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1. 发明授权

US11555829B2 Probe member for pogo pin, manufacturing method therefor and pogo pin comprising same 有权
公开(公告)号：US11555829B2
公开(公告)日：2023-01-17
申请号：US16627237
申请日：2018-06-22
申请人： ISC CO., LTD.
发明人： Young Bae Chung
IPC分类号： G01R1/067
摘要： The present invention relates to a probe member for a pogo pin, a method of manufacturing the probe member, and a pogo pin including the probe member. An embodiment of the present invention provides a probe member including a first body portion and a second body portion that are stacked in a height direction based on the other end of a contact portion, wherein the probe member is used in a test socket in a state in which at least a portion of the probe member is inserted in a pipe having an internal space.

2. 发明授权

US11442079B2 Contact device for electrical test 有权
公开(公告)号：US11442079B2
公开(公告)日：2022-09-13
申请号：US17132700
申请日：2020-12-23
申请人： ISC CO., LTD.
发明人： Young Bae Chung
IPC分类号： G01R1/067 , G01R1/04
摘要： The disclosure includes a contact device for electrical test, the contact device for electrical test including a second body portion, a first body portion stacked above the second body portion, a middle portion stacked above the first body portion, and having a first protrusion that is sharp and has a first apex portion, the first protrusion being formed on an upper side of the middle portion, and the first body portion, the middle portion, and the contact portion are sequentially and upwardly stacked, the middle portion and the contact portion include materials different from each other, and a first protrusion is provided inside the second protrusion.

3. 发明授权

US11073536B2 ID chip socket for test connector assembly, test connector assembly including ID chip socket, and test equipment set including test connector assembly 有权
公开(公告)号：US11073536B2
公开(公告)日：2021-07-27
申请号：US16654437
申请日：2019-10-16
申请人： ISC CO., LTD
发明人： Young Bae Chung
IPC分类号： G01R1/04 , H05K7/10 , G06F11/273 , G01R31/28 , H01R13/22 , H01R33/76 , H01R12/71
摘要： An ID chip socket according to an embodiment disclosed herein includes: a contactor configured to be fixed to an upper side of the frame; a socket-conductive part penetrating the contactor in a vertical direction and configured to enable electrical connection in the vertical direction; an ID chip fixed to an upper side of the socket-conductive part and electrically connected to the socket-conductive part; and a cover configured to cover an upper surface of the ID chip and to be fixed to at least one of the contactor and the frame.

4. 发明授权

US09696344B2 Test socket which allows for ease of alignment 有权
公开(公告)号：US09696344B2
公开(公告)日：2017-07-04
申请号：US14396250
申请日：2013-04-29
申请人： ISC CO., LTD.
发明人： Jae Hak Lee
IPC分类号： G01R31/20 , G01R1/04 , G01R31/28 , H01R12/71 , H01R12/73 , H01R13/24
CPC分类号： G01R1/0416 , G01R1/0466 , G01R1/0483 , G01R31/28 , H01R12/714 , H01R12/73 , H01R13/2414 , H01R13/2421 , H01R2201/20
摘要： The present invention relates to a test socket which allows for ease of alignment, and more particularly, to a test socket that is interposed between a device to be inspected and an inspection apparatus so as to electrically connect terminals of the device to be inspected and pads of the inspection apparatus, the test socket including: an alignment member that has a plurality of through-holes formed at points corresponding to the terminals of the device to be inspected or the pads of the inspection apparatus and is attached to the inspection apparatus such that the through-holes are located at the pads of the inspection apparatus; and an elastic conductive sheet including conductive parts that are disposed at the points corresponding to the terminals of the device to be inspected and include a plurality of conductive particles that are distributed in an insulating elastic material, insulating support parts that support the conductive parts and disconnect an electrical connection between adjacent conductive parts, and protruding conductive parts that protrude downward from the conductive parts and are inserted into the plurality of through-holes of the alignment member, wherein when the protruding conductive parts are inserted into the through-holes of the alignment member, the elastic conductive sheet is aligned in the the alignment member.

