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51. 发明申请

WO2012170216A2 METHOD OF MEASURING LUMINESCENCE OF A MATERIAL 审中-公开
标题翻译：测量材料发光的方法
公开(公告)号：WO2012170216A2
公开(公告)日：2012-12-13
申请号：PCT/US2012/039508
申请日：2012-05-25
申请人： BATTELLE MEMORIAL INSTITUTE , MILLER, Steven D.
发明人： MILLER, Steven D.
IPC分类号： G01T1/10
CPC分类号： G01T1/11 , G01J1/58 , G01N21/64 , G01T1/10 , G01T1/105 , G21K5/00
摘要： A method of measuring luminescence of a material is disclosed. The method includes applying a light source to excite an exposed material. The method also includes amplifying an emission signal of the material. The method further includes measuring a luminescent emission at a fixed time window of about 10 picoseconds to about 10 nanoseconds. The luminescence may be radio photoluminescence (RPL) or optically stimulated luminescence (OSL).
摘要翻译：公开了一种测量材料发光的方法。该方法包括施加光源以激发暴露的材料。该方法还包括放大材料的发射信号。该方法还包括在约10皮秒至约10纳秒的固定时间窗下测量发光。发光可以是放射性光致发光（RPL）或光学刺激的发光（OSL）。

52. 发明申请

WO2011058431A3 WELDING ARC APPAREL WITH UV ACTIVATED IMAGES AND METHOD FOR DETECTING UV RADIATION 审中-公开
标题翻译：具有UV激活图像的焊接电弧装置和用于检测紫外线辐射的方法
公开(公告)号：WO2011058431A3
公开(公告)日：2012-11-01
申请号：PCT/IB2010002908
申请日：2010-11-15
申请人： LINCOLN GLOBAL INC , CHANTRY BRUCE JOHN , MCDOWELL MARK DAVID
发明人： CHANTRY BRUCE JOHN , MCDOWELL MARK DAVID
IPC分类号： B23K9/32 , A61F9/06 , F16P1/06 , G01J1/42
CPC分类号： B23K9/321 , A61F9/06 , A61F9/067 , F16P1/06 , G01J1/429 , G01J1/58
摘要： A welding accessory (12, 30, 40) and a system for detecting UV radiation exposure during welding operations are disclosed. The welding accessory may have a surface exposed to UV radiation generated by electric arc welding, a first image visible without exposure to the UV radiation, and a second image formed from UV activated dye that is visible only after exposure to UV radiation generated by the electric welding arc. A system may include a UV exposure indicator with a first state and at least a second state, and include UV activated dye adapted to provide a reversible or persistent visual indication upon exposure to UV radiation. The visual indication may include any combination of symbols, logos, images, text, or other decorative or informational designs as desired.
摘要翻译：公开了焊接附件（12,30,40）和用于在焊接操作期间检测UV辐射暴露的系统。焊接附件可能具有暴露于通过电弧焊接产生的UV辐射的表面，第一图像可见而不暴露于UV辐射，以及由UV活化的染料形成的第二图像，其仅在暴露于电气产生的UV辐射之后才可见焊弧。系统可以包括具有第一状态和至少第二状态的UV曝光指示器，并且包括适于在暴露于UV辐射时提供可逆或持续的视觉指示的UV活化染料。视觉指示可以包括期望的符号，标志，图像，文本或其他装饰或信息设计的任何组合。

53. 发明申请

WO2009113544A1 蛍光膜、蛍光膜の成膜方法、誘電体多層膜、光学素子、光学系、撮像ユニット、光学特性計測装置、光学特性測定方法、露光装置、露光方法、及びデバイスの製造方法审中-公开
标题翻译：荧光膜，其成膜方法，多层电介质膜，光学元件，光学系统，成像单元，用于测量光学特性的仪器，测量光学特性的方法，曝光装置，曝光MET
公开(公告)号：WO2009113544A1
公开(公告)日：2009-09-17
申请号：PCT/JP2009/054552
申请日：2009-03-10
申请人：株式会社ニコン , 江面嘉信 , 石沢均
发明人：江面嘉信 , 石沢均
IPC分类号： C09K11/61 , C09K11/00 , C09K11/85 , G01J1/02 , G02B6/06 , H01L21/027
CPC分类号： G01J1/58 , C09K11/7748 , C09K11/7772 , C09K11/779 , G01J1/04 , G01J1/0425 , G01M11/0242 , G01M11/0264 , G01N21/6456 , G02B6/08 , G03F7/70341 , G03F7/706 , G03F7/7085
摘要：　紫外線を透過可能なフッ化物からなる母材と、該母材にドープされた賦活材とを含み、前記賦活材は遷移元素又は希土類元素を含み、前記母材中で前記紫外線が照射されることで蛍光を発することを特徴とする蛍光膜および、該蛍光膜を有する誘電体多層膜、および該蛍光膜を利用した光学素子、撮像装置、光学特性計測装置、露光装置、露光方法、及びデバイスの製造方法。
摘要翻译：提供了包括基材的荧光膜，其包含UV透过性氟化物，以及掺杂有该基材的活化剂。荧光膜的特征在于，活化剂含有过渡元素或稀土元素，并且当基材中的活化剂暴露于紫外光时产生荧光。还提供了具有荧光膜的多层电介质膜，以及使用荧光膜的光学元件，成像装置，光学特性测量仪器，曝光装置，曝光方法和装置制造方法。

