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1. 发明授权

US06265253B1 Aluminum disposable spacer to reduce mask count in CMOS transistor formation 有权
标题翻译：铝一次性间隔物，以减少CMOS晶体管形成中的掩模数量
公开(公告)号：US06265253B1
公开(公告)日：2001-07-24
申请号：US09305098
申请日：1999-05-05
申请人： Todd Lukanc , Matthew S. Buynoski , Zicheng Gary Ling
发明人： Todd Lukanc , Matthew S. Buynoski , Zicheng Gary Ling
IPC分类号： H01L218238
CPC分类号： H01L21/823864
摘要： Semiconductor devices of different conductivity types with optimized junction locations are formed on a semiconductor substrate using a minimal number of critical masks. Embodiments include forming conductive gates on the main surface of the semiconductor substrate, sidewall spacers on side surfaces of the gates, and aluminum disposable spacers on the sidewall spacers. A photoresist mask is then formed on gates and portions of the main surface intended to be implanted with impurities of a first conductivity type. Moderate or heavy source/drain implants of a second impurity type are then formed in the substrate, the aluminum disposable spacers on the sidewall spacers on the unmasked gates removed, and lightly or moderately doped source/drain extension implants of the second impurity type formed in the substrate. The first mask is then removed and a second photoresist mask is formed on the previously uncovered gates and implanted portions of the main surface. Moderate or heavy source/drain implants with impurities of the first conductivity type are then formed, the remaining aluminum disposable spacers removed, and lightly or moderately doped source/drain extension implants of the first conductivity type formed. By using aluminum disposable spacers, which can be easily formed and removed without damage to other structures on the substrate, the critical masking steps for source/drain ion implantation are reduced to two, thereby reducing production costs and increasing manufacturing throughput. By employing sidewall spacers, impurities are prevented from being implanted at the edges of the gates. Thus, when source/drain junctions are formed, as by heating and diffusing the implanted impurities, they are advantageously located proximal to the gate edges, and not under the gates, thereby improving device performance.
摘要翻译：具有优化的连接位置的不同导电类型的半导体器件使用最少数量的临界掩模形成在半导体衬底上。实施例包括在半导体衬底的主表面上形成导电栅极，在栅极的侧表面上的侧壁间隔物和侧壁间隔物上的铝一次性间隔物。然后在主要表面的浇口和部分上形成光致抗蚀剂掩模，以便植入第一导电类型的杂质。然后在衬底中形成第二杂质类型的中等或重的源/漏植入物，去除未屏蔽的栅极上的侧壁间隔物上的铝一次性间隔物，并且形成第二杂质类型的轻或中等掺杂的源极/漏极延伸植入物底物。然后去除第一掩模，并且在主表面的先前未覆盖的浇口和注入部分上形成第二光致抗蚀剂掩模。然后形成具有第一导电类型的杂质的中等或重的源极/漏极植入物，去除剩余的铝一次性间隔物，并形成第一导电类型的轻度或中度掺杂的源极/漏极延伸植入物。通过使用可以容易地形成和去除的铝一次性间隔件，而不损坏衬底上的其它结构，源/漏离子注入的关键掩蔽步骤减少到两个，从而降低生产成本并提高制造生产量。通过使用侧壁间隔物，防止杂质被植入门的边缘。因此，当形成源极/漏极结时，通过加热和扩散植入的杂质，它们有利地位于栅极边缘附近，而不在栅极下方，从而提高器件性能。

