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1. 发明申请

US20120140890A1 X-RAY DIFFRACTION APPARATUS AND X-RAY DIFFRACTION MEASUREMENT METHOD 有权
标题翻译： X射线衍射装置和X射线衍射测量方法
公开(公告)号：US20120140890A1
公开(公告)日：2012-06-07
申请号：US13311228
申请日：2011-12-05
申请人： Tetsuya Ozawa , Ryuji Matsuo , Katsuhiko Inaba
发明人： Tetsuya Ozawa , Ryuji Matsuo , Katsuhiko Inaba
IPC分类号： G01N23/207 , G01N23/20
CPC分类号： G01N23/207
摘要： There is provided an X-ray diffraction apparatus comprising an X-ray topography device for providing a spatial geometric correspondence to an X-ray exiting from a planar region of a sample to detect the X-ray as a planar X-ray topograph, and outputting the X-ray topograph as a signal; a two-dimensional imaging device for receiving a light-image of the planar region of the sample and outputting the light-image as a signal specified by planar positional information; and a video-synthesizing arithmetic control device for generating synthesized video data on the basis of an output signal from the X-ray topograph and an output signal from the imaging device.
摘要翻译：提供一种X射线衍射装置，其包括用于对从样品的平面区域出射的X射线提供空间几何对应关系以检测X射线作为平面X射线显微照片的X射线形貌装置，以及输出X射线拓扑图作为信号; 二维成像装置，用于接收样品的平面区域的光图像并输出作为由平面位置信息指定的信号的光图像; 以及视频合成算术控制装置，用于根据来自X射线显微图的输出信号和来自成像装置的输出信号产生合成的视频数据。

2. 发明授权

US07684543B2 X-ray beam conditioning device and X-ray analysis apparatus 有权
标题翻译： X射线束调理装置和X射线分析装置
公开(公告)号：US07684543B2
公开(公告)日：2010-03-23
申请号：US11476888
申请日：2006-06-29
申请人： Ryuji Matsuo , Tetsuya Ozawa , Katsuhiko Inaba , Makoto Aoyagi
发明人： Ryuji Matsuo , Tetsuya Ozawa , Katsuhiko Inaba , Makoto Aoyagi
IPC分类号： G21K1/06
CPC分类号： G01N23/00 , G21K1/06 , G21K2201/062
摘要： An X-ray beam conditioning device that has a crystal holder and a motor is provided. The crystal holder supports a first crystal block and a second crystal block, each of which diffracts X-ray by a specific diffraction angle. The motor can rotate the crystal holder around an axis extending at right angles to a plane including an optical axis of X-ray and can fixedly support the crystal holder at the rotated position. The crystal holder holds the first and second crystal blocks at such angles to each other such that both crystal blocks diffract X-ray. The optical axes of the two crystal blocks can be adjusted by rotating the crystal holder about the axis, that is, the only one axis.
摘要翻译：提供具有晶体保持器和电动机的X射线束调节装置。晶体保持器支撑第一晶体块和第二晶体块，每个晶体块通过特定的衍射角衍射X射线。马达可以使晶体夹持器围绕包括X射线的光轴的平面成直角延伸的轴旋转，并且能够将晶体保持器固定在旋转位置。晶体保持器以彼此相等的角度保持第一和第二晶体块，使得两个晶体块衍射X射线。两个晶体块的光轴可以通过围绕轴线旋转晶体夹持器来调整，也就是说，只有一个轴。

3. 发明授权

US09074992B2 X-ray diffraction apparatus and X-ray diffraction measurement method 有权
$X-ray diffraction apparatus and X-ray diffraction measurement method$
标题翻译： X射线衍射装置和X射线衍射测定法
公开(公告)号：US09074992B2
公开(公告)日：2015-07-07
申请号：US13311228
申请日：2011-12-05
申请人： Tetsuya Ozawa , Ryuji Matsuo , Katsuhiko Inaba
发明人： Tetsuya Ozawa , Ryuji Matsuo , Katsuhiko Inaba
IPC分类号： G01N23/207 , G01N23/20
CPC分类号： G01N23/207
摘要： There is provided an X-ray diffraction apparatus comprising an X-ray topography device for providing a spatial geometric correspondence to an X-ray exiting from a planar region of a sample to detect the X-ray as a planar X-ray topograph, and outputting the X-ray topograph as a signal; a two-dimensional imaging device for receiving a light-image of the planar region of the sample and outputting the light-image as a signal specified by planar positional information; and a video-synthesizing arithmetic control device for generating synthesized video data on the basis of an output signal from the X-ray topograph and an output signal from the imaging device.
摘要翻译：提供一种X射线衍射装置，其包括用于对从样品的平面区域出射的X射线提供空间几何对应关系以检测X射线作为平面X射线显微照片的X射线形貌装置，以及输出X射线拓扑图作为信号; 二维成像装置，用于接收样品的平面区域的光图像并输出作为由平面位置信息指定的信号的光图像; 以及视频合成算术控制装置，用于根据来自X射线显微镜的输出信号和来自成像装置的输出信号产生合成的视频数据。

