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1. 发明申请

WO2019093614A1 A TEST PROBE ASSEMBLY AND TEST SOCKET 审中-公开
公开(公告)号：WO2019093614A1
公开(公告)日：2019-05-16
申请号：PCT/KR2018/007343
申请日：2018-06-28
申请人： LEENO INDUSTRIAL INC.
发明人： JEONG, Jae-hwan , KIM, Geun-su , SHIN, Jung-chul
IPC分类号： G01R1/067 , G01R1/18 , G01R3/00 , G01R1/04 , G01R31/28
摘要： Disclosed is a test probe assembly. The test probe assembly includes: a conductive pipe; a probe inserted in the pipe without contacts and elastically retractable along a lengthwise direction; and an insulation probe supporting member configured to support the probe between an inner wall of the pipe and an outer surface of the probe. The test probe assembly of the present disclosure is improved in noise shield performance and convenient in repairing the probe since the probe is mounted to a probe socket as supported in a metal pipe without contacts.

2. 发明申请

WO2018044014A1 A TESTING DEVICE 审中-公开
标题翻译：测试设备
公开(公告)号：WO2018044014A1
公开(公告)日：2018-03-08
申请号：PCT/KR2017/009375
申请日：2017-08-28
申请人： LEENO INDUSTRIAL INC.
发明人： SHIN, Jung-chul
IPC分类号： G01R1/04 , G01R3/00 , G01R31/28
摘要： Disclosed is a testing device. The testing device includes a testing socket configured to support a plurality of probes, a testing-circuit substrate which includes a contact point to contact the probe, a slider which makes the testing socket be coupled to and separated from the testing-circuit substrate, and a slider operator which includes a main body arranged on the testing socket, and a slider pressing portion up/down-movably supported on the main body and moving down from the main body toward the slider so that the slider can slide along a surface direction of the testing socket.
摘要翻译：所公开的是一种测试设备。测试装置包括：构造成支撑多个探针的测试插座;测试电路基板，包括用于接触探针的接触点;滑块，使测试插座与测试电路基板耦合和分离;以及滑块操作器，该滑块操作器包括布置在测试插座上的主体以及可上下移动地支撑在主体上并且从主体朝向滑块向下移动的滑块推压部，使得滑块能够沿着滑块的表面方向测试套接字。

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