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    • 3. 发明授权
    • Using dedicated read output path to reduce unregistered read access time for a FPGA embedded memory
    • 使用专用读输出路径减少FPGA嵌入式存储器的未注册读取访问时间
    • US07715271B1
    • 2010-05-11
    • US12176592
    • 2008-07-21
    • Haiming YuWei Yee Koay
    • Haiming YuWei Yee Koay
    • G11C8/02
    • H03K19/1776G11C7/1051G11C7/1057G11C7/106G11C2207/105H03K19/17744
    • A memory unit includes width decoding logic enabling data to be accessed in a memory array at different data widths. To improve memory access speed, the memory unit also includes dedicated read output paths for accessing data at the full data width of the memory array. The dedicated read output paths bypass the width decoding logic and provide data from the memory array directly to a data bus, thereby providing improved memory performance when width decoding is not needed. The memory unit can be incorporated in programmable devices and a programmable device configuration can select either the read bypass paths or the width decoding logic. Hardware applications that require width decoding and improved memory access speed can utilize additional programmable device resources outside the memory unit to register the full width data from the memory unit and convert it to a different data width.
    • 存储单元包括能够以不同数据宽度在存储器阵列中访问数据的宽度解码逻辑。 为了提高存储器访问速度,存储器单元还包括用于以存储器阵列的完整数据宽度访问数据的专用读取输出路径。 专用读输出路径绕过宽度解码逻辑,并将数据从存储器阵列直接提供给数据总线,从而在不需要宽度解码时提供改进的存储器性能。 存储器单元可并入可编程器件中,并且可编程器件配置可以选择读取旁路路径或宽度解码逻辑。 需要宽度解码和改善存储器访问速度的硬件应用可以利用存储器单元之外的附加可编程设备资源来从存储器单元注册全宽数据并将其转换成不同的数据宽度。
    • 4. 发明授权
    • Synchronous memory device
    • 同步存储设备
    • US07554878B2
    • 2009-06-30
    • US11511678
    • 2006-08-29
    • Youn-cheul Kim
    • Youn-cheul Kim
    • G11C8/02
    • G11C7/1072G11C7/222G11C7/227
    • A synchronous memory device, which includes a read command buffer, a replica circuit, and a latency circuit. The read command buffer provides a read signal in response to a read command. The replica circuit provides a transfer signal whose time difference with respect to the feedback clock signal is substantially identical to a period that it takes a read command buffer to provide the read signal. The latency circuit receives the read signal, and provides a latency signal having a difference of a predetermined time corresponding to CAS latency with respect to the read signal in response to the transfer signal.
    • 同步存储器件,其包括读命令缓冲器,复制电路和延迟电路。 读取命令缓冲器响应读取命令提供读取信号。 复制电路提供传输信号,其相对于反馈时钟信号的时间差基本上与读取命令缓冲器提供读取信号所需的时间相同。 等待时间电路接收读取信号,并响应于传送信号提供相对于读取信号的对应于CAS等待时间的预定时间的差异的等待时间信号。
    • 5. 发明授权
    • Phase locked loop circuit and method of locking a phase
    • 锁相环电路及锁相方法
    • US07420870B2
    • 2008-09-02
    • US11430199
    • 2006-05-09
    • Moon-Sook ParkKyu-Hyoun Kim
    • Moon-Sook ParkKyu-Hyoun Kim
    • G11C8/02H03L7/06
    • H03L7/0995H03K3/0315H03K5/133H03L7/089H03L7/0891H03L7/093
    • A phase locked loop circuit and method of locking a phase. The phased locked loop circuit may include a phase detector receiving an external clock signal and a feedback clock signal and outputting an up signal when a phase of the external clock signal leads a phase of the feedback clock signal and outputting a down signal when the phase of the external clock signal lags the phase of the feedback clock signal, a loop filter circuit increasing a control voltage in response to the up signal and decreasing the control voltage in response to the down signal, and a voltage controlled oscillator circuit receiving the control voltage and directly generating at least n (where n is an integer ≧4) internal clock signals. The phased locked loop circuit may also include a voltage controlled oscillator circuit, including at least four loops, receiving the control voltage and generating multiple internal clock signals.
