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    • 4. 发明授权
    • Plasma chemical vapor deposition device capable of suppressing
generation of polysilane powder
    • 能够抑制聚硅烷粉末产生的等离子体化学气相沉积装置
    • US5487786A
    • 1996-01-30
    • US363226
    • 1994-12-22
    • Atsushi ChidaHitoshio SannomiyaKatsuhiko NomotoHiroshi OkamotoYoshihiro Yamamoto
    • Atsushi ChidaHitoshio SannomiyaKatsuhiko NomotoHiroshi OkamotoYoshihiro Yamamoto
    • H01L21/205C23C16/44C23C16/509H01L31/04C23C16/00
    • C23C16/4401C23C16/5096H01J37/32724
    • There is provided a plasma CVD device which can deposit a high-quality a-Si:H or other film at a high rate, and which can improve production efficiency thereof remarkably. The CVD device has a substrate holding electrode and a high frequency application electrode arranged opposite to and parallel to a substrate held by the substrate holding electrode. A material gas introduced between the substrate holding electrode and the high frequency application electrode is decomposed by glow discharge, so that a thin film is deposited on the heated substrate. A first electrode heater for heating a peripheral portion of the high frequency application electrode is installed along the peripheral portion of the high frequency application electrode. A second electrode heater for heating the peripheral portion of the high frequency application electrode and a surface of the high frequency application electrode opposite to its surface facing the substrate is composed of a bottom portion and a side portion provided uprightly along a peripheral edge of the bottom portion and formed in a concave shape to surround the high frequency application electrode with a spacing therebetween.
    • 提供了能够以高速率沉积高质量的a-Si:H或其它膜的等离子体CVD装置,并且可以显着提高其生产效率。 CVD装置具有基板保持电极和与由基板保持电极保持的基板相对并平行的高频施加电极。 在基板保持电极和高频施加电极之间引入的原料气体通过辉光放电分解,使得在被加热的基板上沉积薄膜。 用于加热高频施加电极的周边部分的第一电极加热器沿着高频施加电极的周边部分安装。 用于加热高频施加电极的周边部分的第二电极加热器和与其面向基板的表面相对的高频施加电极的表面由底部和沿着底部的周边垂直设置的侧部分组成 并且形成为凹形,以围绕高频施加电极间隔开。
    • 6. 发明授权
    • Silicon-based thin-film photoelectric conversion device and method of manufacturing thereof
    • 硅系薄膜光电转换装置及其制造方法
    • US06979589B2
    • 2005-12-27
    • US10942958
    • 2004-09-17
    • Katsushi KishimotoYusuke FukuokaKatsuhiko Nomoto
    • Katsushi KishimotoYusuke FukuokaKatsuhiko Nomoto
    • H01L31/04H01L21/00H01L31/075H01L31/18
    • H01L31/077H01L31/1824Y02E10/545Y02P70/521
    • An excellent silicon-based thin-film photoelectric conversion device is manufactured simply and efficiently at a low cost. Specifically, a method of manufacturing the silicon-based thin-film photoelectric conversion device including a p-type semiconductor layer, an i-type microcrystalline silicon-based photoelectric conversion layer and an n-type semiconductor layer deposited by plasma CVD includes the steps of: successively depositing the p-type semiconductor layer, the i-type microcrystalline silicon-based photoelectric conversion layer and the n-type semiconductor layer on a substrate within the same plasma CVD film deposition chamber; transferring the substrate out of the film deposition chamber; and subsequently to the step of depositing the p-type semiconductor layer, the i-type microcrystalline silicon-based photoelectric conversion layer and the n-type semiconductor layer, eliminating influences of remaining n-type impurities on a cathode and/or within the film deposition chamber.
    • 以低成本简单高效地制造出优异的硅系薄膜光电转换元件。 具体而言,包括通过等离子体CVD沉积的p型半导体层,i型微晶硅系光电转换层和n型半导体层的硅基薄膜光电转换装置的制造方法包括以下步骤: :在相同的等离子体CVD膜沉积室内的基板上依次沉积p型半导体层,i型微晶硅基光电转换层和n型半导体层; 将所述衬底转移到所述成膜室内; 并且随后沉积p型半导体层,i型微晶硅基光电转换层和n型半导体层的步骤,消除了残留的n型杂质对阴极和/或膜内的影响 沉积室。