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    • 1. 发明授权
    • Method and apparatus for measuring the level of semi-solid material
    • 用于测量半固体材料水平的方法和装置
    • US4276774A
    • 1981-07-07
    • US46785
    • 1979-06-08
    • Hugh R. McGookin
    • Hugh R. McGookin
    • G01F23/20
    • G01F23/20
    • A method and apparatus for measuring the level of containerized or free standing semi-solid material is disclosed. A substantially smooth uniform cable is suspended above and into the semi-solid material. A predetermined amount of slack is introduced into the cable. The slackened portion of the cable above the level of the semi-solid material is coupled to a weighing apparatus. The weighing apparatus weighs the slackened portion of the cable, the weight of such a portion being related to the amount of cable above the level of the material and thus an indication of the level of the material. Subsequent to a measurement, the cable is raised for uncoupling the cable from the weighing apparatus.
    • 公开了一种用于测量集装箱或自由站立半固体材料的水平的方法和装置。 将基本平滑的均匀电缆悬挂在半固体材料的上方。 预定量的松弛被引入到电缆中。 电缆在半固体材料的水平面上的松弛部分被耦合到称重装置。 称重设备称重电缆的松弛部分,这种部分的重量与电缆高度高于材料的量相关联,并因此涉及材料的水平。 在测量之后,电缆被升高以将电缆与称重装置分离。