4. 发明申请

US20070003013A1 X-ray beam conditioning device and X-ray analysis apparatus 有权
标题翻译： X射线束调理装置和X射线分析装置
公开(公告)号：US20070003013A1
公开(公告)日：2007-01-04
申请号：US11476888
申请日：2006-06-29
申请人： Ryuji Matsuo , Tetsuya Ozawa , Katsuhiko Inaba , Makoto Aoyagi
发明人： Ryuji Matsuo , Tetsuya Ozawa , Katsuhiko Inaba , Makoto Aoyagi
IPC分类号： G21K1/06
CPC分类号： G01N23/00 , G21K1/06 , G21K2201/062
摘要： Described herein is an X-ray beam conditioning device that has a crystal holder and a motor. The crystal holder supports a first crystal block and a second crystal block, each of which diffracts X-ray by a specific diffraction angle. The motor can rotate the crystal holder around an axis extending at right angles to a plane including an optical axis of X-ray and can support the crystal holder and fixedly supporting the crystal holder at thus rotated position. The crystal holder holds the first and second crystal blocks at such angles to each other that both crystal blocks diffract X-ray. The optical axes of the two crystal blocks can be adjusted, merely by rotating the crystal holder about said axis, namely only one axis.
摘要翻译：这里描述的是具有晶体保持器和电动机的X射线束调节装置。晶体保持器支撑第一晶体块和第二晶体块，每个晶体块通过特定的衍射角衍射X射线。电机可以使晶体保持器围绕包括X射线的光轴的平面成直角延伸的轴线旋转，并且可以支撑晶体支架并将晶体支架固定地支撑在旋转位置。晶体保持器以彼此相等的角度保持第一和第二晶体块，两个晶体块衍射X射线。只有通过使晶体保持器围绕所述轴线旋转，即只有一个轴，可以调节两个晶体块的光轴。

5. 发明授权

US06999557B2 Method of setting measuring range of reciprocal-space mapping 有权
标题翻译：设置互余空间映射测量范围的方法
公开(公告)号：US06999557B2
公开(公告)日：2006-02-14
申请号：US10854563
申请日：2004-05-25
申请人： Susumu Yamaguchi , Tetsuya Ozawa , Katsuhiko Inaba , Ryuji Matsuo
发明人： Susumu Yamaguchi , Tetsuya Ozawa , Katsuhiko Inaba , Ryuji Matsuo
IPC分类号： G01N23/20
CPC分类号： G01N23/20
摘要： Reciprocal-space mapping measurement of X-ray diffraction requires setting of the measuring range of 2θ/ω and setting of the measuring range of ω. When the measuring range of ω is designated in absolute angle, the absolute-angle-designated range is converted into a relative-angle-designated range to be acquired; preventing setting of a warped measuring region. When the measuring range of ω is designated in relative angle, it is acquired as it is. For the measuring range of 2θ/ω, any one of the absolute-angle-designated range and the relative-angle-designated range may be acquired.
摘要翻译： X射线衍射的互惠空间映射测量需要设置2θ/Ω的测量范围，并设置Ω的测量范围。当以绝对角度指定ω的测量范围时，将绝对角度指定范围转换为要获取的相对角指定范围; 防止翘曲测量区域的设置。当以相对角度指定ω的测量范围时，它被原样获取。对于2θ/ω的测量范围，可以获取绝对角度指定范围和相对角度指定范围中的任何一个。

