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    • 3. 发明授权
    • Memory module and memory system
    • 内存模块和内存系统
    • US07411806B2
    • 2008-08-12
    • US11634405
    • 2006-12-06
    • Seiji FunabaYoji NishioKayoko Shibata
    • Seiji FunabaYoji NishioKayoko Shibata
    • G11C5/06G11C5/02
    • G11C5/04G11C5/063G11C7/1048G11C11/4093G11C2207/105H01L2224/16225H01L2924/15192H01L2924/15311H01L2924/19107
    • A memory module has a plurality of DRAMs (115), which share a bus line, on the front surface and the back surface of a board. The bus line is connected through a via hole (113) from a terminal (111) to one end of a strip line (112), and the other end of the strip line is connected to a strip line in the other layer through a via hole (119) provided for looping back the line. A termination resistor (120), provided near a termination voltage terminal (VTT), is connected to the looped-back strip line in the other layer through a via hole. The DRAM terminals are connected to the strip line each through a via hole. This memory module is mounted on a motherboard, on which a memory controller is provided, through a connector. The effective characteristic impedance of the bus line is matched with the characteristic impedance of the line in the motherboard.
    • 存储器模块具有在板的前表面和后表面上共享总线的多个DRAM(115)。 总线通过通孔(113)从端子(111)连接到带状线(112)的一端,并且带状线的另一端通过通孔(113)连接到另一层中的带状线 孔(119)用于使线路循环。 设置在终端电压端子(VTT)附近的终端电阻器(120)通过通孔连接到另一层中的环形带状线。 DRAM端子通过通孔连接到带状线。 该存储器模块通过连接器安装在其上提供存储器控制器的母板上。 母线的有效特性阻抗与母板线路特性阻抗匹配。
    • 5. 发明授权
    • Memory system, module and register
    • 内存系统,模块和寄存器
    • US07051225B2
    • 2006-05-23
    • US10427090
    • 2003-04-30
    • Yoji NishioKayoko ShibataSeiji Funaba
    • Yoji NishioKayoko ShibataSeiji Funaba
    • G06F1/04
    • G11C7/109G11C7/1078G11C7/1093
    • Disclosed are a memory command address system and a memory module that can be operated not only for 266 MHzCLK but also for 200 MHzCLK, in which clock timings in the input sections of a PLL, a register, and a DRAM are matched to one another, a DLL (delay locked loop) is provided in the register, the output timing of CA signal from the register is controlled so that the setup time margin and the hold time margin of the CA signal with respect to the clock signal with the additional latency in the DRAM=1.5 or 2.0 are equated to each other, such that clock operation of 266 MHz, for example, is made possible. If both 266 MHz and 200 MHz are used, by taking account of the timing budget, control is made for retarding the timing of the CA signal input to the flip-flop which receives an internal clock signal (intCLK) supplied to the flip-flop for determining the CA signal output timing from the register. Alternatively, control is made for switching between the replica (replical) provided in the register and an output unit associated with the replica, depending on the frequency being used, so as to cope with both frequencies simply by providing one sort of the module and one sort of the register.
    • 公开了一种存储器命令地址系统和存储器模块,其不仅可以用于266MHzCLK,而且可以用于200MHzCLK,其中PLL,寄存器和DRAM的输入部分中的时钟定时彼此匹配, 在寄存器中提供DLL(延迟锁定环),控制来自寄存器的CA信号的输出定时,使得CA信号的建立时间余量和保持时间裕度相对于时钟信号具有额外的等待时间 DRAM = 1.5或2.0彼此相等,使得例如266MHz的时钟操作成为可能。 如果使用266MHz和200MHz,通过考虑时序预算,进行控制以延迟输入到触发器的CA信号的定时,该触发器接收提供给触发器的内部时钟信号(intCLK) 用于确定来自寄存器的CA信号输出定时。 或者,根据所使用的频率,进行控制以在寄存器中提供的副本(复制)和与副本相关联的输出单元之间进行切换,从而简单地通过提供一种模块和一个模块来处理两个频率 排序的注册表。
    • 6. 发明申请
    • Memory module and memory system
    • 内存模块和内存系统
    • US20070081376A1
    • 2007-04-12
    • US11634405
    • 2006-12-06
    • Seiji FunabaYoji NishioKayoko Shibata
    • Seiji FunabaYoji NishioKayoko Shibata
    • G11C5/06
    • G11C5/04G11C5/063G11C7/1048G11C11/4093G11C2207/105H01L2224/16225H01L2924/15192H01L2924/15311H01L2924/19107
    • A memory module has a plurality of DRAMs (115), which share a bus line, on the front surface and the back surface of a board. The bus line is connected through a via hole (113) from a terminal (111) to one end of a strip line (112), and the other end of the strip line is connected to a strip line in the other layer through a via hole (119) provided for looping back the line. A termination resistor (120), provided near a termination voltage terminal (VTT), is connected to the looped-back strip line in the other layer through a via hole. The DRAM terminals are connected to the strip line each through a via hole. This memory module is mounted on a motherboard, on which a memory controller is provided, through a connector. The effective characteristic impedance of the bus line is matched with the characteristic impedance of the line in the motherboard.