2. 发明授权

US06221706B1 Aluminum disposable spacer to reduce mask count in CMOS transistor formation 失效
标题翻译：铝一次性间隔物，以减少CMOS晶体管形成中的掩模数量
公开(公告)号：US06221706B1
公开(公告)日：2001-04-24
申请号：US09268713
申请日：1999-03-17
申请人： Todd Lukanc , Raymond T. Lee , Zicheng Gary Ling , Matthew S. Buynoski
发明人： Todd Lukanc , Raymond T. Lee , Zicheng Gary Ling , Matthew S. Buynoski
IPC分类号： H01L218238
CPC分类号： H01L21/823864
摘要： MOS semiconductor devices of different conductivity types are formed on a semiconductor substrate using a minimal number of critical masks. Embodiments include forming conductive gates on the main surface of the semiconductor substrate, and disposable aluminum sidewall spacers on the side surfaces of the gates. A photoresist mask is then formed on gates and portions of the main surface intended to be implanted with impurities of a first conductivity type. Moderate or heavy source/drain implants of a second impurity type are then formed in the substrate, the aluminum sidewall spacers on the unmasked gates are then removed, and lightly or moderately doped source/drain extension implants of the second impurity type are formed in the substrate. The first mask is then removed and a second photoresist mask is formed on the previously uncovered gates and implanted portions of the main surface. Moderate or heavy source/drain implants with impurities of the first conductivity type are then formed, the remaining aluminum sidewall spacers are removed, and lightly or moderately doped source/drain extension implants of the first conductivity type formed. By using disposable aluminum sidewall spacers, which can be easily formed and removed without damage to other structures on the substrate or to the substrate silicon, the critical masking steps for source/drain ion implantation can be reduced to two, thereby reducing production costs and increasing manufacturing throughput.
摘要翻译：使用最少数量的临界掩模，在半导体衬底上形成不同导电类型的MOS半导体器件。实施例包括在半导体衬底的主表面上形成导电栅极和在栅极的侧表面上的一次性铝侧壁间隔物。然后在主要表面的浇口和部分上形成光致抗蚀剂掩模，以便植入第一导电类型的杂质。然后在衬底中形成第二杂质类型的中等或重的源/漏植入物，然后去除未屏蔽的栅极上的铝侧壁间隔物，并且在第二杂质类型中形成轻度或中度掺杂的第二杂质类型的源极/漏极延伸植入物基质。然后去除第一掩模，并且在主表面的先前未覆盖的浇口和注入部分上形成第二光致抗蚀剂掩模。然后形成具有第一导电类型的杂质的中等或重的源/漏植入物，除去剩余的铝侧壁间隔物，形成第一导电类型的轻度或中度掺杂的源极/漏极延伸植入物。通过使用可以容易地形成和去除而不损坏衬底或衬底硅上的其它结构的一次性铝侧壁间隔物，用于源/漏离子注入的关键掩蔽步骤可以减少到两个，从而降低生产成本并增加制造吞吐量。

3. 发明授权

US6103563A Nitride disposable spacer to reduce mask count in CMOS transistor formation 有权
标题翻译：氮化物一次性间隔物，以减少CMOS晶体管形成中的掩模数
公开(公告)号：US6103563A
公开(公告)日：2000-08-15
申请号：US271290
申请日：1999-03-17
申请人： Todd Lukanc , Raymond T. Lee , Zicheng Gary Ling
发明人： Todd Lukanc , Raymond T. Lee , Zicheng Gary Ling
IPC分类号： H01L21/8238
CPC分类号： H01L21/823864
摘要： Semiconductor devices of different conductivity types are formed on a semiconductor substrate using a minimal number of critical masks. Embodiments include forming conductive gates on the main surface of the semiconductor substrate, and disposable nitride spacers on the sidewalls of the gates. A photoresist mask is then formed on gates and portions of the main surface intended to be implanted with impurities of a first conductivity type. Moderate or heavy source/drain implants of a second impurity type are then formed in the substrate, the disposable spacers on the unmasked gates are then removed, and lightly or moderately doped source/drain extension implants of the second impurity type are formed in the substrate. The first mask is then removed and a second photoresist mask is formed on the previously uncovered gates and implanted portions of the main surface. Moderate or heavy source/drain implants with impurities of the first conductivity type are then formed, the remaining disposable spacers are removed, and lightly or moderately doped source/drain extension implants of the first conductivity type formed. By using disposable spacers, the critical masking steps for source/drain ion implantation can be reduced to two, thereby reducing production costs and increasing manufacturing throughput.
摘要翻译：使用最少数量的临界掩模，在半导体衬底上形成不同导电类型的半导体器件。实施例包括在半导体衬底的主表面上形成导电栅极，以及在栅极的侧壁上形成一次性氮化物间隔物。然后在主要表面的浇口和部分上形成光致抗蚀剂掩模，以便植入第一导电类型的杂质。然后在衬底中形成第二杂质类型的中等或重的源/漏植入物，然后去除未屏蔽的栅极上的一次性间隔物，并且在衬底中形成第二杂质类型的轻度或中等掺杂的源极/漏极延伸植入物。然后去除第一掩模，并且在主表面的先前未覆盖的浇口和注入部分上形成第二光致抗蚀剂掩模。然后形成具有第一导电类型的杂质的中等或重的源极/漏极植入物，剩余的一次性间隔物被去除，并形成第一导电类型的轻度或中等掺杂的源极/漏极延伸植入物。通过使用一次性间隔件，用于源/漏离子注入的关键掩蔽步骤可以减少到两个，从而降低生产成本并提高制造生产能力。