6. 发明授权

US09336917B2 X-ray apparatus, method of using the same and X-ray irradiation method 有权
标题翻译： X射线装置，使用该方法和X射线照射方法
公开(公告)号：US09336917B2
公开(公告)日：2016-05-10
申请号：US13142787
申请日：2010-06-30
申请人： Tetsuya Ozawa , Ryuji Matsuo , Licai Jiang , Boris Verman , Kazuhiko Omote
发明人： Tetsuya Ozawa , Ryuji Matsuo , Licai Jiang , Boris Verman , Kazuhiko Omote
IPC分类号： G21K1/06 , G01J3/12 , B82Y10/00
CPC分类号： G21K1/06 , B82Y10/00 , G01J3/12 , G21K1/062 , G21K2201/064 , H01J2237/1205 , H01J2237/1516
摘要： An X-ray apparatus that creates a virtual source having a narrow energy bandwidth and enables a high-resolution X-ray diffraction measurement; a method of using the same; and an X-ray irradiation method are provided. An X-ray apparatus 100 includes a monochromator 105 that focuses a divergent X-ray beam while dispersing it and a selection part 107 that is installed in a condensing position of the condensed X-ray beam for selecting an X-ray beam having a wavelength in a specific range, allowing it to pass through, and creating a virtual source. With this arrangement, it is possible to create a virtual source having a narrow energy bandwidth at a focal point 110 and by means of the virtual source a high-resolution X-ray diffraction measurement is available. By using the X-ray apparatus 100, it is possible to sufficiently separate an X-ray beam having such an extremely narrow energy bandwidth as, for example, Kα1 ray from Kα2 ray. In addition, it is also possible to cut out part of continuous X-ray beams to create a virtual source.
摘要翻译：一种X射线装置，其产生具有窄能带宽的虚拟光源，并能进行高分辨率X射线衍射测量; 使用该方法的方法; 并提供X射线照射方法。 X射线装置100包括：单色器105，其分散发散的X射线束;以及选择部107，其安装在聚光的X射线束的聚光位置，用于选择具有波长的X射线在一个特定的范围内，允许它通过，并创建一个虚拟源。利用这种布置，可以在焦点110处创建具有窄能带宽的虚拟源，并且借助于虚拟源，可以获得高分辨率X射线衍射测量。通过使用X射线装置100，能够从Kα2射线充分地分离具有例如Kα1射线的极窄能量带宽的X射线束。此外，还可以切出部分连续X射线束以创建虚拟源。

7. 发明授权

US07860217B2 X-ray diffraction measuring apparatus having debye-scherrer optical system therein, and an X-ray diffraction measuring method for the same 有权
$X-ray diffraction measuring apparatus having debye-scherrer optical system therein, and an X-ray diffraction measuring method for the same$
标题翻译：其中具有德拜勒光学系统的X射线衍射测量装置及其X射线衍射测量方法
公开(公告)号：US07860217B2
公开(公告)日：2010-12-28
申请号：US12238471
申请日：2008-09-26
申请人： Tetsuya Ozawa , Ryuji Matsuo , Go Fujinawa , Akira Echizenya
发明人： Tetsuya Ozawa , Ryuji Matsuo , Go Fujinawa , Akira Echizenya
IPC分类号： G01N23/207
CPC分类号： G01N23/20
摘要： An X-ray diffraction measuring apparatus equipped with Debye-Scherrer optical system therein, comprises a generator for generating a characteristic X-ray to be irradiated upon a sample to be measured; an X-ray detector being disposed to surround that sample around; and a focusing arrangement, being disposed between the sample and the X-ray detector, for collecting an X-ray scattering from the sample covering over a predetermined angle, in a peripheral direction, around the sample, and for focusing and irradiating it upon the X-ray detector.
摘要翻译：在其中配备有德拜舍勒光学系统的X射线衍射测量装置包括用于产生待照射待测样品的特征X射线的发生器; 设置为围绕该样本的X射线检测器; 以及配置在样品和X射线检测器之间的聚焦装置，用于在样品周围沿周向收集来自样品覆盖物的X射线散射预定角度，并且用于聚焦并将其照射在 X射线探测器。

8. 发明申请

US20090086910A1 X-Ray Diffraction Measuring Apparatus Having Debye-Scherrer Optical System Therein, and an X-ray Diffraction Measuring Method for the Same 有权
$X-Ray Diffraction Measuring Apparatus Having Debye-Scherrer Optical System Therein, and an X-ray Diffraction Measuring Method for the Same$
标题翻译：其中具有德拜舍勒光学系统的X射线衍射测量装置及其相同的X射线衍射测量方法
公开(公告)号：US20090086910A1
公开(公告)日：2009-04-02
申请号：US12238471
申请日：2008-09-26
申请人： Tetsuya Ozawa , Ryuji Matsuo , Go Fujinawa , Akira Echizenya
发明人： Tetsuya Ozawa , Ryuji Matsuo , Go Fujinawa , Akira Echizenya
IPC分类号： G01N23/20
CPC分类号： G01N23/20
摘要： An X-ray diffraction measuring apparatus equipped with Debye-Scherrer optical system therein, comprises a means for generating a characteristic X-ray to be irradiated upon a sample to be measured; an X-ray detector means being disposed to surround that sample around; and a focusing means, being disposed between the sample and the X-ray detector means, for collecting an X-ray scattering from the sample covering over a predetermined angle, in a peripheral direction, around the sample, and thereby irradiating it upon the X-ray detector means.
摘要翻译：在其中配备有德拜 - 谢勒光学系统的X射线衍射测量装置包括用于产生待照射待测样品的特征X射线的装置; 被设置为围绕该样本的X射线检测器装置; 以及聚焦装置，设置在样品和X射线检测器装置之间，用于在样品周围沿周向收集来自样品覆盖物的X射线散射预定角度，从而将其照射在X上射线检测装置。

