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    • 1. 发明申请
    • SEMICONDUCTOR MEMORY DEVICE AND PROGRAM METHODS THEREOF
    • 半导体存储器件及其程序方法
    • US20120170373A1
    • 2012-07-05
    • US13341382
    • 2011-12-30
    • Byung Ryul KIMDuck Ju KIMYou Sung KIM
    • Byung Ryul KIMDuck Ju KIMYou Sung KIM
    • G11C16/10G11C16/06
    • G11C16/3454G11C11/5628G11C16/10
    • Programming a semiconductor memory device includes: performing a program loop using a blind program operation until the selected cell threshold voltages reach a first verification level; upon detecting a cell having the threshold voltage reaching the first verification level, verifying whether a cell having the threshold voltage reached a second verification level higher than the first verification level; upon verifying a cell having the threshold voltage reaching the second verification level, continuously performing program loops on cells having the first verification level as a target level and on cells having the second verification level as a target level; and upon verifying no cell having the threshold voltage reaching the second verification level, performing a program loop on memory cells having a target level higher than the first verification level, after programming the memory cells having the first verification level as the target level.
    • 编程半导体存储器件包括:使用盲目程序操作执行程序循环,直到所选择的单元阈值电压达到第一验证水平; 一旦检测到阈值电压达到第一验证电平的单元,则验证具有阈值电压的单元是否达到高于第一验证电平的第二验证电平; 在验证具有阈值电压达到第二验证电平的单元的情况下,对具有第一验证电平的单元作为目标电平,以及具有第二验证电平的单元作为目标电平连续执行程序循环; 并且在验证没有阈值电压达到第二验证电平的单元时,在将具有第一验证电平的存储单元编程为目标电平之后,对具有高于第一验证电平的目标电平的存储单元执行程序循环。
    • 6. 发明申请
    • NONVOLATILE MEMORY APPARATUS AND VERIFICATION METHOD THEREOF
    • 非易失存储器及其验证方法
    • US20120275222A1
    • 2012-11-01
    • US13412892
    • 2012-03-06
    • Sung Dae CHOIYou Sung KIMMin Su KIM
    • Sung Dae CHOIYou Sung KIMMin Su KIM
    • G11C16/06
    • G11C16/3459G11C16/04G11C29/52
    • A nonvolatile memory apparatus includes: a memory cell array including a plurality of unit memory cells; a page buffer unit configured to read data from a selected memory cell of the memory cell array and store the read data; a controller configured to generate a reference current generation signal, a first current control signal, and a second current control signal, which correspond to the number of fail bits to be sensed and a deviation in cell current amounts flowing through the unit memory cells during a read operation, in response to a verification command; and a fail bit sensing unit configured to receive the reference current generation signal, the first current control signal, and the second current control signal from the controller in response to the verification command, and control at least one of a reference current amount and a data read current amount of the page buffer unit.
    • 非易失性存储装置包括:包括多个单位存储单元的存储单元阵列; 页缓冲器单元,被配置为从所述存储单元阵列的选定存储单元读取数据并存储所读取的数据; 控制器,其被配置为生成参考电流产生信号,第一电流控制信号和第二电流控制信号,其对应于待感测的故障位的数量和在一个 响应于验证命令读取操作; 以及故障位感测单元,被配置为响应于所述验证​​命令从所述控制器接收所述参考电流产生信号,所述第一电流控制信号和所述第二电流控制信号,并且控制参考电流量和数据中的至少一个 读取页面缓冲单元的当前量。