5. 发明申请

US20150355233A1 TEST SOCKET AND SOCKET BODY 审中-公开
标题翻译：测试插座和插座
公开(公告)号：US20150355233A1
公开(公告)日：2015-12-10
申请号：US14655905
申请日：2013-12-27
申请人： ISC CO., LTD
发明人： Jae Hak LEE
IPC分类号： G01R1/04 , G01R31/28
CPC分类号： G01R1/0433 , G01R1/0466 , G01R31/2886
摘要： The present invention relates to a test socket, and more specifically, to a test socket for electrically connecting a terminal of a test target device with a pad of a test device, comprising: a socket guide provided with a center hole at the center thereof so as to enable the terminal of the test target device to pass through and a guide protrusion provided to the lower surface thereof; and a socket body arranged between the socket guide and the test device, wherein the socket body comprises: a conductive region provided with a connection part arranged at a location corresponding to the terminal of the test target device so as to electrically connect the terminal of the test target device with the pad of the test device; and a supporting region for extending from a circumference of the conductive region and supporting the conductive region, and the supporting region comprises: a guide hole for receiving the guide protrusion so as to determine the location of the socket body with respect to the test device, and an elastic pressing part for elastically pressing the guide protrusion stored in the guide hole to one inner side surface of the guide hole.
摘要翻译：本发明涉及一种测试插座，更具体地说，涉及一种用于将测试目标装置的端子与测试装置的焊盘电连接的测试插座，包括：插座引导件，其中心处具有中心孔使得测试目标装置的端子能够通过，并且设置在其下表面上的引导突起; 以及布置在所述插座引导件和所述测试装置之间的插座体，其中，所述插座主体包括：导电区域，其设置有布置在与所述测试对象装置的端子对应的位置处的连接部，以将所述插座主体的端子电连接测试目标设备与测试设备的焊盘; 以及支撑区域，用于从导电区域的周边延伸并支撑导电区域，并且支撑区域包括：用于接收引导突起以便确定插座主体相对于测试装置的位置的引导孔，以及用于将存储在引导孔中的引导突起弹性地按压到引导孔的一个内侧表面的弹性按压部。

6. 发明申请

US20150153387A1 TEST SOCKET INCLUDING CONDUCTIVE PARTICLES IN WHICH THROUGH-HOLES ARE FORMED AND METHOD FOR MANUFACTURING SAME 有权
标题翻译：测试插座，包括形成通孔的导电颗粒及其制造方法
公开(公告)号：US20150153387A1
公开(公告)日：2015-06-04
申请号：US14406882
申请日：2013-06-18
申请人： ISC CO., LTD.
发明人： Jae Hak Lee
IPC分类号： G01R1/04
CPC分类号： G01R1/0433 , G01R1/0466 , G01R1/0483 , G01R1/07378 , H01R13/2414 , H01R2201/20
摘要： The present invention relates to a test socket that is disposed between a blood test device and a test apparatus to electrically connect a terminal of the blood test device and a pad of the test apparatus with each other. Conduction units that are arranged at positions corresponding to the terminal of the blood test device and show conductivity in a thickness direction have: conduction units that are arranged in such a manner that multiple conductive particles are arranged in the thickness direction in an elastic insulating material; and an insulating support unit that supports and insulates each of the conduction units. The conductive particles are provided with through-holes bored through one surface and another surface other than the one surface, and the through-holes are filled with the elastic insulating material.
摘要翻译：本发明涉及一种设置在血液检查装置和测试装置之间的测试插座，用于将血液检查装置的端子和测试装置的焊盘彼此电连接。布置在与血液检查装置的端子对应的位置并且在厚度方向上显示导电性的导电单元具有：以弹性绝缘材料在厚度方向上布置多个导电颗粒的方式布置的导电单元; 以及支撑并绝缘每个导电单元的绝缘支撑单元。导电性粒子具有通过一个表面而不是一个表面的另一个表面钻孔的通孔，并且通孔填充有弹性绝缘材料。

7. 发明申请

US20140320159A1 PROBE MEMBER FOR POGO PIN 有权
标题翻译： PROGE POGO PIN成员
公开(公告)号：US20140320159A1
公开(公告)日：2014-10-30
申请号：US14256184
申请日：2014-04-18
申请人： ISC CO., LTD.
发明人： Jae-Hak LEE
IPC分类号： G01R1/067
CPC分类号： G01R1/06722 , G01R1/06738
摘要： Provided is a probe member for a pogo pin, which is used for testing a semiconductor device, and at least a portion of which is inserted into a cylindrical body to be supported by an elastic member and an upper end of which contacts a terminal of the semiconductor device.
摘要翻译：提供了一种用于测试半导体器件的弹簧针的探针构件，并且其至少一部分插入到由弹性构件支撑的圆筒体中，并且其上端接触到半导体器件。

