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    • 2. 发明申请
    • DOWNHOLE MAGNETIC MEASUREMENT WHILE ROTATING AND METHODS OF USE
    • 在旋转时的井下磁性测量和使用方法
    • WO2010141364A1
    • 2010-12-09
    • PCT/US2010/036620
    • 2010-05-28
    • SCIENTIFIC DRILLING INTERNATIONAL, INC.BERGSTROM, Neil W., SmithTOWLE, James, N.WHITE, Matthew, A.
    • BERGSTROM, Neil W., SmithTOWLE, James, N.WHITE, Matthew, A.
    • G01V3/26
    • G01V3/26
    • Downhole magnetic measurement devices and methods are provided for estimation of magnetic fields during drilling. In certain embodiments, a triaxial vector magnetometer 150 is provided and affixed to a drill string subassembly 125. While the drill string subassembly 125 is rotating, as during drilling operations, an average total magnetic field value (BTwR) is determined as an average of the instantaneous vector magnitudes of the three measured orthogonal component magnetic fields. In this way, near-bit 127 estimates of the downhole magnetic field may be obtained and used for a variety of functions. These downhole magnetic measurement devices may be useful determining magnetic fields, and estimating borehole inclination and azimuth of drill string subassemblies 125, 100 during drilling operations. Additionally, downhole magnetic measurement devices may be used for detecting the presence and distance to external ferromagnetic materials. In this way, these devices may be used for various applications, including, well avoidance, well intercept, and verification of instrument integrity.
    • 提供井下磁测量装置和方法来估计钻井过程中的磁场。 在某些实施例中,三轴矢量磁力计150被提供并固定到钻柱子组件125上。当钻柱子组件125旋转时,如在钻井操作期间,平均总磁场值(BTwR)被确定为 三个测量的正交分量磁场的瞬时矢量幅度。 以这种方式,可以获得井下磁场的近位127估计并用于各种功能。 这些井下磁测量装置可用于确定磁场,并且在钻井操作期间估计钻柱组件125,100的井眼倾角和方位角。 此外,井下磁测量装置可用于检测与外部铁磁材料的存在和距离。 以这种方式,这些装置可以用于各种应用,包括良好的避免,井截距和仪器完整性的验证。
    • 3. 发明申请
    • FABRICATION OF CONDUCTIVE MICRO TRACES USING A DEFORM AND SELECTIVE REMOVAL PROCESS
    • 使用变形和选择性去除工艺制造导电微量纤维
    • WO2007136734B1
    • 2008-02-21
    • PCT/US2007011881
    • 2007-05-18
    • SOUTHWALL TECHNOLOGIES INCPETHE RAJIVKAST MICHAEL ATSENG SCOTT C-JBERGSTROM NEILKOZAK JULIUS
    • PETHE RAJIVKAST MICHAEL ATSENG SCOTT C-JBERGSTROM NEILKOZAK JULIUS
    • H01R4/58
    • H05K3/041H05K1/0393H05K3/046H05K3/107H05K3/244H05K2203/0108H05K2203/0528
    • In a method of forming micro traces (64; 110, 112 and 114; and 409), stamping techniques are employed to define a target pattern of the micro traces. The stamping is applied to electrically conductive material (405; 700) and may be limited to pressure, but a thermal stamping approach may be utilized. Following the stamping, a portion of the conductive material is removed (305), leaving the target pattern of conductive micro traces. In the pressure-application step, the pressure or the combination of pressure and temperature is sufficient to at least weaken the integrity of the bulk conductive material along the area of contact. Typically, this step causes shearing of the conductive material. Following the pressure-application step, excess conductive material is removed. In some embodiments of the invention, the thickness of the micro traces is not determined in a single step. The original thickness may be formed using a "seed" material (104). The subsequent material buildup (108) may occur after the target pattern is established.
    • 在形成微迹线(64; 110,112和114;和409)的方法中,使用冲压技术来定义微迹线的目标图案。 冲压被应用于导电材料(405,700),并且可以被限制到压力,但是可以利用热冲压方法。 在冲压之后,去除导电材料的一部分(305),留下导电微迹线的目标图案。 在压力施加步骤中,压力或压力和温度的组合足以至少削弱沿着接触区域的体导电材料的完整性。 通常,该步骤导致导电材料的剪切。 在压力施加步骤之后,除去过量的导电材料。 在本发明的一些实施例中,微迹线的厚度在单个步骤中未确定。 原始厚度可以使用“种子”材料(104)形成。 随后的材料积累(108)可以在目标图案建立之后发生。