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1. 发明授权

US10841561B2 Apparatus and method for three-dimensional inspection 有权
公开(公告)号：US10841561B2
公开(公告)日：2020-11-17
申请号：US15468128
申请日：2017-03-24
申请人： Test Research, Inc.
发明人： Wen-Tzong Lee , Kuang-Pu Wen , Don Lin
IPC分类号： H04N13/243 , H04N13/254 , G01B11/25 , H04N13/271 , H04N13/00
CPC分类号： H04N13/243 , G01B11/2545 , H04N13/254 , H04N13/271 , H04N2013/0081
摘要： An apparatus for three-dimensional inspection includes a carrier, an image sensing component, and a processor. The carrier is configured to hold an object. The image sensing component is configured to capture a first image, a second image and a third image of the object along a first axis, a second axis, and a third axis respectively, and the first axis, the second axis, and the third axis are not parallel with each other. The processor is configured to analyze the first image and the second image to obtain a first directional stereo information, and analyze the third image and a determined image of the object to obtain a second directional stereo information.

2. 发明授权

US10600174B2 Optical inspection apparatus 有权
公开(公告)号：US10600174B2
公开(公告)日：2020-03-24
申请号：US14983470
申请日：2015-12-29
申请人： Test Research, Inc.
发明人： Yeong-Feng Wang
IPC分类号： H04N9/47 , G06T7/00 , H04N5/225 , G02B5/20 , G02B27/10 , G02B27/14
摘要： An optical inspection apparatus includes a dichroic mirror, a first light source, and a first image capturing device. The dichroic mirror has a first side and a second side opposite to the first side. The dichroic mirror transmits a first light beam and reflects a second light beam. The wavelength of the second light beam is different from the wavelength of the first light beam. The first light source is disposed at the first side of the dichroic mirror and is configured to provide the first light beam to pass through the dichroic mirror. The first image capturing device is disposed at the second side of the dichroic mirror and is configured to detect the second light beam reflected from the dichroic mirror.

3. 发明授权

US09841387B2 Inspection method and device 有权
公开(公告)号：US09841387B2
公开(公告)日：2017-12-12
申请号：US14986718
申请日：2016-01-03
申请人： Test Research, Inc.
发明人： Liang-Pin Yu , Chia-Ho Yen , Hao-Kai Chou , Chun-Ti Chen , Meng-Kun Lee
IPC分类号： G06K9/00 , G01N23/04 , G01B15/04
CPC分类号： G01N23/04 , G01B15/04 , G01B2210/56 , G06K9/00
摘要： An inspection method is provided herein. The inspection method is adapted for an inspection device. The inspection method includes: optically scanning an examining target for generating a scanned image; reconstructing the scanned image for a reconstructed volume; adjusting a slicing direction associated with the examining target for slicing the reconstructed volume into a sliced image; inspecting the sliced image for analyzing one or more features of the examining target; and outputting an inspection result of the examining target.

4. 发明授权

US09838612B2 Inspecting device and method for inspecting inspection target 有权
公开(公告)号：US09838612B2
公开(公告)日：2017-12-05
申请号：US14797188
申请日：2015-07-13
申请人： Test Research, Inc.
发明人： Yeong-Feng Wang , Kuang-Pu Wen
IPC分类号： H04N7/18 , H04N5/235 , G01N21/88 , H04N5/225 , G06T7/00
CPC分类号： H04N5/2354 , G01N21/8806 , G01N2021/8845 , G01N2201/061 , G06T7/0004 , G06T2207/30141 , H04N5/2256
摘要： An inspecting device for inspecting an inspection target is provided. The inspecting device includes a mono-color image-retrieving module, illuminating modules and a control module. The mono-color image-retrieving module is disposed above the inspection target with an optical axis orienting toward the inspection target. Each of the illuminating modules includes light-emitting elements of different colors. The control module controls the illuminating modules to sequentially generate illuminating lights both in an order of different colors and different incident angles to further control the mono-color image-retrieving module to sequentially retrieve mono-color images each in response to one illumination of the illuminating lights. The control module performs an inspection of the inspection target based on the mono-color images.

