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    • 22. 发明申请
    • MEMORY ELEMENT AND SEMICONDUCTOR DEVICE
    • 存储元件和半导体器件
    • WO2007105575A1
    • 2007-09-20
    • PCT/JP2007/054485
    • 2007-02-28
    • SEMICONDUCTOR ENERGY LABORATORY CO., LTD.YUKAWA, MikioSUGISAWA, Nozomu
    • YUKAWA, MikioSUGISAWA, Nozomu
    • H01L27/28H01L27/10H01L29/786H01L51/05
    • H01L27/13H01L27/101
    • It is an object of the present invention to reduce variations in behavior of each memory element. In addition, it is another object of the present invention to obtain a semiconductor device, on which the memory element is mounted, which is superior in terms of performance and reliability. A memory element of the present invention includes in its structure a first conductive layer; a semiconductor layer; an organic compound layer; and a second conductive layer, where the semiconductor layer and the organic compound layer are interposed between the first conductive layer and the second conductive layer, and the semiconductor layer is formed to be in contact with the first conductive layer and/or the second conductive layer. With such a structure, variations in behavior of each memory element are reduced.
    • 本发明的目的是减少每个存储元件的行为变化。 此外,本发明的另一个目的是获得其性能和可靠性方面优于其上安装有存储元件的半导体器件。 本发明的记忆元件在其结构中包括第一导电层; 半导体层; 有机化合物层; 以及第二导电层,其中半导体层和有机化合物层介于第一导电层和第二导电层之间,并且半导体层形成为与第一导电层和/或第二导电层接触 。 利用这种结构,减少了每个存储元件的行为变化。