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    • 2. 发明授权
    • Sigma-delta modulator and analog-to-digital converter
    • Σ-Δ调制器和模数转换器
    • US09350380B2
    • 2016-05-24
    • US14425095
    • 2013-02-28
    • INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY OF SCIENCES
    • Lan Chen
    • H03M3/00H03M1/00
    • H03M3/324H03M1/002H03M3/38H03M3/424H03M3/438H03M3/50
    • A Sigma-Delta modulator and an analog-to-digital converter. The Sigma-Delta modulator comprises a quantizer, a correction module and an RC integrator. The correction module comprises a predetermined resistance through which a correction level is generated. The correction module is used to compare the correction level with a predetermined reference voltage by using a comparator in the quantizer, so as to generate a digital correction signal, based on which the resistance in a resistance correction array in the RC integrator is corrected. The predetermined resistance is of the same type as the resistance in the resistance correction array in the RC integrator. The Sigma-Delta modulator and the analog-to-digital converter can correct the resistance deviation in the RC integrator.
    • Σ-Δ调制器和模数转换器。 Sigma-Delta调制器包括量化器,校正模块和RC积分器。 校正模块包括产生校正水平的预定电阻。 校正模块用于通过使用量化器中的比较器将校正电平与预定参考电压进行比较,以产生数字校正信号,基于该校正信号校正RC积分器中的电阻校正阵列中的电阻。 预定电阻与RC积分器中的电阻校正阵列中的电阻相同。 Sigma-Delta调制器和模数转换器可以校正RC积分器中的电阻偏差。
    • 5. 发明申请
    • Fast, high-resolution, indirect measurement of a physical value
    • 快速,高分辨率,间接测量物理价值
    • US20040257091A1
    • 2004-12-23
    • US10810340
    • 2004-03-26
    • Pavel HorskyIvan Koudar
    • G01R027/02
    • G01D3/028H03M3/324H03M3/356
    • A measurement method or system for measuring a physical value comprises, during a same clock cycle, forming an input signal, a reference signal and an offset signal, the input signal including a parasitic value and a useful measurement value. A relationship between the input signal where the parasitic value has been cancelled out, and the reference signal is derived. From this relationship, a value relating to the physical value is determined. The input signal, reference signal and offset signal are respectively associated with an input element, a reference element and a parasitic element. All elements have a common driving signal, and the parasitic value is depending on the common driving signal. The fact that different signals are formed during a same measurement cycle, and that these signals are sufficient to obtain the desired physical value, makes the measurement method or system of the present invention faster than prior art measurement methods or systems: only one conversion cycle is needed against two cycles needed for dual slope analog-to-digital conversion.
    • 用于测量物理值的测量方法或系统包括在同一时钟周期内形成输入信号,参考信号和偏移信号,所述输入信号包括寄生值和有用测量值。 导出寄生值已被抵消的输入信号与参考信号之间的关系。 根据该关系,确定与物理值有关的值。 输入信号,参考信号和偏移信号分别与输入元件,参考元件和寄生元件相关联。 所有元件均具有公共驱动信号,寄生值取决于公共驱动信号。 在相同测量周期内形成不同信号,并且这些信号足以获得所需物理值的事实使得本发明的测量方法或系统比现有技术的测量方法或系统更快:只有一个转换周期是 需要双斜率模数转换所需的两个周期。
    • 6. 发明授权
    • Sigma delta modulator
    • Sigma delta调制器
    • US06696999B2
    • 2004-02-24
    • US10196343
    • 2002-07-16
    • George OllosLarry W. Dayhuff
    • George OllosLarry W. Dayhuff
    • H03M300
    • H03M3/324H03M3/43H03M3/438
    • A sigma delta modulator having an integrator with a first input for coupling to an analog signal and a second input for coupling to a reference voltage. A comparator is provided having a first input coupled to an output of the integrator and a second input for coupling to the reference voltage. The comparator produces signal having a logic state in accordance with the relative magnitude of signals at the first and second inputs thereof. The logic state is latched at the output of such comparator during latching transitions in a series of latching pulses fed to the comparator. A one-bit quantizer is provided for storing the logic state of at the output of the comparator at sampling transitions of a series of clock pulses fed to the one-bit quantizer. The series of clock pulses and the series of latching pulses are synchronized one with the other. Each one of the latching transitions occurs prior to a corresponding one of the sampling transitions. A buffer is coupled between an output of the quantizer and the first input of the integrator. The regulator produces a voltage to power the buffer. The reference voltage is a fractional portion of the voltage produced by the regulator for the buffer. In one embodiment, the modulator including a second integrator having a first input coupled to the output of the first integrator, a second input for coupling to the reference voltage, and an output coupled to the first input of the comparator. A second buffer is included coupled between an output of the quantizer and the first input of the second integrator.
