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1. 发明申请

WO2023078532A1 METHOD FOR RETRIEVING A TARGET POSITION IN A MICROSCOPIC SAMPLE IN AN EXAMINATION APPARATUS USING POSITION RETRIEVAL INFORMATION, METHOD FOR EXAMINING AND/OR PROCESSING SUCH A TARGET POSITION AND MEANS FOR IMPLEMENTING THESE METHODS 审中-公开
公开(公告)号：WO2023078532A1
公开(公告)日：2023-05-11
申请号：PCT/EP2021/080384
申请日：2021-11-02
申请人： LEICA MICROSYSTEMS CMS GMBH
发明人： SIECKMANN, Frank , HECHT, Frank
IPC分类号： G02B21/36 , G01N1/28 , G06T7/73 , G06V10/25
摘要： A method (10) for retrieving a target position (101) in a microscopic sample (100) in an examination apparatus (2500) using position retrieval information is provided, the position retrieval information comprising, associated to the target position (101), a set of geometric descriptors (200) describing a spatial relation between a target position identifier (T)corresponding to the target position (101) and a plurality of reference position identifiers (1-4) corresponding to positions of a plurality of reference markers (102a–102d) associated to and identifiable in individual reference marker distances to the target position (101) in the microscopic sample (100), the method (10) comprising (a) providing (11) a digital sample representation (510) of the sample (100) or a region thereof expected to include the target position (101), (b) specifying (12) a potential one of the reference markers (102a–102d) associated to the target position (101) in the sample representation (510), (c) providing (13) digital distance representations (520) of the individual reference marker distances of the plurality of reference markers (102) associated to the target position (101) in the form of rotational traces coaxially centred around the potential one of the reference markers (102a–102d) specified (12), and (d) identifying (14) a feature in the sample representation (510) as potentially being the target position (101) and/or the potential one of the reference markers (102a–102d) as being one of the reference markers (102a–102d) on the basis of an evaluation of the sample representation (510) and the digital distance representations (520).A method for examining and/or processing a microscopic sample (100), an apparatus being adapted to perform a corresponding method, a microscopic examination and/or processingarrangement (2000) and a computer program for performing the method are also provided.

2. 发明申请

WO2023078527A1 METHOD FOR PROVIDING POSITION INFORMATION FOR RETRIEVING A TARGET POSITION IN A MICROSCOPIC SAMPLE, METHOD FOR EXAMINING AND/OR PROCESSING SUCH A TARGET POSITION AND MEANS FOR IMPLEMENTING THESE METHODS 审中-公开
公开(公告)号：WO2023078527A1
公开(公告)日：2023-05-11
申请号：PCT/EP2021/080374
申请日：2021-11-02
申请人： LEICA MICROSYSTEMS CMS GMBH
发明人： SIECKMANN, Frank , HECHT, Frank
IPC分类号： G02B21/36 , G06T7/00
摘要： A method (500) for providing position information for retrieving a target position (101) in a microscopic sample (100) is provided, said method (500) comprising the steps of (a)providing (510) a first digital representation (200) of the sample (100) or a part thereof at a first resolution including the target position (101), (b) specifying (520) a first target position identifier (230) in the first digital representation (200) indicating the target position (101) at the first resolution, (c) acquiring (530) an image stack (260) in a region of the sample (100) including the target position (101) indicated by the first target position identifier (230), (d) providing (540) a second digital representation (300) at a second resolution higher than the first resolution on the basis of the image stack (260), (e) specifying (550) a second target position identifier (330) in the second digital representation (300) indicating the target position (101) at the second resolution, (f) specifying (560) a plurality of reference position identifiers (340a-340d) in the second digital detail representation (300) indicating positions of optically detectable reference markers at the second resolution, and (g) determining (570) a set (400) of geometric descriptors (400a-400h) describing spatial relations between the second target position identifier (330) and the plurality of reference position identifiers (340a-340d) to provide the position information. An apparatus, a microscopic examination arrangement (2000) and a computer program for performing the method are also provided, as well as a user interface (1000) for a microscopic examination arrangement (2000).

3. 发明申请

WO2023001940A1 METHODS AND SYSTEMS FOR GENERATING MODELS FOR IMAGE ANALYSIS PIPELINE PREDICTION 审中-公开
公开(公告)号：WO2023001940A1
公开(公告)日：2023-01-26
申请号：PCT/EP2022/070438
申请日：2022-07-21
申请人： LEICA MICROSYSTEMS CMS GMBH
发明人： LEE, Shih-Jong James
IPC分类号： G06K9/62 , G06V20/69 , G06F18/214 , G06F18/23 , G06V2201/10
摘要： A method is described herein for generating a model for predicting an image analysis parameter for use with an image analysis tool. The method comprises receiving telemetry data associated with image data; and generating a model for predicting an image analysis parameter based on the telemetry data. A further method is described herein for predicting an image analysis parameter for use with an image analysis tool. The method comprising receiving image data associated with a captured image; providing the image data to a model for predicting an image analysis parameter; and outputting the image analysis parameter.