4. 发明授权

US06218224B1 Nitride disposable spacer to reduce mask count in CMOS transistor formation 有权
标题翻译：通过使用氮化物一次性间隔物来形成CMOS以减少掩模计数的方法
公开(公告)号：US06218224B1
公开(公告)日：2001-04-17
申请号：US09276725
申请日：1999-03-26
申请人： Todd Lukanc , Raymond T. Lee , Zicheng Gary Ling
发明人： Todd Lukanc , Raymond T. Lee , Zicheng Gary Ling
IPC分类号： H01L218238
CPC分类号： H01L21/823864
摘要： Semiconductor devices of different conductivity types with optimized junction locations are formed on a semiconductor substrate using a minimal number of critical masks. Embodiments include forming conductive gates on the main surface of the semiconductor substrate, sidewall spacers on side surfaces of the gates, and nitride disposable spacers on the sidewall spacers. A photoresist mask is then formed on gates and portions of the main surface intended to be implanted with impurities of a first conductivity type. Moderate or heavy source/drain implants of a second impurity type are then formed in the substrate, the nitride disposable spacers on the sidewall spacers on the unmasked gates removed, and lightly or moderately doped source/drain extension implants of the second impurity type formed in the substrate. The first mask is then removed and a second photoresist mask is formed on the previously uncovered gates and implanted portions of the main surface. Moderate or heavy source/drain implants with impurities of the first conductivity type are then formed, the remaining nitride disposable spacers removed, and lightly or moderately doped source/drain extension implants of the first conductivity type formed. By using nitride disposable spacers, the critical masking steps for source/drain ion implantation are reduced to two, thereby reducing production costs and increasing manufacturing throughput. By employing sidewall spacers, impurities are prevented from being implanted at the edges of the gates. Thus, when source/drain junctions are formed, as by heating and diffusing the implanted impurities, they are advantageously located proximal to the gate edges, and not under the gates, thereby improving device performance.
摘要翻译：具有优化的连接位置的不同导电类型的半导体器件使用最少数量的临界掩模形成在半导体衬底上。实施例包括在半导体衬底的主表面上形成导电栅极，在栅极侧表面上的侧壁间隔物和侧壁间隔物上的氮化物一次性间隔物。然后在主要表面的浇口和部分上形成光致抗蚀剂掩模，以便植入第一导电类型的杂质。然后在衬底中形成第二杂质类型的中等或重的源极/漏极注入，去除未屏蔽的栅极上的侧壁间隔物上的氮化物一次性间隔物，并且形成第二杂质类型的轻或中等掺杂的源极/漏极延伸植入物底物。然后去除第一掩模，并且在主表面的先前未覆盖的浇口和注入部分上形成第二光致抗蚀剂掩模。然后形成具有第一导电类型的杂质的中等或重的源极/漏极植入物，去除剩余的氮化物一次性间隔物，并形成第一导电类型的轻微或中等掺杂的源极/漏极延伸植入物。通过使用氮化物一次性间隔件，用于源极/漏极离子注入的关键掩模步骤减少到两个，从而降低生产成本并提高制造生产能力。通过使用侧壁间隔物，防止杂质被植入门的边缘。因此，当形成源极/漏极结时，通过加热和扩散植入的杂质，它们有利地位于栅极边缘附近，而不在栅极下方，从而提高器件性能。

5. 发明授权

US06479350B1 Reduced masking step CMOS transistor formation using removable amorphous silicon sidewall spacers 失效
标题翻译：减少屏蔽步骤使用可移动的非晶硅侧壁间隔物形成CMOS晶体管
公开(公告)号：US06479350B1
公开(公告)日：2002-11-12
申请号：US09639814
申请日：2000-08-17
申请人： Zicheng Gary Ling , Todd Lukanc , Raymond T. Lee
发明人： Zicheng Gary Ling , Todd Lukanc , Raymond T. Lee
IPC分类号： H01L21336
CPC分类号： H01L29/6653 , H01L21/823814 , H01L21/823864
摘要： CMOS semiconductor devices comprising MOS transistors of different channel conductivity type are formed in or on a common semiconductor substrate using a minimum number of critical masks. Embodiments include forming conductive gate/insulator layer stacks on spaced-apart, different conductivity portions of the main surface of the substrate, forming etch-resistant inner sidewall spacers on side surfaces of the layer stacks, and forming easily etched, amorphous semiconductor disposable outer sidewall spacers on the inner sidewall spacers. The use of disposable outer sidewall spacers allows heavy and light source/drain implantations of opposite conductivity type to be performed for forming PMOS and NMOS transistors with the use of only two critical masks, thereby reducing production cost and duration, while increasing manufacturing throughput.
摘要翻译：包含不同沟道导电类型的MOS晶体管的CMOS半导体器件使用最少数量的临界掩模形成在公共半导体衬底中或上。实施例包括在衬底的主表面的间隔开的不同导电部分上形成导电栅极/绝缘体层堆叠，在层堆叠的侧表面上形成耐腐蚀的内侧壁间隔物，以及形成容易蚀刻的非晶半导体一次性外侧壁内侧壁间隔件上的间隔件。使用一次性外侧壁间隔件可以实现相反导电类型的重和光源/漏极注入，以便仅使用两个临界掩模来形成PMOS和NMOS晶体管，从而降低生产成本和持续时间，同时提高制造吞吐量。

