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    • 1. 发明授权
    • Detection apparatus
    • 检测装置
    • US08437004B2
    • 2013-05-07
    • US12908405
    • 2010-10-20
    • Yuhei SumiyoshiTakumi TokimitsuHiroyuki Yuuki
    • Yuhei SumiyoshiTakumi TokimitsuHiroyuki Yuuki
    • G01N21/55G01N21/88
    • G01N21/645G01N21/4738G01N21/55G01N2201/0631G02B27/0927G02B27/0994
    • A detection apparatus which illuminates a sample and detects light reflected by the sample, comprises a light source, a columnar reflecting member having a columnar reflecting surface which reflects light having entered a first end of the columnar reflecting member by a plurality of number of times, and emits the light from a second end of the columnar reflecting member, a mirror which reflects light radiated by the light source so as to guide to the first end and a detector, wherein the sample is illuminated with the light emitted from the second end, and the detector is configured to detect the light which has been reflected by the sample and has passed through the columnar reflecting member, and a reflecting surface of the mirror is a concave surface, and a shape of a reflecting surface of the mirror on a section perpendicular to an axis of the columnar reflecting member is concave.
    • 照射样品并检测由样品反射的光的检测装置包括光源,柱状反射部件,具有将已经进入柱状反射部件的第一端的光反射多次的柱状反射面, 并从柱状反射构件的第二端发射光,反射由光源辐射的光以引导到第一端的反射镜和检测器,其中样品被从第二端发射的光照射, 并且所述检测器被配置为检测已经被所述样品反射并且已经通过所述柱状​​反射部件的光,并且所述反射镜的反射表面是凹面,并且所述反射镜的反射面的形状在所述部分 垂直于柱状反射构件的轴线是凹的。
    • 6. 发明授权
    • Exposure apparatus
    • 曝光装置
    • US07215410B2
    • 2007-05-08
    • US11093097
    • 2005-03-28
    • Yuhei Sumiyoshi
    • Yuhei Sumiyoshi
    • G03B27/52G03B27/42
    • G03F7/70233G03F7/70341G03F7/70983
    • An exposure apparatus includes a illumination optical system for illuminating a reticle with light from a light source, and a projection optical system for projecting a pattern of the reticle onto an object, said projection optical system includes a lens closest to the object, wherein a surface on the object side of the lens is smaller than an effective area of a surface on the reticle side of the lens, and wherein said exposure apparatus exposes the object via a liquid that is filled in a space between the lens and the object.
    • 曝光装置包括用于利用来自光源的光照射掩模版的照明光学系统和用于将掩模版的图案投射到物体上的投影光学系统,所述投影光学系统包括最靠近物体的透镜,其中表面 在透镜的物体侧上的距离小于透镜的掩模版面上的表面的有效面积,并且其中所述曝光装置经由填充在透镜和物体之间的空间中的液体曝光物体。
    • 8. 发明申请
    • DETECTION APPARATUS
    • 检测装置
    • US20110109908A1
    • 2011-05-12
    • US12908405
    • 2010-10-20
    • Yuhei SumiyoshiTakumi TokimitsuHiroyuki Yuuki
    • Yuhei SumiyoshiTakumi TokimitsuHiroyuki Yuuki
    • G01N21/55
    • G01N21/645G01N21/4738G01N21/55G01N2201/0631G02B27/0927G02B27/0994
    • A detection apparatus which illuminates a sample and detects light reflected by the sample, comprises a light source, a columnar reflecting member having a columnar reflecting surface which reflects light having entered a first end of the columnar reflecting member by a plurality of number of times, and emits the light from a second end of the columnar reflecting member, a mirror which reflects light radiated by the light source so as to guide to the first end and a detector, wherein the sample is illuminated with the light emitted from the second end, and the detector is configured to detect the light which has been reflected by the sample and has passed through the columnar reflecting member, and a reflecting surface of the mirror is a concave surface, and a shape of a reflecting surface of the mirror on a section perpendicular to an axis of the columnar reflecting member is concave.
    • 照射样品并检测由样品反射的光的检测装置包括光源,柱状反射部件,具有将已经进入柱状反射部件的第一端的光反射多次的柱状反射面, 并从柱状反射构件的第二端发射光,反射由光源辐射的光以引导到第一端的反射镜和检测器,其中样品被从第二端发射的光照射, 并且所述检测器被配置为检测已经被所述样品反射并且已经通过所述柱状​​反射部件的光,并且所述反射镜的反射表面是凹面,并且所述反射镜的反射面的形状在所述部分 垂直于柱状反射构件的轴线是凹的。