9. 发明申请

US20110268252A1 X-RAY APPARATUS, METHOD OF USING THE SAME AND X-RAY IRRADIATION METHOD 有权
标题翻译： X射线装置，其使用方法和X射线辐照方法
公开(公告)号：US20110268252A1
公开(公告)日：2011-11-03
申请号：US13142787
申请日：2010-06-30
申请人： Tetsuya Ozawa , Ryuji Matsuo , Licai Jiang , Boris Verman , Kazuhiko Omote
发明人： Tetsuya Ozawa , Ryuji Matsuo , Licai Jiang , Boris Verman , Kazuhiko Omote
IPC分类号： G01T1/36
CPC分类号： G21K1/06 , B82Y10/00 , G01J3/12 , G21K1/062 , G21K2201/064 , H01J2237/1205 , H01J2237/1516
摘要： An X-ray apparatus that creates a virtual source having a narrow energy bandwidth and enables a high-resolution X-ray diffraction measurement; a method of using the same; and an X-ray irradiation method are provided.An X-ray apparatus 100 includes a spectrometer 105 that focuses a divergent X-ray beam while dispersing it and a selection part 107 that is installed in a condensing position of the condensed X-ray beam for selecting an X-ray beam having a wavelength in a specific range, allowing it to pass through, and creating a virtual source. With this arrangement, it is possible to create a virtual source having a narrow energy bandwidth at a focal point 110 and by means of the virtual source a high-resolution X-ray diffraction measurement is available. By using the X-ray apparatus 100, it is possible to sufficiently separate an X-ray beam having such an extremely narrow energy bandwidth as, for example, Kα1 ray from Kα2 ray. In addition, it is also possible to cut out part of continuous X-ray beams to create a virtual source.
摘要翻译：一种X射线装置，其产生具有窄能带宽的虚拟光源，并能进行高分辨率X射线衍射测量; 使用该方法的方法; 并提供X射线照射方法。 X射线装置100包括分光器105，其分散发散的X射线束;以及选择部107，其安装在聚光X射线束的聚光位置，用于选择具有波长的X射线束在一个特定的范围内，允许它通过，并创建一个虚拟源。利用这种布置，可以在焦点110处创建具有窄能带宽的虚拟源，并且借助于虚拟源，可以获得高分辨率X射线衍射测量。通过使用X射线装置100，能够从Kα2射线充分地分离具有例如Kα1射线的极窄能量带宽的X射线束。此外，还可以切出部分连续X射线束以创建虚拟源。

10. 发明申请

US20120280759A1 OSCILLATOR 有权
标题翻译：振荡器
公开(公告)号：US20120280759A1
公开(公告)日：2012-11-08
申请号：US13520814
申请日：2011-06-10
申请人： Takuya Kojo , Kenji Moriguchi , Ryuji Matsuo , Tetsuya Hanaki
发明人： Takuya Kojo , Kenji Moriguchi , Ryuji Matsuo , Tetsuya Hanaki
IPC分类号： H03B5/32
CPC分类号： H03H9/1021 , H01L23/055 , H01L2224/16225 , H03H9/0542
摘要： There are disposed a sealing member, a pair of electrode pads to electrically couple a piezoelectric resonator, a plurality of connection pads to electrically couple an integrated circuit element and the piezoelectric resonator, and wiring patterns to establish electrical continuity between the pair of electrode pads and the plurality of connection pads, and the piezoelectric resonator and the integrated circuit element are disposed side by side in plan view. An output wiring pattern establishes electrical continuity between one of the connection pads and an alternating current output terminal of an oscillation circuit, and a power source wiring pattern establishes electrical continuity between one of the connection pads and a direct current power source terminal of the oscillation circuit. The electrode pads are disposed closer to the power source wiring pattern than the output wiring pattern.
摘要翻译：设置密封构件，一对电极焊盘以电耦合压电谐振器，多个连接焊盘以电耦合集成电路元件和压电谐振器，以及布线图案以在一对电极焊盘和多个连接焊盘以及压电谐振器和集成电路元件在平面图中并排布置。输出布线图形在一个连接焊盘和振荡电路的交流输出端之间建立电连续性，并且电源布线图形在一个连接焊盘和振荡电路的直流电源端之间建立电连续性。电极焊盘配置为比输出配线图形更靠近电源布线图案。

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