    • 存储器模块具有在板的前表面和后表面上共享总线的多个DRAM(115)。 总线通过通孔(113)从端子(111)连接到带状线(112)的一端,并且带状线的另一端通过通孔(113)连接到另一层中的带状线 孔(119)用于使线路循环。 设置在终端电压端子(VTT)附近的终端电阻器(120)通过通孔连接到另一层中的环形带状线。 DRAM端子通过通孔连接到带状线。 该存储器模块通过连接器安装在其上提供存储器控制器的母板上。 母线的有效特性阻抗与母板线路特性阻抗匹配。
    • 7. 发明授权
    • Memory module and memory system suitable for high speed operation
    • 内存模块和内存系统适合高速运行
    • US07016212B2
    • 2006-03-21
    • US10630457
    • 2003-07-29
    • Kayoko ShibataYoji NishioSeiji Funaba
    • Kayoko ShibataYoji NishioSeiji Funaba
    • G11C5/06
    • H05K1/0246H05K2201/10022H05K2201/10159
    • A memory module comprises a stab resistor between a pin and one end of a bus. A plurality of memory chips is connected to the bus between both ends thereof. A terminating resistor is connected to the other end of the bus. Stab resistance Rs of the stab resistor and terminating resistance Rterm of the terminating resistor are given by: Rs=(N−1)×Zeffdimm/N, and Rterm=Zeffdimm where N represents the number of the memory modules in a memory system; and Zeffdimm, effective impedance of a memory chip arrangement portion consisting of the bus and the memory chips. In the memory system, the memory modules are connected to a memory controller on a motherboard in a stab connection style. Wiring impedance Zmb of the motherboard is given by: Zmb=(2N−1)×Zeffdimm/N2.
    • 存储器模块包括在引脚和总线的一端之间的尖端电阻器。 多个存储器芯片在其两端之间连接到总线。 终端电阻连接到总线的另一端。 尖端电阻的阻抗Rs和终端电阻的终端电阻Rterm由下式给出:<?in-line-formula description =“In-line Formulas”end =“lead”?> Rs =(N-1)xZeffdimm / N和<?in-line-formula description =“In-line Formulas”end =“tail”?> <?in-line-formula description =“In-line Formulas”end =“lead”?> Rterm = Zeffdimm <?in-line-formula description =“在线公式”end =“tail”?>其中N表示存储器系统中的存储器模块的数量; 和Zeffdimm,由总线和存储器芯片组成的存储芯片布置部分的有效阻抗。 在存储器系统中,存储器模块以连接方式连接到主板上的存储器控​​制器。 主板的接线阻抗Zmb由下式给出:<?in-line-formula description =“In-line formula”end =“lead”?> Zmb =(2N-1)xZeffdimm / N < 。<?in-line-formula description =“In-line Formulas”end =“tail”?>
    • 8. 发明授权
    • Memory module
    • 内存模块
    • US06661092B2
    • 2003-12-09
    • US10205040
    • 2002-07-25
    • Kayoko ShibataYoji Nishio
    • Kayoko ShibataYoji Nishio
    • H01L2334
    • G11C5/147H01L2924/0002H01L2924/00
    • A memory module is provided with a resistor serving as an impedance adjuster which is connected directly or indirectly to an output terminal of an output transistor of a C/A register. The resistor adjusts the output impedance of the C/A register viewed from an input terminal of a C/A bus in such a manner that the output impedance becomes substantially constant within an operating voltage range of an internal signal output from the C/A register. The memory module is further provided with a capacitor serving as a rise time/fall time adjuster which adjusts rise time and fall time of the internal signal to specific values such that satisfactory waveforms are obtained.
    • 存储器模块设置有用作阻抗调节器的电阻器,其直接或间接地连接到C / A寄存器的输出晶体管的输出端子。 该电阻调节从C / A总线的输入端子观察的C / A寄存器的输出阻抗,使得输出阻抗在从C / A寄存器输出的内部信号的工作电压范围内变得基本恒定 。 存储器模块还具有用作上升时间/下降时间调节器的电容器,其将内部信号的上升时间和下降时间调整到特定值,从而获得令人满意的波形。