5. 发明授权

US09485491B2 Optical system 有权
标题翻译：光学系统
公开(公告)号：US09485491B2
公开(公告)日：2016-11-01
申请号：US14570224
申请日：2014-12-15
申请人： Test Research, Inc.
发明人： Liang-Pin Yu , Yeong-Feng Wang
IPC分类号： G01B11/30 , H04N13/00 , G02B26/08 , H04N13/02 , G02B5/04
CPC分类号： H04N13/158 , G02B5/04 , G02B26/0816 , H04N13/239 , H04N13/243 , H04N13/254
摘要： An optical system includes at least one optical apparatus. The optical apparatus includes a first light source, a second light source, and a dynamic switch. The first light source is configured for providing a first light beam. The second light source is configured for providing a second light beam. The dynamic switch includes a plurality of mirrors arranged in an array manner. Each of the mirrors has a first tilt angle and a second tilt angle. The first light beam and the second light beam impinge on the dynamic switch from different directions. The dynamic switch reflects the first light beam to a desired position when the mirrors are at the first tilt angles, and reflects the second light beam to the desired position when the mirrors are at the second tilt angles.
摘要翻译：光学系统包括至少一个光学装置。光学装置包括第一光源，第二光源和动态开关。第一光源被配置用于提供第一光束。第二光源被配置用于提供第二光束。动态开关包括以阵列方式布置的多个反射镜。每个反射镜具有第一倾斜角和第二倾斜角。第一光束和第二光束从不同方向入射到动态开关上。当反射镜处于第一倾斜角度时，动态开关将第一光束反射到期望的位置，并且当反射镜处于第二倾斜角时将第二光束反射到期望的位置。

6. 发明授权

US09420235B2 Measuring system for a 3D object 有权
标题翻译： 3D对象的测量系统
公开(公告)号：US09420235B2
公开(公告)日：2016-08-16
申请号：US12896949
申请日：2010-10-04
申请人： Kuang-Pu Wen , Don Lin , Liang-Pin Yu
发明人： Kuang-Pu Wen , Don Lin , Liang-Pin Yu
IPC分类号： H04N7/18 , G01B11/25
CPC分类号： H04N7/18 , G01B11/2518
摘要： A measuring system for a 3D object includes a base, a horizontal scanning device disposed on the base, a first light emitting device, a second light emitting device, an image capture device, and a control device. The first light emitting device, the second light emitting device, and the image capture device are connected to the horizontal scanning device. The control device controls the horizontal scanning device to cause planar motion relative to the base. With the control of the control device, the first light emitting device and the second light emitting device alternate in projecting a light source onto a 3D object. The image capture device includes a double-sided telecentric lens to capture a plurality of images of the 3D object when the light source is projected onto the 3D object.
摘要翻译：用于3D物体的测量系统包括基座，设置在基座上的水平扫描装置，第一发光装置，第二发光装置，图像捕获装置和控制装置。第一发光器件，第二发光器件和图像捕获器件连接到水平扫描器件。控制装置控制水平扫描装置相对于底座引起平面运动。通过控制装置的控制，第一发光装置和第二发光装置在将光源投影到3D物体上交替。图像捕获装置包括双面远心透镜，用于当光源投射到3D对象上时捕获3D对象的多个图像。

7. 发明授权

US08767900B2 Signal transition detection circuit and method of the same 有权
标题翻译：信号转换检测电路及其方法相同
公开(公告)号：US08767900B2
公开(公告)日：2014-07-01
申请号：US13454352
申请日：2012-04-24
申请人： Yu-Chen Shen , Kuei-Chang Yang
发明人： Yu-Chen Shen , Kuei-Chang Yang
IPC分类号： H04L7/02
CPC分类号： H04L1/24
摘要： A signal transition detection circuit is provided. The signal transition detection circuit comprises a counter module, a DAC, a comparator and a digital sampling module. The counter module generates a digital step signal. The DAC converts the digital step signal into an analog input signal and transmits it to an under-test circuit such that the under-test circuit generates an output signal transiting from a first stable level to a second stable level, wherein a transition section is located between the first and the second stable level. The comparator receives and compares the output signal with a default value to generate a normalized output signal. The digital sampling module samples the normalized output signal to retrieve impulses such that when the number of the impulses is accumulated to be larger than a reference value, a corresponding step of the digital step signal is determined to be a transition point.
摘要翻译：提供了一种信号转换检测电路。信号转换检测电路包括计数器模块，DAC，比较器和数字采样模块。计数器模块产生数字步进信号。 DAC将数字步进信号转换为模拟输入信号并将其发送到未被测试的电路，使得欠测试电路产生从第一稳定电平转移到第二稳定电平的输出信号，其中过渡部分位于在第一和第二稳定水平之间。比较器接收并比较输出信号与默认值，以产生归一化的输出信号。数字采样模块对归一化的输出信号进行采样以取回脉冲，使得当脉冲数被累积到大于参考值时，数字步进信号的相应步骤被确定为转变点。

