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    • 3. 发明申请
    • ILLUMINATION OPTICAL SYSTEM, ILLUMINATION OPTICAL APPARATUS, EXPOSURE APPARATUS, AND DEVICE MANUFACTURING METHOD
    • 照明光学系统,照明光学装置,曝光装置和装置制造方法
    • US20090040493A1
    • 2009-02-12
    • US12170236
    • 2008-07-09
    • Hideki Komatsuda
    • Hideki Komatsuda
    • G03B27/54
    • G03F7/702
    • An illumination optical apparatus includes a light source, which supplies illumination light including a wavelength of 5 nm to 50 nm, and an illumination optical system, which guides the illumination light to an illuminated surface. The illumination optical system includes an aperture angle restriction member and a condenser optical system, which is arranged in an optical path between the aperture restriction member and the illuminated surface to guide light beam from the aperture angle restriction member to the illuminated surface. A rotation axis of an arcuate-shape of an illumination region formed on the illuminated surface is located outside an opening of the aperture angle restriction member. The condenser optical system includes a plurality of reflection surfaces. Among the plurality of reflection surfaces, the reflection surface closest to the illuminated surface along the optical path includes a concave shape. When, for example, applied to an EUVL exposure apparatus, the illumination optical apparatus illuminates a reflective mask, serving as the illumination plane, without a plane mirror in the optical path between the illumination optical system and the mask.
    • 照明光学装置包括提供包括5nm至50nm的波长的照明光的光源和将照明光引导到照明表面的照明光学系统。 照明光学系统包括孔径限制构件和聚光镜系统,其设置在孔径限制构件和被照射表面之间的光路中,以将来自孔径角度限制构件的光束引导到被照射的表面。 形成在被照射面上的照明区域的弧形的旋转轴位于孔径角限制部件的开口的外侧。 聚光镜系统包括多个反射面。 在多个反射面中,沿着光路最靠近被照射面的反射面包括凹形。 例如,当EUVL曝光装置被应用时,照明光学装置在照明光学系统和掩模之间的光路中照射作为照明平面的反射掩模,而没有平面镜。
    • 4. 发明授权
    • Projection optical system, exposure apparatus, and exposure method
    • 投影光学系统,曝光装置和曝光方法
    • US07483122B2
    • 2009-01-27
    • US11984192
    • 2007-11-14
    • Hideki KomatsudaTomowaki TakahashiMasayuki Suzuki
    • Hideki KomatsudaTomowaki TakahashiMasayuki Suzuki
    • G03B27/72G03B27/54
    • G03F7/7025G02B17/0657G03F7/70233
    • A projection optical system is a catoptric system in which a field of view region and an imaging region are located spaced from an optical axis, in which a numerical aperture of light reaching each point on an image plane is substantially uniform regardless of an image height and a direction. An aperture stop for defining the numerical aperture of the projection optical system is provided, and the aperture stop is provided with an aperture portion in a predetermined shape in which the numerical aperture of light reaching each point within a predetermined region is substantially uniform over the predetermined region, that is, in a shape in which dimensions concerning two directions perpendicular to each other are different from each other. A predetermined shape of the aperture portion is defined so as to compensate for the effect of non-uniformity of the numerical aperture of light reaching each point within a predetermined region due to a partial optical system arranged between the aperture stop and an image plane not satisfying a desired projective relationship.
    • 投影光学系统是其中视野区域和成像区域与光轴间隔开的反射系统,其中到达图像平面上的每个点的光的数值孔径与图像高度无关,并且 一个方向 提供用于限定投影光学系统的数值孔径的孔径光阑,并且孔径光阑设置有预定形状的开口部分,其中到达预定区域内的各点的光的数值孔径在预定的范围内基本均匀 即相对于彼此垂直的两个方向的尺寸彼此不同的形状。 限定孔径部分的预定形状,以补偿由于设置在孔径光阑和不能满足的光阑的图像之间的部分光学系统而在预定区域内到达各点的光的数值孔径的不均匀性的影响 期望的投射关系。
    • 5. 发明申请
    • Exposure apparatus, exposure method, and method for producing device
    • 曝光装置,曝光方法和制造装置的方法
    • US20070242249A1
    • 2007-10-18
    • US11712957
    • 2007-03-02
    • Yuichi ShibazakiHideki Komatsuda
    • Yuichi ShibazakiHideki Komatsuda
    • G03B27/52
    • G03B27/52G03F7/70466
    • The present invention provides an exposure method which illuminates each of patterns, to be subjected to double exposure, on entire surfaces thereof in optimal illumination conditions respectively, and which performs the exposure with high throughput. Upon transferring a pattern of a reticle onto a wafer by the scanning exposure method, first and second pattern areas are formed in advance on the reticle to be adjacent in the scanning direction, and when the first and second pattern areas simultaneously pass across a field of a projection optical system, the first pattern area is illuminated in a first illumination condition by using a first illumination slit of which width in the scanning direction is gradually narrowed, and the second pattern area is illuminated in a second illumination condition by using a second illumination slit of which width in the scanning direction is gradually widened, to thereby expose the wafer.
