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1. 发明授权

US4816897A Chrominance to luminance delay and gain measurement display 失效
标题翻译：色度到亮度延迟和增益测量显示
公开(公告)号：US4816897A
公开(公告)日：1989-03-28
申请号：US142093
申请日：1988-01-11
申请人： Tomoo Konishi
发明人： Tomoo Konishi
IPC分类号： H04N17/02 , H04N17/00
CPC分类号： H04N17/02
摘要： A chrominance to luminance gain and delay measurement display shows gain and delay inequalities due to differences between luminance and chrominance chanels of a video device as a point within a rectangular coordinate display system with respect to established tolerance limits. An appropriate test signal having bar and modulated pulse waveforms is selected from digitized video data stored in a field store acquisition memory. Luminance and chrominance arrays are derived from the modulated pulse waveform. The center points for each array are identified and displayed as a time difference between the center points along one axis of the display and as an amplitude ratio (chrominance/luminance) between the center points along an orthogonal axis of the display. The display includes a tolerance window so that an operator can readily observe whether the chrominance to luminance gain and delay is within established tolerances.
摘要翻译：对于亮度增益和延迟测量显示的色度显示出由于视频设备的亮度和色度通道之间的差异，作为直角坐标显示系统内相对于建立的公差极限的点的差异的增益和延迟不等式。从存储在现场存储获取存储器中的数字化视频数据中选择具有条形和调制脉冲波形的合适的测试信号。亮度和色度阵列源自调制脉冲波形。每个阵列的中心点被识别并显示为沿着显示器的一个轴的中心点之间的时间差，并且沿着显示器的正交轴线的中心点之间的振幅比（色度/亮度）显示。显示器包括公差窗口，使得操作者可以容易地观察到色度对亮度增益和延迟是否在建立的公差内。

2. 发明授权

US4800571A Timing jitter measurement display 失效
标题翻译：定时抖动测量显示
公开(公告)号：US4800571A
公开(公告)日：1989-01-24
申请号：US142092
申请日：1988-01-11
申请人： Tomoo Konishi
发明人： Tomoo Konishi
IPC分类号： G01R29/02 , H04N5/95 , H04N17/06 , H04B3/46
CPC分类号： H04N5/95 , H04N17/06
摘要： A timing pulse jitter measurement display suitable for observing large jitter deviations, such as those caused by head changes between fields of video data in a video tape or cassette recorder (VTR or VCR), selects a range of data samples about each timing pulse for processing. The data samples are acquired using a stable, jitter free, precision clock. Residual signals, such as residual subcarrier in a video signal, are removed from the selected data samples and a precise timing point is determined for each timing interval with respect to a stable reference point. The deviations of the timing points from a baseline, derived from the precision clock and representing the stable reference points occurring at a nominal timing interval, are displayed, and means provided for determining peak to peak jitter along any portion of the acquired set of displayed data samples. Averaging also is provided between acquisition sets of data samples to reduce noise and highlight phase errors due to some repetitive influence.
摘要翻译：适用于观察大的抖动偏差的定时脉冲抖动测量显示，例如由录像带或录像机（VTR或VCR）中的视频数据的场之间的磁头变化引起的抖动偏差，选择关于每个定时脉冲的数据采样范围，以进行处理。使用稳定，无抖动的精密时钟采集数据样本。诸如视频信号中的残余子载波的残余信号从所选择的数据样本中被去除，并且针对稳定的参考点确定每个定时间隔的精确定时点。显示从准确时钟导出的表示以标称定时间隔发生的稳定参考点的基线的定时点的偏差，以及用于根据所获取的显示数据组的任何部分确定峰 - 峰抖动的装置样品。在采集数据样本集之间提供平均，以减少噪声，并突出显示由于一些重复影响的相位误差。

3. 发明公开

US20240369625A1 METHOD FOR SEPARATING AND MODELING N-UI JITTER BASED ON SPECTRUM 审中-公开
公开(公告)号：US20240369625A1
公开(公告)日：2024-11-07
申请号：US18654577
申请日：2024-05-03
申请人： Tektronix, Inc.
发明人： Mark L. Guenther
IPC分类号： G01R31/317
CPC分类号： G01R31/31709
摘要： A method and system of separating and determining components total jitter for a signal under test includes determining a time interval error (TIE) spectrum for the signal under test. The TIE spectrum includes a plurality of frequency bins. The method identifies frequency bins in the TIE spectrum containing deterministic jitter. The method includes determining components of total jitter for the signal under test based on frequency bins in an N-UI spectrum for the signal under test corresponding to the identified frequency bins in the TIE spectrum.

