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    • 4. 发明授权
    • Semiconductor memory device having a plurality of transfer gates and improved word line and column select timing for high speed write operations
    • 具有多个传输门的半导体存储器件和用于高速写入操作的改进的字线和列选择定时
    • US06198687B1
    • 2001-03-06
    • US08716884
    • 1996-09-20
    • Koji SakuiKazunori OhuchiFujio Masuoka
    • Koji SakuiKazunori OhuchiFujio Masuoka
    • G11C11407
    • G11C8/18
    • A semiconductor memory device which receives a row address strobe (RAS) signal and a column address strobe (CAS) signal from an external device. The device includes rewritable memory cells formed on a semiconductor substrate, a plurality of bit lines, a plurality of word lines, and a transfer gate coupled between the bit lines and input/output (I/O) lines and controlled by a column select line or signal. In one embodiment, a first transfer gate is connected between the bit lines and a second transfer gate, the second transfer gate connected between the first transfer gate and an input/output (I/O) line and controlled by a column select line (CSL). A third transfer gate may also by provided. The first transfer gate is driven in response to a clock signal which is enabled at substantially the same time as a word line of the plurality of word lines is selected during both read and write cycles. Thus, during a write cycle in which the CAS signal is enabled prior to the RAS signal, a selected CSL can be increased from a first voltage (VSS) to one of a second voltage (Vdd) and {fraction (3/2)} Vdd as soon as a column address is input.
    • 从外部设备接收行地址选通(RAS)信号和列地址选通(CAS)信号的半导体存储器件。 该器件包括形成在半导体衬底上的可重写存储单元,多个位线,多个字线和耦合在位线和输入/输出(I / O)线之间并由列选择线控制的传输栅极 或信号。 在一个实施例中,第一传输门连接在位线和第二传输门之间,第二传输门连接在第一传输门和输入/输出(I / O)线之间,并由列选择线(CSL )。 也可以通过提供第三传输门。 响应于在读取和写入周期期间选择多个字线的字线的基本上相同的时间使能的时钟信号来驱动第一传输门。 因此,在RAS信号之前的CAS信号被使能的写周期中,所选择的CSL可以从第一电压(VSS)增加到第二电压(Vdd)和{分数(3/2)}之一 一旦列地址被输入,就会Vdd。