4. 发明申请

WO2023001620A1 MEDICAL VIDEO ANNOTATION USING OBJECT DETECTION AND ACTIVITY ESTIMATION 审中-公开
公开(公告)号：WO2023001620A1
公开(公告)日：2023-01-26
申请号：PCT/EP2022/069323
申请日：2022-07-11
申请人： LEICA INSTRUMENTS (SINGAPORE) PTE. LTD. , LEICA MICROSYSTEMS CMS GMBH
发明人： LECK, Kheng Swee , HUANG, Jie
IPC分类号： G16H20/40 , G16H30/40 , G16H40/63 , A61B1/00 , A61B6/00 , A61B34/20 , A61B90/00
摘要： An apparatus configured to annotate a video of a surgical procedure is disclosed. The annotation can be based on at least one of a command executed during the surgical procedure, an instrument setting, or the video.

5. 发明申请

WO2022242887A1 METHOD FOR ANALYZING A BIOLOGICAL SAMPLE OR A CHEMICAL COMPOUND OR A CHEMICAL ELEMENT 审中-公开
公开(公告)号：WO2022242887A1
公开(公告)日：2022-11-24
申请号：PCT/EP2021/073819
申请日：2021-08-28
申请人： LEICA MICROSYSTEMS CMS GMBH
发明人： ALSHEIMER, Soeren
IPC分类号： G01N21/64 , G01N33/50
摘要： The present invention relates to a method for analyzing a sample, the sample comprising: a plurality of affinity reagents, each affinity reagent being configured to attach to an analyte, at least one of the affinity reagents being attached to an analyte; and a first plurality of combinations of dyes, each combination of dyes being unique within the first plurality of combinations of dyes and each combination of dyes comprising at least two dyes having different characteristics for at least one of: excitation and emission, wherein each one of the unique combinations of dyes is attached to an associated affinity reagent according to a first mapping, the method comprising: i) directing excitation light at the sample, the excitation light having characteristics for exciting at least the at least two dyes having different characteristics for at least one of: excitation and emission; ii) generating at least one first readout from emission light emitted by the excited dyes; and iii) determining, by at least one computer processor, at least one affinity reagent present in the sample based on the at least one first readout.

6. 发明申请

WO2022223400A1 IMAGING DEVICE, AND CORRESPONDING METHOD AND MICROSCOPE 审中-公开
公开(公告)号：WO2022223400A1
公开(公告)日：2022-10-27
申请号：PCT/EP2022/059888
申请日：2022-04-13
申请人： LEICA INSTRUMENTS (SINGAPORE) PTE. LTD. , LEICA MICROSYSTEMS CMS GMBH
发明人： YANG, Gao
IPC分类号： H04N5/232
摘要： Examples relate to an optical imaging device, to a corresponding method for an optical imaging device, and to a microscope, such as a surgical microscope, comprising such an optical imaging device. The optical imaging device comprises an optical imaging sensor. The optical imaging sensor is configured to generate frames of imaging sensor data, and to provide a latest generated frame of imaging sensor data to a frame buffer and to a switching circuitry of the optical imaging device. The optical imaging device further comprises the frame buffer that is configured to store the latest generated frame. The optical imaging device further comprises the switching circuitry. The switching circuitry is configured to output, via an output circuitry of the optical imaging device during a first time period, the latest generated frame provided by the optical imaging sensor bypassing the frame buffer. The switching circuitry is configured to output, via the output circuitry of the optical imaging device during a second time period, the stored latest generated frame stored in the frame buffer.