8. 发明申请

US20140022357A1 THREE-DIMENSIONAL IMAGE MEASURING APPARATUS 有权
标题翻译：三维图像测量装置
公开(公告)号：US20140022357A1
公开(公告)日：2014-01-23
申请号：US13687639
申请日：2012-11-28
申请人： TEST RESEARCH, INC.
发明人： Liang-Pin YU , Don LIN , Kuang-Pu WEN
IPC分类号： H04N13/02
CPC分类号： H04N13/20 , G01B11/25 , H04N13/254
摘要： A three-dimensional image measuring apparatus includes a measurement platform, a movable optical head, a three-dimensional calculator module, a moving module and a calibration controlling module. The movable optical head includes a beam splitter unit, a projecting module, an image-capturing module and an indicator module. The measurement platform supports an object under measurement. The projecting module generates a structure light of parallel sinusoid strips pattern to the object under measurement. The image-capturing module includes image-capturing units facing the object under measurement from different directions or angles. Each image-capturing unit is configured to capture a reflection image which is formed from the structure light of parallel sinusoid strips pattern reflected by the object under measurement. The indicator module projects an alignment beam onto the object under measurement for forming an alignment mark. The calibration controlling module selectively drives the moving module to move the movable optical head according to the alignment mark.
摘要翻译：三维图像测量装置包括测量平台，可移动光学头，三维计算器模块，移动模块和校准控制模块。可移动光学头包括分束器单元，投影模块，图像捕获模块和指示器模块。测量平台支持测量对象。投影模块产生平行的正弦波形图案的结构光，以测量对象。图像捕获模块包括从不同方向或角度面向被测物体的图像捕获单元。每个图像捕获单元被配置为捕获由被测量对象反射的并行正弦波形图案的结构光形成的反射图像。指示器模块将对准光束投射到测量对象上以形成对准标记。校准控制模块选择性地驱动移动模块以根据对准标记移动可移动光学头。

9. 发明授权

US08350575B2 Electrical connection defect detection system and method 有权
标题翻译：电气连接缺陷检测系统及方法
公开(公告)号：US08350575B2
公开(公告)日：2013-01-08
申请号：US12761456
申请日：2010-04-16
申请人： Su-Wei Tsai , Shang-Tsang Yeh
发明人： Su-Wei Tsai , Shang-Tsang Yeh
IPC分类号： G01R31/04
CPC分类号： G01R31/046
摘要： An electrical connection defect detection system to detect whether an electrical connection between an under-test pin of an under-test device and a signal line of a circuit board is normal is provided. The electrical connection defect detection system comprises a signal provider providing a test signal to the under-test pin through the signal line, a detection module, an electrode board and a plurality of grounding paths. The electrode board comprises a detection surface to be adapted to a surface of the under-test device opposite to the under-test pin to make the detection module detect a capacitance value associated with the electrode board, the under-test pin and the signal line larger than a threshold value when their connection is normal. The grounding paths are connected to one of not-under-test pin groups respectively to further connect to the ground potential. An electrical connection defect detection method is disclosed herein as well.
摘要翻译：一种电连接缺陷检测系统，用于检测被测装置的未被测试的引脚与电路板的信号线之间的电连接是否正常。电连接缺陷检测系统包括信号提供器，通过信号线，检测模块，电极板和多个接地路径向未测试引脚提供测试信号。电极板包括检测表面，以适应被测试装置的与被测试针脚相对的表面，以使得检测模块检测与电极板，欠压引脚和信号线相关联的电容值当连接正常时大于阈值。接地路径分别连接到未被测试的引脚组之间，以进一步连接到地电位。本文还公开了电连接缺陷检测方法。

10. 发明授权

US08179143B2 Apparatus for testing printed circuit and method therefor 有权
标题翻译：印刷电路测试装置及其方法
公开(公告)号：US08179143B2
公开(公告)日：2012-05-15
申请号：US12251892
申请日：2008-10-15
申请人： Shang-Tsang Yeh , Chia-Ming Chen
发明人： Shang-Tsang Yeh , Chia-Ming Chen
IPC分类号： G01R31/08 , G01R31/28 , G01R31/04 , G01R19/00
CPC分类号： G01R31/312 , G01R31/2806 , G01R31/304 , G01R31/315
摘要： An apparatus comprises a sensor, a power supply and a measurer. The sensor is placed over the electronic component. The power supply can supply electric power to the printed circuit; thereby the printed circuit is powered on. The measurer can measure a sensing signal through the sensor when the printed circuit is powered on.
摘要翻译：一种装置包括传感器，电源和测量器。传感器放置在电子元件上。电源可以为印刷电路供电; 从而印刷电路通电。当印刷电路通电时，测量仪可以通过传感器测量感测信号。

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