54. 发明申请

WO2009094584A1 DEVICES USEFUL FOR VACUUM ULTRAVIOLET BEAM CHARACTERIZATION 审中-公开
标题翻译：用于真空超紫外线光束特征的设备
公开(公告)号：WO2009094584A1
公开(公告)日：2009-07-30
申请号：PCT/US2009/031899
申请日：2009-01-23
申请人： THE REGENTS OF THE UNIVERSITY OF CALIFORNIA , GESSNER, Oliver , KORNILOV, Oleg, A. , WILCOX, Russell, B.
发明人： GESSNER, Oliver , KORNILOV, Oleg, A. , WILCOX, Russell, B.
IPC分类号： G01J1/42
CPC分类号： G01J1/4257 , G01J1/04 , G01J1/0407 , G01J1/0414 , G01J1/0448 , G01J1/429 , G01J1/58 , G01J3/02 , G01J3/021 , G01J3/0245 , G01J3/2803
摘要： The invention provides for a device comprising an apparatus comprising (a) a transmission grating capable of diffracting a photon beam into a diffracted photon output, and (b) an image detector capable of detecting the diffracted photon output. The device is useful for measuring the spatial profile and diffraction pattern of a photon beam, such as a vacuum ultraviolet (VUV) beam.
摘要翻译：本发明提供了一种包括一种装置的装置，该装置包括：（a）能够将光子束衍射成衍射光子输出的透射光栅，以及（b）能够检测衍射光子输出的图像检测器。该装置可用于测量诸如真空紫外（VUV）光束的光子束的空间分布和衍射图案。

55. 发明申请

WO2007133742A3 ILLUMINATION SOURCE INCLUDING PHOTOLUMINESCENT MATERIAL AND A FILTER AND AN APPARATUS INCLUDING SAME 审中-公开
标题翻译：包含光致变色材料的照射源和过滤器以及包括其的装置
公开(公告)号：WO2007133742A3
公开(公告)日：2008-09-18
申请号：PCT/US2007011546
申请日：2007-05-14
申请人： X RITE INC , BYLSMA RICHARD B
发明人： BYLSMA RICHARD B
IPC分类号： H01J1/62 , H01J63/04
CPC分类号： G01J3/10 , G01J1/58 , G01N21/278 , G01N21/31 , H01L33/44 , H01L33/507 , H01L2224/48091 , H01L2224/73265 , H01L2924/00014
摘要： In spectroscopy or color measurement applications which characterize the transmission, absorption, emission or reflection of a target material (such as ink on paper, paint on metal, dyes on cloth, etc.), an illumination source must be present, as well as an apparatus to measure the reflected, transmitted or emitted light. One method for providing the illumination is using light emitted from light emitting diodes (LEDs). To adequately characterize the material properties of the target that would be seen by a human observer, illumination over the entire visible wavelength range from 400nm to 700nm is desirable. Individual white or chromatic LEDs and even multiple-LED assemblies, however, often do not provide adequate intensity at all wavelengths in this range. One known solution for tailoring the emission spectra of a LED to cover the desired illumination range is to use an interference filter in combination with the LED to filter out the unwanted wavelengths. Such an arrangement, however, is not practical where the source (e.g., the LED) does not emit sufficient energy at the desired wavelength. Also, such arrangements can be inefficient for certain applications where much of the energy emissions from the source may be filter out and therefore wasted.
摘要翻译：在光谱学或颜色测量应用中，其特征在于目标材料（例如纸上的油墨，金属上的油漆，布上的染料等）的透射，吸收，发射或反射，必须存在照明源，以及测量反射，发射或发射光的装置。提供照明的一种方法是使用从发光二极管（LED）发射的光。为了充分地表征人类观察者可以看到的靶的材料性质，期望在400nm至700nm的整个可见光波长范围内的照明。然而，单个白色或彩色LED以及甚至多个LED组件通常不能在该范围内的所有波长上提供足够的强度。用于调整LED的发射光谱以覆盖期望的照明范围的一种已知解决方案是使用与LED组合的干涉滤光器来滤除不需要的波长。然而，当源（例如，LED）在期望的波长处不发射足够的能量时，这种布置是不实际的。此外，对于某些应用来说，这种布置可能是低效的，其中来自源的大量能量排放可能被过滤掉并因此被浪费。