    • 具有积分器的Σ-Δ调制器,具有用于耦合到模拟信号的第一输入端和用于耦合到参考电压的第二输入端。 提供比较器,其具有耦合到积分器的输出的第一输入和用于耦合到参考电压的第二输入。 比较器产生具有根据其第一和第二输入处的信号的相对幅度具有逻辑状态的信号。 逻辑状态在锁存转换期间被锁存在这种比较器的输出端处,并在一系列被馈送到比较器的锁存脉冲中。 提供一位量化器,用于在馈送给一比特量化器的一系列时钟脉冲的采样转变处存储比较器输出的逻辑状态。 一系列时钟脉冲和一系列锁存脉冲同步,另一个。 每个锁存转换发生在相应的一个采样转换之前。 缓冲器耦合在量化器的输出端和积分器的第一输入端之间。 调节器产生电压为缓冲器供电。 参考电压是由缓冲器的稳压器产生的电压的一小部分。 在一个实施例中,调制器包括第二积分器,其具有耦合到第一积分器的输出的第一输入端,耦合到参考电压的第二输入端和耦合到比较器的第一输入端的输出端。 包括耦合在量化器的输出端和第二积分器的第一输入端之间的第二缓冲器。
    • 8. 发明申请
    • Non-linear signal correction
    • 非线性信号校正
    • US20020158680A1
    • 2002-10-31
    • US10146311
    • 2002-05-14
    • PHILIPS SEMICONDUCTORS
    • Michiel A.P. PertusAnthonius BakkerJohan H. Huijsing
    • G06G007/12
    • H03M1/0621G01D3/02G01K7/01G05F3/30H03M1/12H03M3/324H03M3/458
    • Signal correction in a bipolar transistor circuit having a base-emitter voltage and a non-linear output signal corresponding to a detectable characteristic is improved by correcting non-linearity in the signal at third and/or higher-orders. According to an example embodiment of the present invention, the output of the transistor is corrected as a function of the base-emitter voltage, the non-linear output signal and a generated non-linearity. The generated non-linearity is adapted to cancel the non-linearity of the non-linear output signal when added thereto. Various implementations of the present invention are applicable to a variety of applications, each of which may have selected characteristics that are accounted for by the generated non-linearity, which is selectively adapted for each particular application. In this manner, third and higher-order corrections can be made, and the detection of characteristics such as data, temperature and other terms is improved.
    • 通过校正第三和/或更高阶的信号中的非线性,改善了具有对应于可检测特性的基极 - 发射极电压和非线性输出信号的双极晶体管电路中的信号校正。 根据本发明的示例性实施例,晶体管的输出被校正为基极 - 发射极电压,非线性输出信号和产生的非线性的函数。 所生成的非线性适于在添加到非线性输出信号时消除非线性输出信号的非线性。 本发明的各种实现可应用于各种应用,每种应用可以具有被生成的非线性所考虑的所选择的特征,其被选择性地适用于每个特定应用。 以这种方式,可以进行第三和更高级的校正,并且提高诸如数据,温度和其它项的特性的检测。
    • 9. 发明授权
    • Non-linear signal correction
    • 非线性信号校正
    • US06456145B1
    • 2002-09-24
    • US09672806
    • 2000-09-28
    • Michiel A. P. PertijsAnthonius BakkerJohan H. Huijsing
    • Michiel A. P. PertijsAnthonius BakkerJohan H. Huijsing
    • G06G712
    • H03M1/0621G01D3/02G01K7/01G05F3/30H03M1/12H03M3/324H03M3/458
    • Signal correction in a bipolar transistor circuit having a base-emitter voltage and a non-linear output signal corresponding to a detectable characteristic is improved by correcting non-linearity in the signal at third and/or higher-orders. According to an example embodiment of the present invention, the output of the transistor circuit is corrected as a function of the base-emitter voltage, the non-linear output signal and a generated non-linearity. The generated non-linearity is adapted to cancel the non-linearity of the non-linear output signal. Various implementations of the present invention are applicable to a variety of applications, each of which may have selected characteristics that are accounted for by the generated non-linearity, which is selectively adapted for each particular application. In one implementation, the non-linearity is generated using two or more division circuits. In this manner, third and higher-order corrections can be made, and the detection of characteristics such as data, temperature and other terms is improved.
    • 通过校正第三和/或更高阶的信号中的非线性,改善了具有对应于可检测特性的基极 - 发射极电压和非线性输出信号的双极晶体管电路中的信号校正。 根据本发明的示例性实施例,晶体管电路的输出被校正为基极 - 发射极电压,非线性输出信号和产生的非线性的函数。 所产生的非线性适于消除非线性输出信号的非线性。 本发明的各种实现可应用于各种应用,每种应用可以具有被生成的非线性所考虑的所选择的特征,其被选择性地适用于每个特定应用。 在一个实现中,使用两个或更多个除法电路产生非线性。 以这种方式,可以进行第三和更高级的校正,并且提高诸如数据,温度和其它项的特性的检测。
    • 10. 发明授权
    • Delta-sigma modulator with improved full-scale accuracy
    • Delta-sigma调制器具有提高的满量程精度
    • US6140950A
    • 2000-10-31
    • US135224
    • 1998-08-17
    • Florin A. Oprescu
    • Florin A. Oprescu
    • H03M3/02H03M3/00
    • H03M3/324H03M3/43H03M3/452
    • The invention provides methods and apparatus for improving the full-scale accuracy of an oversampling analog-to-digital converter. In particular, an improved switched-capacitor subtractor/integrator circuit is described that effectively provides a desired capacitor ratio by using N+M distinct unit capacitors that each sample an input signal a first predetermined number of times and sample one or more reference signals a second predetermined number of times, where the ratio of the first predetermined number to the second predetermined number is the desired capacitor ratio N/M.
    • 本发明提供了用于提高过采样模数转换器的满量程精度的方法和装置。 特别地,描述了一种改进的开关电容减法器/积分器电路,其通过使用N + M个不同的单位电容器来有效地提供期望的电容器比率,每个单位电容器对输入信号进行第一预定次数的采样,并且对一个或多个参考信号进行采样 预定次数,其中第一预定数量与第二预定数量的比率是期望的电容器比率N / M。