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    • 4. 发明授权
    • Logic architecture for single event upset immunity
    • US06614257B2
    • 2003-09-02
    • US09854247
    • 2001-05-11
    • Kenneth R. Knowles
    • Kenneth R. Knowles
    • H03K19003
    • H03K19/00338H03K19/0075
    • An SEU immune logic architecture includes a dual path logic gate coupled to a dual to single path converter. A first and a second logic element within the dual path logic gate are functionally and possibly structurally equivalent, and are coupled to receive input signals spanning redundant input signal sets. A given logic structure within the first logic element may receive specified input signals within a particular input signal set, while an analogous logic structure within the second logic element may receive corresponding input signals within the counterpart input signal set. A radiation induced transient pulse that affects one input signal may affect an output signal asserted by one logic structure; however, since the transient pulse doesn't affect a corresponding input signal applied to the analogous logic structure, the dual path logic gate may output at least one correctly valued signal when a transient pulse occurs. The dual to single path converter is coupled to receive signals output by the dual path logic gate. In the event that a transient signal appears at an input of the dual to single path converter, a current path may be interrupted, and a correct output signal value is maintained as a result of stray capacitance present at an output node.
    • 8. 发明授权
    • Integrated semiconductor circuit having at least two supply networks
    • 具有至少两个供电网络的集成半导体电路
    • US06445091B1
    • 2002-09-03
    • US09197369
    • 1998-11-20
    • Martin Buck
    • Martin Buck
    • H03K19003
    • G11C5/14H03K19/018521Y10T307/858
    • An integrated semiconductor circuit has at least two supply networks that are supplied independently of one another. The two supply networks include a first, load supply network, which is associated with a load circuit, and a second, driver supply network, which is associated with a driver circuit. Each supply network has a ground path with ground lines and a supply path with supply potential lines which are separate from the ground path. A compensating circuit is provided which alternatively couples the ground paths and/or the supply paths of the at least two supply networks to one another.
    • 集成半导体电路具有彼此独立地提供的至少两个供电网络。 两个供电网络包括与负载电路相关联的第一负载供应网络和与驱动器电路相关联的第二驱动器供电网络。 每个供电网络具有接地线的接地路径和具有与接地路径分开的供电电位线的供电路径。 提供补偿电路,其将至少两个供电网络的接地路径和/或供电路径交替地彼此耦合。
    • 9. 发明授权
    • Semiconductor integrated circuit
    • 半导体集成电路
    • US06420896B1
    • 2002-07-16
    • US09827928
    • 2001-04-09
    • Hideshi Maeno
    • Hideshi Maeno
    • H03K19003
    • G11C29/48G11C2029/3202
    • To provide a semiconductor integrated circuit having a redundancy-relieved data output function which can carry out a pass/fail test of a selecting operation of a redundancy-relieved output selecting circuit for redundancy-relieved output data. Data inputs D of scan flip-flops SFFC , SFFC , SFFC and SFFC are connected to redundancy-relieved output data XDO , XDO , XDO and XDO in place of output data DO , DO , DO and DO of a conventional RAM 211, respectively. An AND gate 21 receives a serial output SO at one of inputs and receives a selector test signal PFIN at the other input, and an output thereof is sent to the other input of an AND gate 223. AND gates 221 to 223 to be connected in series receive serial outputs SO to SO of the SFFC to the SFFC at inputs, respectively.
    • 提供一种具有冗余度减小的数据输出功能的半导体集成电路,该功能可执行用于冗余消除输出数据的冗余缓冲输出选择电路的选择操作的通过/失败测试。 扫描触发器SFFC ,SFFC ,SFFC 和SFFC i的数据输入D连接到冗余释放输出数据XDO i + 3,XDO < i + 2>,XDO 和XDO i代替常规RAM的输出数据DO ,DO ,DO 和DO 211。 AND门21在其中一个输入端接收串行输出SO 的SO 到输入端的SFFC 的串行输出SO
    • 10. 发明授权
    • Programmable logic device with redundant circuitry
    • 具有冗余电路的可编程逻辑器件
    • US06344755B1
    • 2002-02-05
    • US09691424
    • 2000-10-18
    • Srinivas T. ReddyManuel MejiaAndy L. LeeBruce B. Pedersen
    • Srinivas T. ReddyManuel MejiaAndy L. LeeBruce B. Pedersen
    • H03K19003
    • H03K19/17764H03K19/17736
    • A programmable logic device is provided that allows a redundant row of programmable logic to be shifted into place to repair the device when a defect is detected in a row of programmable logic on the device. The redundant row is shifted into place by routing programming data into the normal logic and the redundant logic while bypassing the row of logic containing the defect. Switching circuitry may be used to direct programming data into the serial inputs of various data registers that are then used to load the programming data into the device. The patterns of programmable connections that are made between programmable logic regions on the device and vertical and horizontal conductors also allow redundant logic to be shifted into place. Some connections between the logic and the horizontal and vertical conductors may be identical within a column to facilitate shifting. Other connections may only partially overlap between respective rows. The partially overlapping pattern allows the connections to be less regular, which increases flexibility when routing signals on the device.
    • 提供了一种可编程逻辑器件,其允许在器件上的可编程逻辑行中检测到缺陷时将冗余的可编程逻辑行移位到位以修复器件。 通过将编程数据路由到正常逻辑和冗余逻辑中来绕过包含缺陷的逻辑行,将冗余行移位到位。 开关电路可用于将编程数据引导到各种数据寄存器的串行输入,然后将其用于将编程数据加载到器件中。 在设备上的可编程逻辑区域和垂直和水平导体之间进行的可编程连接的模式也允许将冗余逻辑移位到位。 逻辑和水平和垂直导体之间的一些连接可以在列内相同以便于移动。 其他连接可能仅在相应行之间部分重叠。 部分重叠的模式允许连接不太规则,这在设备上路由信号时增加灵活性。