56. 发明申请

WO2007133743A2 LIGHT SOURCE INCLUDING QUANTUM DOT MATERIAL AND APPARATUS INCLUDING SAME 审中-公开
标题翻译：光源包括量子材料和装置，包括它们
公开(公告)号：WO2007133743A2
公开(公告)日：2007-11-22
申请号：PCT/US2007/011547
申请日：2007-05-14
申请人： X-RITE, INC. , PETERSON, Steven, H. , BYLSMA, Richard, B.
发明人： PETERSON, Steven, H. , BYLSMA, Richard, B.
IPC分类号： A61N1/00
CPC分类号： G01J3/10 , B82Y30/00 , G01J1/58 , G01N21/278 , G01N21/31
摘要： A light source comprising a light emitting device and quantum dot material is disclosed. According to various embodiments, the quantum dot material is positioned relative to the light emitting device such that the quantum dot material absorbs light emitted from the light emitting device and converts the wavelengths of photons emitted from the light emitting device to longer wavelengths. Judicious selection of the quantum dot material allows the emission spectra of the light source to be tailored to meet the needs of a particular illumination application, and avoids the drawbacks associated with the use of interference filters because the quantum dot material can upconvert the wavelengths emitted from the light emitting device such that the emission spectra of the light source can include wavelengths that are not emitted by the light emitting device itself.
摘要翻译：公开了一种包括发光器件和量子点材料的光源。根据各种实施例，量子点材料相对于发光器件定位，使得量子点材料吸收从发光器件发射的光并将从发光器件发射的光子的波长转换为更长的波长。量子点材料的可靠选择允许光源的发射光谱被定制以满足特定照明应用的需要，并且避免与使用干涉滤光器相关联的缺点，因为量子点材料可以上变频从发光装置使得光源的发射光谱可以包括不被发光装置本身发射的波长。

57. 发明申请

WO2006031759A2 METHOD AND APPARATUS FOR DETERMINING A VERTICAL INTENSITY PROFILE THROUGH A PLANE OF FOCUS IN A CONFOCAL MICROSCOPE 审中-公开
标题翻译：用于通过共焦显微镜中的焦平面确定垂直强度分布的方法和设备
公开(公告)号：WO2006031759A2
公开(公告)日：2006-03-23
申请号：PCT/US2005032467
申请日：2005-09-12
申请人： WOJCIECHOWSKI JOEL C
发明人： WOJCIECHOWSKI JOEL C
IPC分类号： G01J1/00
CPC分类号： G02B27/32 , G01J1/38 , G01J1/4257 , G01J1/58 , G02B21/0024 , G02B21/006 , G02B21/34
摘要： An assembly is provided for the direct measurement of a vertical intensity profile through a plane of focus of a confocal microscope, a determination of a depth of the confocal plane and a maximum intensity of the intensity profile. The assembly includes a transparent substrate in which is embedded a scale having a graduated length, wherein the scale is inclined relative to a local portion of an illuminating beam on an illuminating path of the confocal microscope. The graduated scale is configured to be illuminated with an intensity corresponding to the position within the plane of focus along the axis of the illuminating beam. The inclination of the scale and the path of the illuminating beam are at a predetermined angle. The graduated scale can be fluorescently dyed to illuminate with an absorption frequency relevant to a light source or illuminating beam of the confocal microscope. An algorithm employing trigonometric functions and calculating the confocal plane depth of the specimen is disclosed.
摘要翻译：提供一个组件用于通过共聚焦显微镜的焦平面直接测量垂直强度分布，确定共焦平面的深度和强度分布的最大强度。该组件包括透明衬底，在其中嵌入具有渐变长度的标尺，其中标尺相对于共焦显微镜照明路径上的照射束的局部部分倾斜。刻度刻度被配置为以与沿着照明光束的轴线的焦平面内的位置相对应的强度来照明。标尺的倾斜度和照明光束的路径处于预定角度。刻度尺可以荧光染色以照射与共聚焦显微镜的光源或照明光束相关的吸收频率。公开了一种采用三角函数并计算样本的共焦平面深度的算法。

