缸杆，其下端插入一个气缸杆安装座中，以使气缸杆安装座垂直移动上下移动，以及穿过气缸体并与气缸杆安装件一体联接的拾取器，根据气缸杆座的垂直运动垂直移动，以便拾取和旋转半导体封装。旋转装置一体地安装在气缸体的顶部上，以通过电动机的操作旋转拾取器。

4. 发明申请

WO2008143471A1 SEMICONDUCTOR PACKAGE INSPECTING SYSTEM 审中-公开
标题翻译：半导体包装检测系统
公开(公告)号：WO2008143471A1
公开(公告)日：2008-11-27
申请号：PCT/KR2008/002866
申请日：2008-05-22
申请人： INTEKPLUS CO., LTD , LIM, Ssang-gun , LEE, Sang-yun , CHOI, Ho-Keun , KO, Seung-Gyu
发明人： LIM, Ssang-gun , LEE, Sang-yun , CHOI, Ho-Keun , KO, Seung-Gyu
IPC分类号： H01L21/66
CPC分类号： B07C5/3422 , G01N21/95
摘要： A semiconductor package inspecting system includes a loading unit, a first vision inspection unit for visually inspecting a first surface of the semiconductor package, a second vision inspection unit for two-dimensionally inspecting a second surface of the semiconductor package using a color camera, a tray transfer device for transferring, a third vision inspection unit for two-dimensionally inspecting the second surface of the semiconductor package using a line scan camera, an unloading unit for allowing a tray having good-quality semiconductor devices received therein to be stacked therein, a fourth vision inspection unit for two-dimensionally inspecting the first surface of the semiconductor package using a line scan camera, a inverting device for transferring the tray, a reject unit for sorting and receiving defective semiconductor devices, and a sorting device for sorting the visually inspected semiconductor packages.
摘要翻译：半导体封装检查系统包括加载单元，用于目视检查半导体封装的第一表面的第一视觉检查单元，用于使用彩色相机二维地检查半导体封装的第二表面的第二视觉检查单元，托盘用于传送的传送装置，用于使用线扫描照相机二维地检查半导体封装的第二表面的第三视觉检查单元，用于允许其中容纳有其中容纳有优质半导体器件的托盘堆叠在其中的卸载单元，第四视线检查单元，用于使用线扫描照相机二维地检查半导体封装的第一表面，用于传送托盘的反转装置，用于分类和接收有缺陷的半导体器件的拒收单元，以及用于对目视检查的半导体进行分类的分类装置包。

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