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1. 发明申请

WO2012116173A1 INTEGRATED CIRCUIT TESTING WITH POWER COLLAPSED 审中-公开
标题翻译：集成电路测试与功率收敛
公开(公告)号：WO2012116173A1
公开(公告)日：2012-08-30
申请号：PCT/US2012/026311
申请日：2012-02-23
申请人： QUALCOMM INCORPORATED , CHEN, Wei , TAO, Yucong , SEVERSON, Matthew L. , GEMAR, Jeffrey R. , YANG, Chang Yong
发明人： CHEN, Wei , TAO, Yucong , SEVERSON, Matthew L. , GEMAR, Jeffrey R. , YANG, Chang Yong
IPC分类号： G01R31/30
CPC分类号： G01R31/3177 , G01R31/3008 , G01R31/318575
摘要： In examples, apparatus and methods are provided for an integrated circuit. The integrated circuit includes a first integrated circuit portion having a main power domain and a second integrated circuit portion having a collapsible power domain. The integrated circuit also has a level shifter having an input coupled to the second circuit portion and an output coupled to the first integrated circuit portion. The level shifter is configured to hold constant the level shifter output when power to the collapsible power domain is collapsed. A quiescent drain current measurement circuit can be coupled to test at least a part of the second integrated circuit portion. A boundary scan register can be coupled between the level shifter output and the first integrated circuit portion. The integrated circuit can also include a power management circuit.
摘要翻译：在实例中，为集成电路提供了装置和方法。集成电路包括具有主电源域的第一集成电路部分和具有可折叠电源域的第二集成电路部分。集成电路还具有电平移位器，其具有耦合到第二电路部分的输入端和耦合到第一集成电路部分的输出端。电平移位器被配置为在可折叠电源域的电源被折叠时保持电平移位器输出的恒定。静态漏极电流测量电路可耦合以测试第二集成电路部分的至少一部分。边界扫描寄存器可以耦合在电平移位器输出和第一集成电路部分之间。集成电路还可以包括电源管理电路。

2. 发明申请

WO2013048578A1 DYNAMICALLY SELF-RECONFIGURABLE DAISY-CHAIN OF TAP CONTROLLERS 审中-公开
标题翻译：动态控制器的自动重新配置的DAISY链
公开(公告)号：WO2013048578A1
公开(公告)日：2013-04-04
申请号：PCT/US2012/037139
申请日：2012-05-09
申请人： QUALCOMM INCORPORATED , YANG, Chang Yong , MUMFORD, Clint W. , TAO, Yucong , BORDEN, Craig E.
发明人： YANG, Chang Yong , MUMFORD, Clint W. , TAO, Yucong , BORDEN, Craig E.
IPC分类号： G06F11/267 , G01R31/3185
CPC分类号： G01R31/318555
摘要： A self-reconfigurable daisy-chain of TAP controllers includes a main TAP controller and one or more auxiliary TAP controllers. The daisy-chain is dynamically self-reconfigurable in that the main TAP controller can configure and reconfigure the daisy-chain multiple times during the testing of a circuit. A data register within the main TAP controller is associated with a special JTAG instruction. This instruction is usable to enable and disable selected individual ones of the auxiliary TAP controllers. If an auxiliary controller is enabled, then it is made a part of the TDI-to-TDO daisy-chain scan path. If the auxiliary controller is disabled, then it is not a part of the daisy-chain scan path. A disabled controller and its registers are not, however, reset. A disabled controller can continue to supply test signals to the circuit under test. Using this mechanism, test time can be reduced by reducing the amount of shifting through slow controllers.
摘要翻译： TAP控制器的自重构菊花链包括主TAP控制器和一个或多个辅助TAP控制器。菊花链是动态自重新配置的，因为主TAP控制器可以在电路测试期间多次配置和重新配置菊花链。主TAP控制器内的数据寄存器与特殊的JTAG指令相关联。该指令可用于启用和禁用辅助TAP控制器中选定的各个。如果辅助控制器被使能，那么它就成为TDI到TDO菊花链扫描路径的一部分。如果辅助控制器被禁用，那么它不是菊花链扫描路径的一部分。然而，禁用的控制器及其寄存器不会被重置。禁用的控制器可以继续向被测电路提供测试信号。使用这种机制，可以通过减少通过慢速控制器的移动量来减少测试时间。

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