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    • 3. 发明授权
    • Method for reducing dielectric overetch using a dielectric etch stop at a planar surface
    • 在平坦表面使用电介质蚀刻停止来减少介电过程的方法
    • US07422985B2
    • 2008-09-09
    • US11090526
    • 2005-03-25
    • Samuel V DuntonChristopher J PettiUsha Raghuram
    • Samuel V DuntonChristopher J PettiUsha Raghuram
    • H01L21/302
    • H01L27/1021H01L21/76802H01L21/76829Y10S438/90
    • A substantially planar surface coexposes conductive or semiconductor features and a dielectric etch stop material. In a preferred embodiment, the conductive or semiconductor features are pillars forming vertically oriented diodes. A second dielectric material, different from the dielectric etch stop material, is deposited on the substantially planar surface. A selective etch etches a hole or trench in the second dielectric material, so that the etch stops on the conductive or semiconductor feature and the dielectric etch stop material. In a preferred embodiment the substantially planar surface is formed by filling gaps between the conductive or semiconductor features with a first dielectric such as oxide, recessing the oxide, filling with a second dielectric such as nitride, then planarizing to coexpose the nitride and the conductive or semiconductor features.
    • 基本平坦的表面共同导电或半导体特征和介电蚀刻停止材料。 在优选实施例中,导电或半导体特征是形成垂直取向的二极管的柱。 不同于介电蚀刻停止材料的第二电介质材料沉积在基本平坦的表面上。 选择性蚀刻蚀刻第二介电材料中的孔或沟槽,使得蚀刻停止在导电或半导体特征和电介质蚀刻停止材料上。 在优选实施例中,通过将导电或半导体特征之间的间隙填充到诸如氧化物的第一电介质,使氧化物凹陷,用第二电介质(例如氮化物)填充,然后平坦化以共存氮化物和导电或 半导体功能。
    • 5. 发明授权
    • Zener diode within a diode structure providing shunt protection
    • 二极管结构内的齐纳二极管提供分流保护
    • US08536448B2
    • 2013-09-17
    • US13020849
    • 2011-02-04
    • Christopher J Petti
    • Christopher J Petti
    • H01L31/00
    • H01L27/1421H01L31/0747H01L31/1892Y02E10/50
    • A structure to provide a Zener diode to avoid shunt formation is disclosed. An undoped or lightly doped monocrystalline thin semiconductor lamina is cleaved from a donor body which is not permanently affixed to a support element. The lamina may be annealed at high temperature to remove damage from a prior implant. At least one aperture is formed through the lamina, either due to flaws in the cleaving process, or intentionally following cleaving. Heavily doped amorphous silicon layers having opposite conductivity types are deposited on opposite faces of the lamina, one forming the emitter and one a base contact to a photovoltaic cell, while the lamina forms the base of the cell. The heavily doped layers contact in the aperture, forming a Zener diode. This Zener diode prevents formation of shunts, and may behave as a bypass diode if the cell is placed under heavy reverse bias, as when one cell in a series string is shaded while the rest of the string is exposed to sun.
    • 公开了提供齐纳二极管以避免分流形成的结构。 未掺杂或轻掺杂的单晶薄半导体层从不永久地固定到支撑元件的施主体断开。 层可以在高温下退火以去除以前的植入物的损伤。 由于切割过程中的缺陷,或者故意在切割之后,至少一个孔通过层形成。 具有相反导电类型的重掺杂非晶硅层沉积在层的相对表面上,一个形成发射极,另一个与光伏电池的基极接触,而薄层形成电池的基极。 重掺杂层在孔中接触,形成齐纳二极管。 该齐纳二极管防止分流器的形成,并且如果电池放置在较强的反向偏压下,则可能表现为旁路二极管,如串联串中的一个电池阴影而串的其余部分暴露在阳光下时。
    • 7. 发明授权
    • Non-volatile memory arrays comprising rail stacks with a shared diode component portion for diodes of electrically isolated pillars
    • 非易失性存储器阵列包括具有用于电隔离柱的二极管的共享二极管组件部分的轨道堆叠
    • US08748859B2
    • 2014-06-10
    • US13441805
    • 2012-04-06
    • Kang-Jay HsiaChristopher J PettiCalvin K Li
    • Kang-Jay HsiaChristopher J PettiCalvin K Li
    • H01L29/02
    • H01L27/1021
    • An integrated circuit including vertically oriented diode structures between conductors and methods of fabricating the same are provided. Two-terminal devices such as passive element memory cells can include a diode steering element in series with an antifuse and/or other state change element. The devices are formed using pillar structures at the intersections of upper and lower sets of conductors. The height of the pillar structures are reduced by forming part of the diode for each pillar in a rail stack with one of the conductors. A diode in one embodiment can include a first diode component of a first conductivity type and a second diode component of a second conductivity type. A portion of one of the diode components is divided into first and second portions with one on the portions being formed in the rail stack where it is shared with other diodes formed using pillars at the rail stack.
    • 提供了一种在导体之间包括垂直取向的二极管结构的集成电路及其制造方法。 诸如无源元件存储单元的两端器件可以包括与反熔丝和/或其他状态改变元件串联的二极管操作元件。 这些装置在上下导体组的交点处使用支柱结构形成。 通过在轨道堆叠中的每个支柱的一个导体上形成二极管的一部分来减小柱结构的高度。 一个实施例中的二极管可以包括第一导电类型的第一二极管部件和第二导电类型的第二二极管部件。 二极管部件之一的一部分被分成第一和第二部分,其中一部分形成在轨道堆叠中,其中与在轨道堆叠处使用柱形成的其他二极管共用。
    • 9. 发明授权
    • Forming complimentary metal features using conformal insulator layer
    • 使用保形绝缘层形成互补的金属特征
    • US07927990B2
    • 2011-04-19
    • US11771137
    • 2007-06-29
    • Kang-Jay HsiaCalvin K LiChristopher J Petti
    • Kang-Jay HsiaCalvin K LiChristopher J Petti
    • H01L21/20
    • H01L21/76838H01L21/76834H01L27/1021
    • A method is provided to form densely spaced metal lines. A first set of metal lines is formed by etching a first metal layer. A thin dielectric layer is conformally deposited on the first metal lines. A second metal is deposited on the thin dielectric layer, filling gaps between the first metal lines. The second metal layer is planarized to form second metal lines interposed between the first metal lines, coexposing the thin dielectric layer and the second metal layer at a substantially planar surface. In some embodiments, planarization continues to remove the thin dielectric covering tops of the first metal lines, coexposing the first metal lines and the second metal lines, separated by the thin dielectric layer, at a substantially planar surface.
    • 提供了一种形成密集间隔的金属线的方法。 通过蚀刻第一金属层形成第一组金属线。 平坦地沉积在第一金属线上的薄介电层。 第二金属沉积在薄介电层上,填充第一金属线之间的间隙。 第二金属层被平坦化以形成插入在第一金属线之间的第二金属线,在基本上平坦的表面处共存薄介电层和第二金属层。 在一些实施例中,平面化继续移除第一金属线的薄电介质覆盖顶部,在基本上平坦的表面处将第一金属线和由薄介电层隔开的第二金属线并入。