8. 发明授权

US08610447B2 Spring structure and test socket using thereof 有权
标题翻译：弹簧结构和使用它的测试插座
公开(公告)号：US08610447B2
公开(公告)日：2013-12-17
申请号：US13054680
申请日：2009-07-20
申请人： Jae Hak Lee
发明人： Jae Hak Lee
IPC分类号： G01R31/00
CPC分类号： G01R1/06722 , G01R1/07314 , H01R12/714 , H01R13/2421 , H01R2201/20
摘要： Spring assemblies and a test socket using the spring assemblies. The spring assemblies are used in a test socket electrically connecting lead terminals of a semiconductor chip to test terminals of a test device by contacting the lead terminals and the test terminals, and include: first springs in which a first steel wire having elasticity and conductivity is coiled in a spiral in one direction; and second springs in which a second steel wire having elasticity and conductivity is coiled in a spiral in an opposite direction to the direction in which the first springs are coiled, which have outer diameters narrower than inner diameters of the first springs, and are inserted into the first springs. Accordingly, electric resistances and inductances of two spring assemblies coiled in a spiral are reduced to improve electricity transmission characteristic. A height of a test socket is easily adjusted using spring assemblies having desired lengths. Also, since only plating is performed on the springs to form the spring assemblies, the spring assemblies are formed at a very low cost and have a wide range of applications.
摘要翻译：弹簧组件和使用弹簧组件的测试插座。弹簧组件用于通过接触引线端子和测试端子将半导体芯片的引线端子电连接到测试装置的测试端子的测试插座中，并且包括：第一弹簧，其中具有弹性和导电性的第一钢丝是沿一个方向卷成螺旋状; 以及第二弹簧，其中具有弹性和导电性的第二钢丝以与第一弹簧卷绕的方向相反的方向螺旋地螺旋形成，其外径比第一弹簧的内径窄，并且插入第一泉。因此，减小了螺旋状的两个弹簧组件的电阻和电感，以提高电力传输特性。使用具有期望长度的弹簧组件容易地调整测试插座的高度。此外，由于仅在弹簧上执行电镀以形成弹簧组件，所以弹簧组件以非常低的成本形成并且具有广泛的应用。

9. 发明授权

US11385259B2 Probe member for pogo pin, method of manufacturing the probe member, pogo pin comprising the probe member 有权
公开(公告)号：US11385259B2
公开(公告)日：2022-07-12
申请号：US16627209
申请日：2018-06-22
申请人： ISC CO., LTD.
发明人： Young Bae Chung
IPC分类号： G01R1/067 , G01R3/00
摘要： A probe member for a pogo pin, a method of manufacturing the probe member, and a pogo pin including the probe member are disclosed. The probe member for the pogo pin has a contact portion including a material having hardness greater than the hardness of a first body portion and a second body portion, and each of the first and second body portions includes a material having electrical conductivity equal to or greater than 50% IACS (International Annealed Copper Standard).

10. 发明授权

US09423419B2 Test socket including electrode supporting portion and method of manufacturing test socket 有权
标题翻译：测试插座包括电极支撑部分和制造测试插座的方法
公开(公告)号：US09423419B2
公开(公告)日：2016-08-23
申请号：US13872493
申请日：2013-04-29
申请人： ISC CO., LTD.
发明人： Jae Hak Lee
IPC分类号： G01R31/00 , G01R1/04 , G01R3/00
CPC分类号： G01R1/0408 , G01R1/0466 , G01R3/00 , Y10T29/49208
摘要： The test socket includes: an elastic conductive sheet including a conductive portion and an insulating supporting portion; a sheet type connector including an electrode portion that is disposed on the conductive portion and is formed of a metal, and a sheet member that supports the electrode portion, wherein the sheet member comprises a cut portion formed by cutting at least a portion of the sheet member between adjacent electrode portions; and an electrode supporting portion including an upper supporting portion that contacts an upper edge of the electrode portion to support the electrode portion and exposes an upper center portion of the electrode portion to be open and an electrode supporting portion including a connection supporting portion that connects the upper supporting portion and the insulating supporting portion.
摘要翻译：测试插座包括：弹性导电片，其包括导电部分和绝缘支撑部分; 片状连接器，包括设置在导电部分上并由金属形成的电极部分和支撑电极部分的片状部件，其中片状部件包括通过切割片材的至少一部分而形成的切割部分相邻电极部分之间的部件; 以及电极支撑部，其包括上部支撑部，所述上部支撑部接触所述电极部的上边缘以支撑所述电极部并且暴露所述电极部的待打开的上部中心部;以及电极支撑部，其包括连接所述电极部的连接支撑部上部支撑部分和绝缘支撑部分。

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