    • 一种锁相环电路及锁相方法。 相位锁定环电路可以包括接收外部时钟信号和反馈时钟信号的相位检测器,并且当外部时钟信号的相位引导反馈时钟信号的相位并在相位为 外部时钟信号滞后于反馈时钟信号的相位,环路滤波器电路响应于上升信号增加控制电压,并响应于下降信号降低控制电压,以及压控振荡器电路接收控制电压和 直接产生n个(其中n是整数> = 4)内部时钟信号。 相位锁定环路电路还可以包括压控振荡器电路,其包括至少四个环路,接收控制电压并产生多个内部时钟信号。
    • 8. 发明申请
    • Failover control of dual controllers in a redundant data storage system
    • 冗余数据存储系统中双控制器的故障转移控制
    • US20060083102A1
    • 2006-04-20
    • US10969149
    • 2004-10-20
    • Ayman GhanemRobert Bean
    • Ayman GhanemRobert Bean
    • G11C8/02
    • G11C29/74G06F11/2074G06F11/2092
    • A redundant data storage system is provided comprising a first controller with top-level control of a first memory space and a second controller with top-level control of a second memory space different than the first memory space. The system is adapted for asynchronously reflectively writing state information by the first controller to the second memory space; alternatively the system is adapted for asynchronously reflectively writing state information by the second controller to the first memory space. A method is provided for operating the redundant data storage system by resolving any inconsistency between the existing state information and a modified state information associated with a state information change request, and for switching control in the redundant data storage system between the controllers.
    • 提供了冗余数据存储系统,其包括具有第一存储器空间的顶级控制的第一控制器和具有与第一存储器空间不同的第二存储器空间的顶级控制的第二控制器。 该系统适于将第一控制器的状态信息异步地反映到第二存储器空间; 或者该系统适于将第二控制器的状态信息异步地反映到第一存储器空间。 提供了一种用于通过解决现有状态信息与与状态信息改变请求相关联的修改状态信息之间的任何不一致以及用于控制器之间的冗余数据存储系统中的切换控制来操作冗余数据存储系统的方法。
    • 9. 发明申请
    • Phase-changeable memory devices and methods of forming the same
    • 相变存储器件及其形成方法
    • US20060072370A1
    • 2006-04-06
    • US11205742
    • 2005-08-17
    • Bong-Jin KuhYong-Ho HaJi-Hye Yi
    • Bong-Jin KuhYong-Ho HaJi-Hye Yi
    • G11C8/02
    • G11C13/0004H01L27/2436H01L45/06H01L45/1233H01L45/126H01L45/144H01L45/1608Y10S438/90
    • A phase-changeable memory device includes a substrate having a contact region on an upper surface thereof. An insulating interlayer on the substrate has an opening therein, and a lower electrode is formed in the opening. The lower electrode has a nitrided surface portion and is in electrical contact with the contact region of the substrate. A phase-changeable material layer pattern is on the lower electrode, and an upper electrode is on the phase-changeable material layer pattern. The insulating interlayer may have a nitrided surface portion and the phase-changeable material layer may be at least partially on the nitrided surface portion of the insulating interlayer. A nitride layer may be formed on the insulating interlayer. The lower electrode may have a nitrided surface portion and the phase-changeable material layer may be at least partially on the nitrided surface portion of the lower electrode. Methods of forming phase-changeable memory devices are also disclosed.
    • 相变型存储器件包括在其上表面具有接触区域的衬底。 衬底上的绝缘中间层具有开口,并且在开口中形成下电极。 下电极具有氮化表面部分并且与衬底的接触区域电接触。 相变材料层图案位于下电极上,上电极位于相变材料层图案上。 绝缘中间层可以具有氮化表面部分,并且相变材料层可以至少部分地在绝缘中间层的氮化表面部分上。 可以在绝缘中间层上形成氮化物层。 下部电极可以具有氮化表面部分,并且相变材料层可以至少部分地位于下部电极的氮化表面部分上。 还公开了形成相变存储器件的方法。