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    • 8. 发明授权
    • Error location search circuit, and error check and correction circuit and memory device including the same
    • 错误位置搜索电路,以及错误检查和校正电路和包含相同的存储器件
    • US09384083B2
    • 2016-07-05
    • US14034803
    • 2013-09-24
    • Samsung Electronics Co., Ltd.
    • Daisuke FujiwaraMakoto Hirano
    • H03M13/00G06F11/10H03M13/07H03M13/15
    • G06F11/10H03M13/07H03M13/1545H03M13/158H03M13/6561
    • Provided is an error check and correction (ECC) circuit which includes a Chien search unit configured to determine whether there is an error in a data string. The Chien search unit includes a circuit configured to calculate a first bit string by multiplying a plurality of elements of Galois Field GF(2n) and a value of (n-k)-bit, and calculate a second bit string by multiplying the plurality of elements and a value of k-bit; and a plurality of Chien search circuits configured to combine the first bit string and the second bit string to calculate the arbitrary element. The plurality of Chien search circuits are arranged in a matrix along a row direction and a column direction. The first bit string is provided in the row direction or the column direction, and the second bit string is provided in a direction different from the direction of the first bit string.
    • 提供了一种错误检查和校正(ECC)电路,其包括被配置为确定数据串中是否存在错误的Chien搜索单元。 Chien搜索单元包括被配置为通过乘以伽罗瓦域GF(2n)的多个元素和(nk)比特的值来计算第一比特串的电路,并且通过将多个元素相乘来计算第二比特串, k位的值; 以及多个Chien搜索电路,被配置为组合第一位串和第二位串以计算任意元素。 多个Chien搜索电路沿着行方向和列方向排列成矩阵。 第一位串被设置在行方向或列方向上,并且第二位串被设置在与第一位串的方向不同的方向上。