6. 发明授权

US6153455A Method of fabricating ultra shallow junction CMOS transistors with nitride disposable spacer 有权
公开(公告)号：US6153455A
公开(公告)日：2000-11-28
申请号：US170619
申请日：1998-10-13
申请人： Zicheng Gary Ling , James Chiang
发明人： Zicheng Gary Ling , James Chiang
IPC分类号： H01L21/336 , H01L21/8238 , H01L21/334 , H01L21/335 , H01L21/8232
CPC分类号： H01L21/823864 , H01L29/6659
摘要： A method of developing a transistor, such as a complimentary MOS (CMOS) transistor, that includes lightly doped drain (LDD) regions which uses disposable spacers, and includes the step of adding an oxide spacer etch after a disposable nitride spacer removal and between source/drain implant and LDD implant. Because of this additional step, an ultra shallow LDD implant can be achieved. Moreover, uniformity of the depth of the junction is improved as the non-uniformity of the screen/liner oxide is eliminated.

7. 发明授权

US06868537B1 Method of generating an IC mask using a reduced database 有权
标题翻译：使用简化数据库生成IC掩模的方法
公开(公告)号：US06868537B1
公开(公告)日：2005-03-15
申请号：US10082991
申请日：2002-02-25
申请人： Jonathan J. Ho , Xin X. Wu , Zicheng Gary Ling , Jan L. de Jong
发明人： Jonathan J. Ho , Xin X. Wu , Zicheng Gary Ling , Jan L. de Jong
IPC分类号： G03F1/14 , G06F17/50
CPC分类号： G03F1/36 , G03F1/68 , G06F17/5068 , G06F2217/12
摘要： For IC devices that have repeating structures, a method of generating a database for making a mask layer starts with a hierarchical database describing at least one repeating element in the layer, a skeleton that surrounds the repeating elements, and instructions as to where to locate the repeating elements within the skeleton. This database is modified to generate a database that has optical proximity correction (OPC) for diffraction of light that will pass through the mask and expose photoresist on the IC layer. The optical-proximity corrected mask database is fractured by a mask house using instructions on how the modified data base will be divided to form repeating elements that are still identical after OPC, a mask skeleton that includes non-repeating elements, and instructions for placement of the repeating elements in the skeleton. Thus the resulting mask database is smaller than a mask database that includes all copies of repeating elements.
摘要翻译：对于具有重复结构的IC设备，生成用于制作掩模层的数据库的方法从描述层中的至少一个重复元素的分层数据库开始，围绕重复元素的骨架以及关于在哪里定位的指令重复骨骼内的元素。该数据库被修改以产生具有光学邻近校正（OPC）的数据库，用于衍射通过掩模并在IC层上曝光光致抗蚀剂的光的衍射。使用关于如何将经修改的数据库分割以形成在OPC之后仍然相同的重复元素的指令，包含非重复元素的掩码框架以及用于放置骨骼中的重复元素。因此，所得到的掩码数据库小于包含所有重复元素副本的掩码数据库。

8. 发明授权

US06551870B1 Method of fabricating ultra shallow junction CMOS transistors with nitride disposable spacer 失效
标题翻译：制造具有氮化物一次性间隔物的超浅结CMOS晶体管的方法
公开(公告)号：US06551870B1
公开(公告)日：2003-04-22
申请号：US09686352
申请日：2000-10-10
申请人： Zicheng Gary Ling , James Chiang
发明人： Zicheng Gary Ling , James Chiang
IPC分类号： H01L218238
CPC分类号： H01L21/823864 , H01L29/6659
摘要： A method of developing a transistor, such as a complimentary MOS (CMOS) transistor, that includes lightly doped drain (LDD) regions which uses disposable spacers, and includes the step of adding an oxide spacer etch after a disposable nitride spacer removal and between source/drain implant and LDD implant. Because of this additional step, an ultra shallow LDD implant can be achieved. Moreover, uniformity of the depth of the junction is improved as the non-uniformity of the screen/liner oxide is eliminated.
摘要翻译：一种开发诸如补偿MOS（CMOS）晶体管的晶体管的方法，其包括使用一次性间隔物的轻掺杂漏极（LDD）区域，并且包括在一次性氮化物间隔物去除之后和在源极之间添加氧化物间隔物蚀刻的步骤漏极植入和LDD植入。由于这个附加步骤，可以实现超浅LDD植入。此外，由于屏幕/衬垫氧化物的不均匀性被消除，结点深度的均匀性得到改善。

