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    • 3. 发明授权
    • Semiconductor storage device and mobile electronic apparatus
    • 半导体存储设备和移动电子设备
    • US07116579B2
    • 2006-10-03
    • US10851517
    • 2004-05-20
    • Yoshinao MorikawaMasaru NawakiHiroshi IwataAkihide Shibata
    • Yoshinao MorikawaMasaru NawakiHiroshi IwataAkihide Shibata
    • G11C11/34
    • G11C16/0475
    • A semiconductor storage device is provided, which comprises a memory array comprising memory elements, a write state machine for performing a sequence of a program or erase operation with respect to the memory array, a decoder for decoding a signal indicating a current state of the write state machine, which is output from the write state machine, and outputting a status signal indicating a status of the program or erase operation with respect to the memory array, a status register for storing the status signal, and an output circuit for outputting the status signal stored in the status register. Each memory element comprises a gate electrode, a channel region, diffusion regions, and memory function sections provided on opposite sides of the gate electrode and having a function of retaining charges.
    • 提供了一种半导体存储装置,其包括存储器阵列,其包括存储器元件,用于执行关于存储器阵列的编程或擦除操作序列的写入状态机,用于对指示写入的当前状态的信号进行解码的解码器 状态机,其从写入状态机输出,并且输出指示关于存储器阵列的编程或擦除操作的状态的状态信号,用于存储状态信号的状态寄存器,以及用于输出状态的输出电路 信号存储在状态寄存器中。 每个存储元件包括栅电极,沟道区,扩散区和设置在栅电极的相对侧上并具有保持电荷的功能的存储功能部。
    • 4. 发明授权
    • Electrically programmable and electrically erasable semiconductor memory device
    • 电可编程和电可擦除半导体存储器件
    • US06982906B2
    • 2006-01-03
    • US10841688
    • 2004-05-06
    • Nobuaki MatsuokaMasaru NawakiYoshinao MorikawaHiroshi IwataAkihide Shibata
    • Nobuaki MatsuokaMasaru NawakiYoshinao MorikawaHiroshi IwataAkihide Shibata
    • G11C16/06
    • H01L29/7923G11C16/3454H01L21/28282
    • A semiconductor memory device of the present invention includes an electrically programmable and erasable nonvolatile memory device which uses a plurality of memory cells requiring a first potential for reading data and a second potential for data programming, the second potential being higher than the first potential, a latch circuit for receiving data and temporarily storing the data, a pulse generator which generates a pulse used for programming data into a memory cell and is coupled in order to receive the second potential, a comparator for comparing data in the latch circuit with data in a memory cell, and a controller for controlling the pulse generator to repeatedly generate a pulse until the data in the latch circuit matches the data in the memory cell, the controller coupled to the comparator and the pulse generator. The controller controls so that the pulse is repeatedly generated until data is programmed in a memory cell. It is thereby possible to improve the speed of writing and erasing processes on a nonvolatile memory cell of the present invention and to improve reliability.
    • 本发明的半导体存储器件包括电可编程和可擦除的非易失性存储器件,其使用需要第一电位读取数据的多个存储器单元和用于数据编程的第二电位,第二电位高于第一电位,a 锁存电路,用于接收数据和临时存储数据;脉冲发生器,其生成用于将数据编程到存储器单元中并被耦合以便接收第二电位的脉冲;比较器,用于将锁存电路中的数据与 存储单元和控制器,用于控制脉冲发生器重复产生脉冲,直到锁存电路中的数据与存储单元中的数据匹配,该控制器耦合到比较器和脉冲发生器。 控制器控制,使脉冲重复生成,直到数据被编程到存储单元中。 由此,能够提高本发明的非易失性存储单元的写入和擦除处理速度,提高可靠性。
    • 5. 发明授权
    • Method of programming semiconductor memory device having memory cells and method of erasing the same
    • 具有存储单元的半导体存储器件的编程方法及其擦除方法
    • US06894929B2
    • 2005-05-17
    • US10843149
    • 2004-05-10
    • Nobuaki MatsuokaMasaru NawakiYoshinao MorikawaHiroshi IwataAkihide Shibata
    • Nobuaki MatsuokaMasaru NawakiYoshinao MorikawaHiroshi IwataAkihide Shibata
    • G11C16/02G11C16/04G11C16/12G11C16/34H01L21/8247H01L27/10H01L27/115H01L29/788H01L29/792
    • G11C16/3468
    • The present invention provides a method of programming, into a computer, a memory array having a plurality of memory cells, including a verification step 1 of verifying whether a memory cell has been already programmed or it has not been programmed yet per memory cell to be programmed, a flagging step 2 of flagging the memory cell in the case where it is verified that the memory cell has not been programmed yet in the several verifying steps, to which the memory cell is subjected thereafter, even if it is verified that the memory cell has been already programmed, a first application step 3 of applying a programming pulse having a programming level to the not-programmed memory cell without any flag, a repeat step 4 of repeating the verification step 1, the flagging step 2 and the first application step 3 until it is verified that all of the memory cells have been already programmed at least once, and a second application step 5 of applying a boost pulse having a boost programming level lower than that of the programming level to the memory cell with the flag.
    • 本发明提供了一种对计算机编程具有多个存储单元的存储器阵列的方法,所述存储器阵列包括验证步骤1,该验证步骤1验证存储器单元是否已被编程,或者每个存储器单元尚未被编程 在存储单元受此之后验证存储单元尚未被编程的几个验证步骤的情况下,标记存储单元的标记步骤2,即使确认存储器 单元已经被编程,第一应用步骤3,将没有任何标志的具有编程级别的编程脉冲施加到未编程的存储器单元;重复步骤4,重复验证步骤1,标记步骤2和第一应用 步骤3,直到验证所有存储器单元已经被编程至少一次,以及施加具有升压编程电平的升压脉冲的第二应用步骤5 比编程级别低到具有标志的存储单元。