4. 发明公开

US20240353491A1 OPTICAL TUNING TEST SYSTEM USING PARALLEL OVEN PIPELINES WITH PARALLEL INSTRUMENT CHANNELS AND MACHINE LEARNING ASSISTANCE 审中-公开
公开(公告)号：US20240353491A1
公开(公告)日：2024-10-24
申请号：US18756281
申请日：2024-06-27
申请人： Tektronix, Inc.
发明人： John J. Pickerd , Evan Douglas Smith
IPC分类号： G01R31/319 , G01R31/28 , G01R31/3183
CPC分类号： G01R31/31908 , G01R31/2862 , G01R31/318307 , G01R31/318371
摘要： A test system includes a test and measurement instrument, ovens to hold devices under test (DUT), each oven having an oven switch selectably connected to the DUTs, channel switches selectably connected to the oven switches and to one channel of the instrument, one or more processors to: select an oven and its oven switch, connect that oven switch to a subset of DUTs in that oven, connect the channel switches to that oven switch to receive signals from the subset of DUTs, send the signals to channels of the instrument to acquire waveforms from the subset of DUTs in parallel, and repeat connecting of the channel switches and that oven switch until the instrument has acquired waveforms from each DUT in that oven, use machine learning to tune each DUT, test whether each DUT in that oven is optimally tuned, and repeat until all DUTs have been tuned and tested.

5. 发明公开

US20240353449A1 INTERLEAVED DIGITAL TRIGGER CORRECTION 审中-公开
公开(公告)号：US20240353449A1
公开(公告)日：2024-10-24
申请号：US18641307
申请日：2024-04-19
申请人： Tektronix, Inc.
发明人： Joshua J. O'Brien
IPC分类号： G01R13/02
CPC分类号： G01R13/0254 , G01R13/029
摘要： A test and measurement instrument includes an array of data pipes, in which each of the array of data pipes further includes an input coupled to an output of an interleaved Analog-to-Digital Converter (ADC), a hysteresis processor coupled to the input to receive a present pipe data value, and coupled to another hysteresis processor in the array of data pipes to receive a previous data value and a previous data direction, the hysteresis processor structured to perform a comparison of the present pipe data value to the previous data value to determine whether a magnitude of a difference between the present pipe data value and the previous data value exceeds a hysteresis value, and a pipeline trigger comparator. Methods are also described.

6. 发明授权

US12085590B2 Swept parameter oscilloscope 有权
公开(公告)号：US12085590B2
公开(公告)日：2024-09-10
申请号：US17862293
申请日：2022-07-11
申请人： Tektronix, Inc.
发明人： John J. Pickerd , Justin E. Patterson
IPC分类号： G01R13/02 , G06T13/00 , G06F3/0482 , G06F3/04847
CPC分类号： G01R13/0218 , G01R13/0254 , G01R13/029 , G06T13/00 , G06F3/0482 , G06F3/04847 , G06T2200/24
摘要： A test and measurement instrument has a user interface configured to allow a user to provide one or more user inputs, a display to display results to the user, a memory, one or more processors configured to execute code to cause the one or more processors to receive a waveform array containing waveforms resulting from sweeping one or more parameters from a set of parameters, recover a clock signal from the waveform array, generate a waveform image for each waveform, render the waveform images into video frames to produce an image array of the video frames, select at least some of the video frames to form a video sequence, and play the video sequence on a display. A method of animating waveform data includes receiving a waveform array containing waveforms resulting from sweeping one or more parameters from a set of parameters, recovering a clock signal from the waveforms, generating a waveform image from each of the waveforms, rendering the waveform images into video frames to produce an image array of the video frames, selecting at least some of the video frames to play as a video sequence, and playing the video sequence on a display.

7. 发明公开

US20240288540A1 SELF-CALIBRATING RADAR SENSOR FOR BEAM PREDICTION DISCOVERY 审中-公开
公开(公告)号：US20240288540A1
公开(公告)日：2024-08-29
申请号：US18436661
申请日：2024-02-08
申请人： Tektronix, Inc.
发明人： Keith R. Tinsley , Sangsu Lee , Saad Mufti
IPC分类号： G01S7/40 , G01S7/295
CPC分类号： G01S7/4021 , G01S7/2955
摘要： A communication network has multiple nodes, each node having one or more antennas, one or more input ports to receive communication signals from the antenna, a memory to store data associated with the communication signals, and one or more processors to gather local data about an environment, communicate with other nodes as needed, and use the local data to determine optimized operational settings for the node. A sensor device has one or more antennas to receive communication signals from other nodes in a communication network, one or more input ports to receive the communication signals, one or more output ports to transmit communication signals, a memory to store data associated with the communication signals, and one or more processors to determine a position of the sensor, transmit signals, receive return signals, produce return signal data, and use a machine learning system on the return signal data to identify unblocked ports.