    • 本发明提供了一种曝光方法,其分别在最佳照明条件下照亮其整个表面上的每个图案,进行双重曝光,并以高生产量进行曝光。 在通过扫描曝光方法将掩模版图案转印到晶片上之后,预先在掩模版上形成第一和第二图案区域,以在扫描方向上相邻,并且当第一和第二图案区域同时穿过 投影光学系统,通过使用其中扫描方向宽度逐渐变窄的第一照明狭缝,在第一照明条件下照亮第一图案区域,并且通过使用第二照明在第二照明条件下照亮第二图案区域 在扫描方向上的宽度的狭缝逐渐变宽,从而使晶片露出。
    • 6. 发明授权
    • Exposure system and exposure method
    • 曝光系统和曝光方法
    • US07023523B2
    • 2006-04-04
    • US11177141
    • 2005-07-07
    • Hideki Komatsuda
    • Hideki Komatsuda
    • G03B27/42
    • G03F7/70066G03F7/702G03F7/70283G03F7/70358
    • Exposure systems are disclosed having a configuration in which a field stop is positioned in proximity to a reflection-type mask, but that satisfactorily minimize adverse effects on the image-forming performance of the projection-optical system. The systems transfer a mask pattern accurately and with high throughput onto a photosensitive substrate. The system comprises an illumination-optical system (1, 2) that illuminates a reflection-type mask (M) on which is formed a prescribed pattern. A projection-optical system forms an image of the mask pattern on the photosensitive substrate (W). The mask and substrate are moved in a prescribed direction relative to the projection-optical system to project the mask pattern onto and expose the photosensitive substrate. The illumination-optical system has a field stop (19), positioned in proximity to the mask, that defines the illumination area on the mask. The interval between the mask and the field stop satisfies a prescribed conditional relation.
    • 曝光系统具有这样的结构,其中场挡板位于反射型掩模附近,但令人满意地最小化对投影光学系统的图像形成性能的不利影响。 系统将掩模图案精确地传送到感光基片上。 该系统包括照射形成规定图案的反射型掩模(M)的照明光学系统(1,2)。 投影光学系统在感光基板(W)上形成掩模图案的图像。 掩模和基板相对于投影光学系统在规定的方向上移动,以将掩模图案投射到曝光光敏基片上。 照明光学系统具有位于掩模附近的场停止件(19),其限定掩模上的照明区域。 掩模和场停止之间的间隔满足规定的条件关系。
    • 7. 发明申请
    • Exposure system and exposure method
    • 曝光系统和曝光方法
    • US20050264789A1
    • 2005-12-01
    • US11177141
    • 2005-07-07
    • Hideki Komatsuda
    • Hideki Komatsuda
    • G03F7/20G03B27/54
    • G03F7/70066G03F7/702G03F7/70283G03F7/70358
    • Exposure systems are disclosed having a configuration in which a field stop is positioned in proximity to a reflection-type mask, but that satisfactorily minimize adverse effects on the image-forming performance of the projection-optical system. The systems transfer a mask pattern accurately and with high throughput onto a photosensitive substrate. The system comprises an illumination-optical system (1, 2) that illuminates a reflection-type mask (M) on which is formed a prescribed pattern. A projection-optical system forms an image of the mask pattern on the photosensitive substrate (W). The mask and substrate are moved in a prescribed direction relative to the projection-optical system to project the mask pattern onto and expose the photosensitive substrate. The illumination-optical system has a field stop (19), positioned in proximity to the mask, that defines the illumination area on the mask. The interval between the mask and the field stop satisfies a prescribed conditional relation.
    • 曝光系统具有这样的结构,其中场挡板位于反射型掩模附近,但令人满意地最小化对投影光学系统的图像形成性能的不利影响。 系统将掩模图案精确地传送到感光基片上。 该系统包括照射形成规定图案的反射型掩模(M)的照明光学系统(1,2)。 投影光学系统在感光基板(W)上形成掩模图案的图像。 掩模和基板相对于投影光学系统在规定的方向上移动,以将掩模图案投射到曝光光敏基片上。 照明光学系统具有位于掩模附近的场停止件(19),其限定掩模上的照明区域。 掩模和场停止之间的间隔满足规定的条件关系。
    • 10. 发明授权
    • Illumination optical apparatus, exposure apparatus, and device manufacturing method
    • 照明光学装置,曝光装置和装置的制造方法
    • US08780328B2
    • 2014-07-15
    • US12703270
    • 2010-02-10
    • Hideki Komatsuda
    • Hideki Komatsuda
    • G03B27/54G03B27/42G03F7/20
    • G03F7/70066G03F7/702G03F7/70233
    • There is disclosed a illumination optical apparatus for illuminating a second surface optically conjugate with a first surface via a reflection type original plate which can be arranged on the first surface, the illumination optical apparatus comprising: a first partial field stop arranged to define a first outer edge of a illumination region which is to be formed on the second surface, in order to limit a light beam traveling toward the first surface; and a second partial field stop arranged to define a second outer edge of the illumination region, in order to limit a light beam reflecting from the reflection type original plate which can be arranged on the first surface, wherein a first distance between the first partial field stop and the first surface is set to be larger than a second distance between the second partial field stop and the first surface.
    • 公开了一种照明光学装置,用于通过能够布置在第一表面上的反射型原版照射与第一表面光学共轭的第二表面,该照明光学装置包括:第一局部场停止件,其被布置为限定第一外部 要形成在第二表面上的照明区域的边缘,以便限制朝向第一表面行进的光束; 以及第二局部场阻挡器,其布置成限定所述照明区域的第二外边缘,以便限制从可布置在所述第一表面上的所述反射型原版反射的光束,其中所述第一部分场 并且所述第一表面被设定为大于所述第二局部位置挡块与所述第一表面之间的第二距离。