9. 发明授权

US06287904B1 Two step mask process to eliminate gate end cap shortening 有权
标题翻译：两步掩模过程，以消除门帽缩短
公开(公告)号：US06287904B1
公开(公告)日：2001-09-11
申请号：US09499047
申请日：2000-02-07
申请人： Raymond T. Lee , Zicheng Gary Ling
发明人： Raymond T. Lee , Zicheng Gary Ling
IPC分类号： H01L21336
CPC分类号： H01L29/4238 , H01L21/28123
摘要： Metal oxide semiconductor devices are formed having gates with minimum endcap width and no source/drain leakage. A pair of source/drain regions is formed in a substrate, and a gate oxide is formed on the substrate. A layer of a conductive material, such as polysilicon, is formed on the gate oxide layer, masked and etched to form an extended-width gate having endcaps of a greater width than the endcap design rules. A second mask is formed to cover the extended-width gate up to the desired width of the endcaps (i.e., the design width) and to expose the portions of the extended-width gate beyond the endcap design width. The exposed portions of the extended-width gate are then etched, resulting in a completed gate having endcaps of the design width. Since the endcaps are initially formed to a greater width than the design width, any pullback that occurs during printing of the mask or etching of the gate does not cause the gate to be insufficiently wide to avoid source/drain leakage. Since the excess endcap material is removed, adjacent features and/or devices can be densely spaced on the substrate.
摘要翻译：金属氧化物半导体器件形成为具有最小端盖宽度且没有源漏漏极的栅极。在衬底中形成一对源极/漏极区，并且在衬底上形成栅极氧化物。在栅极氧化物层上形成诸如多晶硅的导电材料层，被掩模和蚀刻以形成具有比端盖设计规则更大宽度的端盖的延伸宽度门。形成第二掩模以将延伸宽度的栅极覆盖直到端盖的期望宽度（即，设计宽度），并且将扩展宽度栅极的部分暴露超过端盖设计宽度。然后对扩展宽度栅极的暴露部分进行蚀刻，得到具有设计宽度的端盖的完成的栅极。由于端盖最初形成为比设计宽度更大的宽度，所以在印刷掩模或蚀刻栅极期间发生的任何回退都不会导致栅极不够宽以避免源/漏泄漏。由于去除多余的端盖材料，相邻的特征和/或器件可以在基底上密集地间隔开。

10. 发明授权

US06784685B2 Testing vias and contacts in an integrated circuit 有权
标题翻译：在集成电路中测试通孔和触点
公开(公告)号：US06784685B2
公开(公告)日：2004-08-31
申请号：US10264207
申请日：2002-10-03
申请人： Tai-An Chao , Zicheng Gary Ling , Shihcheng Hsueh
发明人： Tai-An Chao , Zicheng Gary Ling , Shihcheng Hsueh
IPC分类号： G01R3102
CPC分类号： H01L22/34 , G01R31/2884 , H01L2924/0002 , H01L2924/00
摘要： A test arrangement is designed to test whether one in a chain of vias or contacts has abnormally high resistance. The arrangement contains a plurality of via or contact chains and a plurality of decoders. The chains are switchably connected to a resistance measurement device. Each decoder has a unique address such that it will generate a control signal when a predetermined address is address thereon. The control signal is used to close a switch, which connect one of the chains to the resistance measurement device. By sequentially applying different addresses to the decoders, the resistance of the chains can be individually measured.
摘要翻译：测试装置被设计用于测试通孔或接触链中的一个是否具有异常高的电阻。该装置包括多个通孔或接触链和多个解码器。链可切换地连接到电阻测量装置。每个解码器具有唯一的地址，使得当预定地址是地址时，它将产生控制信号。控制信号用于关闭开关，将开关连接到电阻测量装置。通过对解码器顺序地应用不同的地址，可以单独地测量链的电阻。

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