8. 发明公开

US20240283549A1 METHODS AND SYSTEMS OF PHASE ALIGNING A REPLICA CARRIER SIGNAL FOR USE IN DEMODULATING A SUBCARRIER SIGNAL 审中-公开
公开(公告)号：US20240283549A1
公开(公告)日：2024-08-22
申请号：US18444452
申请日：2024-02-16
申请人： Tektronix, Inc.
发明人： Archana I. Akkalkot , Alka Kumari , Sakchi Sinha
IPC分类号： H04B17/20 , H04B17/00 , H04B17/309
CPC分类号： H04B17/201 , H04B17/0085 , H04B17/309
摘要： A test and measurement system includes a proximity coupling device to transmit a modulated carrier signal and a proximity integrated circuit card to load modulate the transmitted modulated carrier signal and generate a modulated subcarrier signal on the wireless carrier signal. A test and measurement instrument acquires the modulated carrier signal and includes a phase-aligned subcarrier demodulator to demodulate the carrier signal including the modulated subcarrier signal. A demodulator detects commands and responses in the modulated carrier signal, removes the commands, and identifies a correlation index for each response. Each correlation index indicates a phase of the modulated carrier signal of the corresponding response relative to a replica carrier signal. The demodulator adjusts the phase of the replica carrier signal based on the correlation index for each response and down converts each response using the phase-aligned replica carrier signal. The modulated subcarrier signal is low pass filtered to demodulate response.

9. 发明公开

US20240274222A1 TECHNIQUE TO ANALYZE AND REPORT ACCURATE DATA, SYNCHRONIZING MULTIPLE SIGNALS IN A MEMORY CHIP 审中-公开
公开(公告)号：US20240274222A1
公开(公告)日：2024-08-15
申请号：US18534495
申请日：2023-12-08
申请人： Tektronix, Inc.
发明人： Swapnil Jhawar , Chandra Sekhar Kappagantu , Mahesha Guttahalli Lakshmipathy , Sriram Mandyam Krishnakumar
IPC分类号： G11C29/56
CPC分类号： G11C29/56004 , G11C29/56008 , G11C29/56016
摘要： A test and measurement system includes a multi-stack test subsystem including a plurality of test and measurement instruments, each instrument coupled to a device under test (DUT) to receive a plurality of test signals from the DUT during a test mode of operation. One test and measurement instrument is designated as a master and the remainder are designated as extension test and measurement instruments. The master communicates control signals to each of the extensions to synchronize the test and measurement instruments to simultaneously acquire the plurality of test signals provided by the DUT. An automation engine is coupled to the multi-stack test subsystem to receive the acquired plurality of test signals from the master, and the automation engine analyzes the acquired test signals to perform validation testing for each of plurality of test signals and simultaneously display results of the validation testing for the plurality of test signals.

10. 外观设计

USD1038797S1 Battery accessory for a test and measurement instrument 有权
公开(公告)号：USD1038797S1
公开(公告)日：2024-08-13
申请号：US29903039
申请日：2023-09-19
申请人： Tektronix, Inc.
设计人： Chris A. Valentine , Neil Clayton , David M. Ediger , Marc A. Gessford , Taylor S. K. Heen , Brian A. Hollenberg , Steve U. Reinhold , Prashanth Thota , Satya N. Whitlock
摘要： FIG. 1 is a top, rear, left, isometric view of a battery accessory for a test and measurement instrument showing the new design in conjunction with a typical operating environment;
FIG. 2 is a top, front, right isometric view thereof;
FIG. 3 is a rear elevational view thereof,
FIG. 4 is a right side elevational view thereof;
FIG. 5 is a left side elevational view thereof;
FIG. 6 is a top plan view thereof and,
FIG. 7 is a bottom plan view thereof.
The broken lines in the drawings depict environmental structure as well as unclaimed portions of the battery accessory for a test and measurement instrument, neither of which form any part of the claimed design.

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