58. 发明申请

WO2006009916A1 METHOD FOR CALIBRATION AND CERTIFYING LASER PROJECTION BEAM ACCURACY IN TRACING 审中-公开
标题翻译：用于校准和认证激光投射光束跟踪精度的方法
公开(公告)号：WO2006009916A1
公开(公告)日：2006-01-26
申请号：PCT/US2005/021603
申请日：2005-06-17
申请人： THE BOEING COMPANY , SLESINSKI, Raymond, J. , STECKEL, Richard, J. , ASHFORD, Curtis, M.
发明人： SLESINSKI, Raymond, J. , STECKEL, Richard, J. , ASHFORD, Curtis, M. , LUNER, Jeffery, J.
IPC分类号： G01B21/04 , G01B11/00 , B23K26/02 , G01J1/58
CPC分类号： G01J1/58 , B23K26/042 , B23K26/705
摘要： A system for certifying laser projection beam accuracy in tracing includes a certification fixture having a test pattern and a color background. The certification fixture is configured so that any portion of the laser projection beam reflected from the color background is reflected with a color contrasting to that of the laser beam or of the test pattern. This can be achieved with a fluorescent background. Contrast can be further enhanced by making the pattern of a material that absorbs the laser beam color. Failure of the test is indicated by the presence of any of the laser beam light reflecting from the background. Passage of the test is indicated by the laser beam striking only the test pattern. A functional test pattern tests for both laser beam width and positioning accuracy. A method is provided to use a calibration test pattern to test laser beam width and length projection accuracy independently of one another.
摘要翻译：用于在跟踪中验证激光投射光束精度的系统包括具有测试图案和彩色背景的认证夹具。认证夹具被配置为使得从彩色背景反射的激光投射束的任何部分以与激光束或测试图案的颜色对比的颜色反射。这可以用荧光背景来实现。可以通过使吸收激光束颜色的材料的图案进一步增强对比度。测试失败是由背景反射的任何激光束光的存在来表示的。测试的通道由仅激发测试图案的激光束表示。功能测试图案测试激光束宽度和定位精度。提供了一种使用校准测试图案相互独立地测试激光束宽度和长度投影精度的方法。

59. 发明申请

WO2003023338A1 赤外可視変換部材及び赤外線検出装置审中-公开
标题翻译：红外可见转换会员和红外探测器
公开(公告)号：WO2003023338A1
公开(公告)日：2003-03-20
申请号：PCT/JP2002/009232
申请日：2002-09-10
申请人：浜松ホトニクス株式会社 , 水野到 , 近藤稔 , 小野田篤 , 水谷恭三
发明人：水野到 , 近藤稔 , 小野田篤 , 水谷恭三
IPC分类号： G01J1/58
CPC分类号： G01J1/58 , G02F2/02 , H01L27/14669
摘要： An infrared-visible conversion member which is disposed on the light receiving surface of a photodetector having a sensitivity to a visible light, and which comprises a substrate disposed on a visible light receiving surface and being transparent to a visible light, and a phosphor layer disposed on the substrate, containing an up-conversion phosphor for converting an infrared ray into a visible light, and having a film thickness of 5-120 mum. Accordingly, a high-level trade-off between a visible light emission intensity and resolution is enabled, and an excellent infrared detecting element can be implemented because an image by a visible light converted from an infrared ray can be detected with high sensitivity and high resolution.
摘要翻译：一种红外可见转换构件，其设置在对可见光敏感的光电检测器的光接收表面上，并且包括设置在可见光接收表面上并对可见光透明的衬底和设置在荧光体层上的荧光体层在基板上含有用于将红外线转换为可见光的上转换荧光体，并且膜厚度为5-120μm。因此，能够实现可见光发射强度和分辨率之间的高级权衡，并且可以实现优异的红外线检测元件，因为可以以高灵敏度和高分辨率检测由红外线转换的可见光的图像。

60. 发明申请

WO2003021216A1 TEMPERATURE SENSING IN CONTROLLED ENVIRONMENT 审中-公开
标题翻译：控制环境温度感测
公开(公告)号：WO2003021216A1
公开(公告)日：2003-03-13
申请号：PCT/US2002/027517
申请日：2002-08-28
申请人： INVAX TECHNOLOGIES
发明人： KHAN, Abid, L.
IPC分类号： G01J5/00
CPC分类号： G01J1/58 , G01J5/0003 , G01K11/3213
摘要： A Temperature-sensing apparatus is mounted within a wafer chuck (7) to contact the underside surface of a wafer that is secured by the chuck. A sensing element (23) having a photoluminescent materiel thereon is mounted in resilient contact with the wafer and emits a luminous flux in response to radiant energy stimulation with a characteristic intensity that varies with time as a function of temperature. A remote optical analyzer (39) supplies pulses of the radiant energy and receives the luminous flux to determine the temperature of the sensing element when it is in contact with the wafer. An optical channel (38) guides the radiant energy from the photoluminescent material to the remote optical analyzer.
摘要翻译：温度感测装置安装在晶片卡盘（7）内以接触由卡盘固定的晶片的下表面。在其上具有光致发光材料的感测元件（23）以与晶片弹性接触的方式安装，并响应于以随时间变化的特征强度作为温度的函数而发射光束。远程光学分析器（39）提供辐射能量的脉冲并接收光通量以确定感测元件与晶片接触时的温度。光通道（38）将辐射能量从光致发光材料引导到远程光学分析器。

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