7. 发明申请

WO2022106510A1 PROCESSING SYSTEM FOR OCT IMAGING, OCT IMAGING SYSTEM AND METHOD FOR OCT IMAGING 审中-公开
公开(公告)号：WO2022106510A1
公开(公告)日：2022-05-27
申请号：PCT/EP2021/082086
申请日：2021-11-18
申请人： LEICA MICROSYSTEMS INC. , LEICA MICROSYSTEMS CMS GMBH
发明人： HENDARGO, Hansford , LYNCH, Eric
IPC分类号： A61B3/10
摘要： The invention relates to a processing system for use with optical coherence tomography imaging means for imaging a subject, the processing system being configured to repeatedly perform an image processing process (300), comprising the following steps: receiving (312) a scan data set from the subject (190) being acquired by means of optical coherence tomography, performing (314) data processing on the scan data set, including applying (316) dispersion correction based on a current set (370) of dispersion coefficients, and providing (318) a dispersion corrected image data set of the subject for an image of the subject to be displayed; and the processing system further being configured to repeatedly perform a dispersion coefficient adapting process (340), at least in part, in parallel to the image processing process (300), comprising the following steps: receiving (342) a scan data set from the subject being acquired by means of optical coherence tomography, adapting (344) dispersion coefficients by means of an optimization process (346) performed on the scan data set, and providing (348) a set (372) of adapted dispersion coefficients to be used to update the current set (370) of dispersion coefficients; and the processing system further being configured to update (350) the current set (370) of dispersion coefficients based on the set (372) of adapted dispersion coefficients, to an optical coherence tomography imaging system and a corresponding method.

8. 发明申请

WO2022096439A1 SURGICAL MICROSCOPE SYSTEM 审中-公开
公开(公告)号：WO2022096439A1
公开(公告)日：2022-05-12
申请号：PCT/EP2021/080347
申请日：2021-11-02
申请人： LEICA INSTRUMENTS (SINGAPORE) PTE. LTD. , LEICA MICROSYSTEMS CMS GMBH
发明人： KOK, Alvin , WANG, Ken , SCHUTZ, Marco , NAH, Chua Li , PORTILLA, Oscar
IPC分类号： A61B90/20 , A61B90/25 , A61B90/00
摘要： Various aspects of the present disclosure relate to a surgical microscope system, and in particular, to an arm for a surgical microscope system. The surgical microscope system comprises an optics carrier comprising optical components of a microscope of the surgical microscope system. The surgical microscope system comprises a display device for displaying image data recorded by an optical imaging sensor of the surgical microscope system. The surgical microscope system comprises an arm. The arm comprises a first section and a second section. The first section is configured to provide a vertical and/or lateral adjustment of the position of the optics carrier. The second section is attached to a suspension point of the first section and to the optics carrier. The second section has a shape that creates a free space around a geometric axis between the suspension point and the optics carrier, such that an optical path between a central area of the display device and a surgeon being located at the opposite side of the optics carrier remains unobstructed by the second section. The optical path intersects the geometric axis between the suspension point and the optics carrier.

9. 发明申请

WO2022084190A1 OPTICAL BEAM SPLITTER, OPTICAL SYSTEM, AND MICROSCOPE 审中-公开
公开(公告)号：WO2022084190A1
公开(公告)日：2022-04-28
申请号：PCT/EP2021/078649
申请日：2021-10-15
申请人： LEICA INSTRUMENTS (SINGAPORE) PTE. LTD. , LEICA MICROSYSTEMS CMS GMBH
发明人： YANG, Gao
IPC分类号： G02B21/36 , G02B27/14 , G02B27/10
摘要： An optical beam splitter including an at least partially semi-transparent layer. The at least partially semi-transparent layer includes at least one first region having a first transmission coefficient and a first reflection coefficient for visible light and at least one second region having a second transmission coefficient for visible light. The first transmission coefficient is larger than 0 and the first reflection coefficient is larger than 0. The second transmission co-efficient differs from the first transmission coefficient. The optical beam splitter is configured so that visible light passing the at least partially semi-transparent layer through the at least one first region propagates along a first optical output path of the optical beam splitter and visible light reflected by the at least one first region propagates along a second optical output path of the optical beam splitter.

10. 发明申请

WO2022048859A1 A CONCEPT FOR ADAPTING A MACHINE-LEARNING MODEL FOR DETERMINING POTENTIAL REGIONS OF INTEREST 审中-公开
公开(公告)号：WO2022048859A1
公开(公告)日：2022-03-10
申请号：PCT/EP2021/071987
申请日：2021-08-06
申请人： LEICA MICROSYSTEMS CMS GMBH
发明人： BELJAN, Mate
IPC分类号： G06K9/00 , G06K9/62
摘要： Examples relate to a system for a microscope, a microscope system, a system for a mobile device, and to corresponding methods and computer programs. A system (110) for a microscope (120) is configured to obtain image data (140) from an optical imaging sensor of the microscope. The system is configured to determine, using a machine-learning model, a plurality of potential regions of interest (150) in the image data. The system is configured to provide review images of the potential regions of interest to a mobile device (300) of a user of the microscope. The system is configured to obtain feedback on the review images of the potential regions of interest from the mobile device of the user. The system is configured to adapt the machine-learning model based on the feedback.

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