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    • 3. 发明申请
    • SEMICONDUCTOR MEMORY CELL AND ARRAY USING PUNCH-THROUGH TO PROGRAM AND READ SAME
    • 半导体存储单元和阵列使用PUNCH-THROUGH编程和读取它们
    • WO2007128738A1
    • 2007-11-15
    • PCT/EP2007/054227
    • 2007-04-30
    • INNOVATIVE SILICON SAOKHONIN, SergueiNAGOGA, Mikhail
    • OKHONIN, SergueiNAGOGA, Mikhail
    • G11C11/404H01L27/108H01L29/78
    • G11C11/404G11C2211/4016H01L27/108H01L27/10802H01L29/7841
    • An integrated circuit device (for example, logic or discrete memory device) comprising a memory cell including a punch-through mode transistor, wherein the transistor includes a source region, a drain region, a gate, a gate insulator, and a body region having a storage node which is located, at least in part, immediately beneath the gate insulator. The memory cell includes at least two data states which are representative of an amount of charge in the storage node in the body region. First circuitry is coupled to the punch-through mode transistor of the memory cell to: (1) generate first and second sets of write control signals, and (2a) apply the first set of write control signals to the transistor to write a first data state in the memory cell and (2b) apply the second set of write control signals to the transistor to write a second data state in the memory cell. In response to the first set of write control signals, the punch- through mode transistor provides at least the first charge in the body region via impact ionization. The transistor may be disposed on a bulk-type substrate or SOI-type substrate.
    • 一种集成电路器件(例如逻辑或分立存储器件),包括一个包括穿通型晶体管的存储器单元,其中该晶体管包括一个源极区,一个漏极区,一个栅极,一个栅极绝缘体以及一个具有 存储节点至少部分地位于栅极绝缘体的正下方。 存储单元包括代表身体区域中的存储节点中的电荷量的至少两个数据状态。 第一电路耦合到存储单元的穿通模式晶体管,以:(1)产生第一和第二组写入控制信号,以及(2a)将第一组写入控制信号施加到晶体管以写入第一数据 状态,并且(2b)将第二组写入控制信号施加到晶体管以在存储器单元中写入第二数据状态。 响应于第一组写入控制信号,穿通模式晶体管经由冲击电离至少提供身体区域中的第一电荷。 晶体管可以设置在体型衬底或SOI型衬底上。
    • 4. 发明申请
    • MEMORY ARRAY HAVING A PROGRAMMABLE WORD LENGTH, AND METHOD OF OPERATING SAME
    • 具有可编程字长度的记忆阵列及其操作方法
    • WO2007126830A2
    • 2007-11-08
    • PCT/US2007007591
    • 2007-03-29
    • INNOVATIVE SILICON SACARMAN ERIC
    • CARMAN ERIC
    • G11C16/04
    • G11C7/1006G11C7/1048G11C11/404G11C11/4087G11C11/4093G11C2211/4016H01L21/84H01L27/108H01L27/10802H01L27/10879H01L27/1203H01L29/7841H01L29/785
    • A memory cell array and device having a memory cell array (i.e., an integrated circuit device, for example, a logic device (such as, a microcontroller or microprocessor) or a memory device (such as, a discrete memory)) including electrically floating body transistors in which electrical charge is stored in the body of the transistor, and techniques for reading, controlling and/or operating such memory cell array and such device. The memory cell array and device include a variable and/or programmable word length. The word length relates to the selected memory cells of a selected row of memory cells (which is determined via address data). In one embodiment, the word length may be any number of memory cells of a selected row which is less than or equal to the total number of memory cells of the selected row of the memory array. In one aspect, write and/or read operations may be performed with respect to selected memory cells of a selected row of the memory array, while unselected memory cells of the selected row are undisturbed.
    • 具有存储单元阵列的存储单元阵列和器件(即集成电路器件,例如逻辑器件(例如,微控制器或微处理器)或存储器件(例如,分立存储器))包括电浮置 其中电荷存储在晶体管的主体中的体晶体管,以及用于读取,控制和/或操作这样的存储单元阵列和这种器件的技术。 存储单元阵列和器件包括可变和/或可编程的字长。 字长涉及所选择的一行存储器单元的选定存储单元(其通过地址数据确定)。 在一个实施例中,字长可以是所选行的任何数量的存储器单元,其小于或等于存储器阵列的所选行的存储器单元的总数。 在一个方面,可以针对存储器阵列的选定行的所选择的存储器单元执行写入和/或读取操作,同时所选行的未选择的存储器单元不受干扰。
    • 8. 发明申请
    • INTEGRATED CIRCUIT HAVING MEMORY ARRAY INCLUDING ECC AND/OR COLUMN REDUNDANCY, AND METHOD OF PROGRAMMING, CONTROLLING AND/OR OPERATING SAME
    • 具有存储器阵列的集成电路,包括ECC和/或冗余冗余,以及编程,控制和/或操作的方法
    • WO2008002513A2
    • 2008-01-03
    • PCT/US2007014679
    • 2007-06-25
    • INNOVATIVE SILICON SASINGH ANANT PRATAP
    • SINGH ANANT PRATAP
    • G11C29/00G11C7/00
    • G01J3/02G01J3/0291G01J3/10G01J3/28G01J2003/1213G01J2003/2866G01N2201/129G06F11/1048G11C7/1006G11C29/846G11C2029/0409G11C2207/104
    • An integrated circuit device (for example, a logic device or a memory device (such as, a discrete memory device)), including a memory cell array having a plurality of memory cells arranged in a matrix of rows and columns, multiplexer circuitry, coupled to the memory cell array, wherein the multiplexer circuitry includes a plurality of data multiplexers, each data multiplexer having a plurality of inputs, including (i) a first input to receive write data which is representative of data to be written into the memory cells of the memory cell array in response to a write operation, and (ii) a second input to receive read data which is representative of data read from memory cells of the memory cell array, and an associated output to responsively output data from one of the plurality of inputs, and syndrome generation circuitry, coupled to the multiplexer circuitry, to generate: (i) a write data syndrome vector using the write data and (ii) a read data syndrome vector using the read data.
    • 集成电路器件(例如,逻辑器件或存储器件(例如,分立存储器件)),包括具有排列成行和列的矩阵的多个存储单元的存储单元阵列,多路复用器电路 其中所述多路复用器电路包括多个数据多路复用器,每个数据多路复用器具有多个输入,所述多个输入包括:(i)用于接收写数据的第一输入,所述第一输入代表要写入所述存储器单元的存储单元的数据 所述存储单元阵列响应于写入操作,以及(ii)第二输入端,用于接收表示从所述存储单元阵列的存储单元读取的数据的读取数据,以及相关联的输出以响应于从所述多个存储单元阵列中的一个输出数据 耦合到多路复用器电路的输入和校正子产生电路,以产生:(i)使用该读数据的写数据校正子向量和(ii)使用该读数据的读数据校正子向量。