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    • 2. 发明授权
    • Probe assembly for lapping a bar using a patterned probe
    • 用于使用图案化探针研磨棒的探针组件
    • US07768281B2
    • 2010-08-03
    • US12073174
    • 2008-02-29
    • Ryuji FujiiTakashi HondaHiroyasu TsuchiyaKoji Hosaka
    • Ryuji FujiiTakashi HondaHiroyasu TsuchiyaKoji Hosaka
    • G01R31/02
    • G11B5/102B24B37/005B24B37/048B24B49/16G11B5/3166G11B5/3169G11B5/3173
    • A probe assembly used to lap a bar, the bar being provided with elements that are to be formed into sliders, is provided. The probe assembly comprises an elastically deflectable probe, and a stopper for applying bending deformation to the probe so as to cause first bending deflection at a leading end of the probe and for maintaining the first bending deflection of the leading end while preventing a bending deformation at the leading end from becoming smaller than the first bending deflection. The leading end of the probe is adapted to be subjected to second bending deflection that is larger than the first bending deflection in a same direction as a direction of the first bending deflection and thereby to abut against an electrode pad to establish electrical connection between the probe and the electrode pad, the electrode pad being provided on a surface of the bar other than a surface to be lapped.
    • 提供了一种用于搭接杆的探针组件,该杆设置有要形成滑块的元件。 探针组件包括可弹性偏转的探针和用于向探针施加弯曲变形的止动件,以便在探针的前端引起第一弯曲偏转,并且用于保持前端的第一弯曲偏转,同时防止弯曲变形 前端从小于第一弯曲偏转。 探针的前端适于在与第一弯曲偏转的方向相同的方向上经受大于第一弯曲偏转的第二弯曲偏转,从而抵靠电极焊盘以在探针之间建立电连接 和电极焊盘,电极焊盘设置在除了要研磨的表面之外的杆的表面上。
    • 3. 发明申请
    • Multilayer suspension, head gimbal assembly and manufacturing method of head gimbal assembly
    • 磁头万向架悬挂,头万向架组装及头万向架组装的制造方法
    • US20030007289A1
    • 2003-01-09
    • US10229146
    • 2002-08-28
    • SAE MAGNETICS (H. K) LTD.
    • Masashi Shiraishi
    • G11B005/48
    • G11B5/4833H05K1/0393H05K1/056Y10T29/49027Y10T29/49032Y10T428/24331Y10T428/24612Y10T428/24917
    • A multilayer suspension includes a resilient bending section formed by partially removing at least part of layers of a five-layer structure which includes a first metal thin plate layer, a first resin layer laminated on the first metal thin-plate layer, a second metal thin-plate layer laminated on the first resin layer, a second resin layer laminated on the second metal thin-plate layer, and a conductive layer laminated on the second resin layer, a resilient gimbal section for mounting a head slider, formed by partially removing at least part of layers of the five-layer structure, and a rigid section for coupling the bending section and the gimbal section, formed by partially removing at least part of layers of the five-layer structure. An HGA includes thus formed multilayer suspension and a head slider mounted on the multilayer suspension and provided with at least one head element.
    • 多层悬架包括通过部分地去除五层结构的至少一部分层而形成的弹性弯曲部分,其包括第一金属薄板层,层压在第一金属薄板层上的第一树脂层,第二金属薄层 层压在第一树脂层上的第二层板,层压在第二金属薄板层上的第二树脂层和层压在第二树脂层上的导电层,弹性万向节部分,用于安装头滑块, 五层结构的至少一部分层,以及通过部分去除五层结构的至少一部分层而形成的用于联接弯曲部和万向节的刚性部分。 HGA包括如此形成的多层悬架和安装在多层悬架上并设置有至少一个头元件的头滑块。
    • 5. 发明授权
    • Systems and methods for identifying problems with PZT elements of micro-actuators
    • 用于识别微执行器的PZT元件的问题的系统和方法
    • US07768276B2
    • 2010-08-03
    • US11593169
    • 2006-11-06
    • MingGao Yao
    • MingGao Yao
    • G01R29/22G01R27/28G01R23/00
    • G11B5/5552G11B5/4826G11B5/4873G11B19/048
    • Systems and methods for identifying problems with PZT elements of micro-actuators are provided. In certain example embodiments, a voltage (e.g., a sine voltage) may be applied to a reference unit causing it as well as a test unit to vibrate. Characteristics of the respective resonances (e.g., frequency, amplitude, phase, etc.) may be compared (e.g., by a processor) to determine whether there are problems with the test unit. The reference unit may include an HGA or an HSA of a hard disk drive device. The test unit may include corresponding parts for inspection. Such techniques make it possible to detect problems with PZT elements when there is only one PZT element per micro-actuator.
    • 提供了用于识别微致动器的PZT元件的问题的系统和方法。 在某些示例性实施例中,可以将电压(例如,正弦电压)施加到参考单元,使其以及测试单元振动。 可以比较各个谐振的特性(例如,频率,振幅,相位等)(例如,通过处理器)来确定测试单元是否存在问题。 参考单元可以包括硬盘驱动器装置的HGA或HSA。 测试单元可以包括相应的检查部件。 当每个微致动器只有一个PZT元件时,这种技术使得可以检测PZT元件的问题。
    • 8. 发明授权
    • Head gimbal assembly including first and second dimples, and disk drive unit including the same
    • 头万向架组件包括第一和第二凹坑,以及包括其的磁盘驱动器单元
    • US07684157B2
    • 2010-03-23
    • US11319580
    • 2005-12-29
    • MingGao YaoMasashi ShiraishiYiRu Xie
    • MingGao YaoMasashi ShiraishiYiRu Xie
    • G11B5/56
    • G11B5/4826
    • A HGA of the present invention includes a slider; a micro-actuator comprising two thin film PZT pieces to define a notch; a suspension to load the slider and the micro-actuator. The suspension comprises: a flexure having an actuator loading portion with a slot corresponding to the notch of the micro-actuator, and a slider-loading portion to partially hold the slider; and a load beam having a first dimple to support the flexure at a position thereof corresponding to a central area of the slider, and a second dimple extending through both the slot of the flexure and the notch defined by the micro-actuator and toward an leading edge end portion of the slider to form a gap between the slider and the second dimple. The invention also discloses a disk drive unit having the improved HGA.
    • 本发明的HGA包括滑块; 微致动器包括两个薄膜PZT片,以限定切口; 悬架装载滑块和微型致动器。 悬架包括:具有致动器加载部分的弯曲部,其具有与微致动器的凹口相对应的槽,以及滑块加载部分,以部分地保持滑块; 以及负载梁,其具有第一凹坑以在其对应于所述滑块的中心区域的位置处支撑所述挠曲;以及第二凹坑,其延伸穿过所述挠曲件的所述槽和由所述微致动器限定的所述凹口,并且朝向引导 滑块的边缘端部,以在滑块和第二凹坑之间形成间隙。 本发明还公开了一种具有改进的HGA的磁盘驱动器单元。