会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 2. 发明授权
    • Oxadiazole derivative
    • 恶二唑衍生物
    • US4994478A
    • 1991-02-19
    • US357623
    • 1989-05-18
    • Takashi KishimotoTakashi OkabeTomio YamadaMichihiko MatsudaYukio Kitagawa
    • Takashi KishimotoTakashi OkabeTomio YamadaMichihiko MatsudaYukio Kitagawa
    • A01N43/82A01N43/836A01N47/06A01N47/12A01N47/22A01N47/24C07D271/06C07D271/07C07D285/08C07D413/04C07D413/12C07D417/06
    • C07D271/06A01N43/82A01N47/06A01N47/12A01N47/22A01N47/24C07D271/07C07D285/08C07D413/04C07D417/06
    • The present invention relates to a compound having the formula ##STR1## (wherein R.sub.1 denotes a phenyl radical (which may be substituted by halogen atoms, C.sub.1-6 alkyl radicals, C.sub.1-6 alkoxy radicals (which may be substituted by C.sub.1-6 alkoxy radicals,) C.sub.2-6 alkynyloxy radicals, amino radicals, nitro radicals, phenyl radicals, phenoxy radicals or C.sub.1-6 alkylthio radicals), a five or six membered heterocyclic radical (which may be substituted by halogen atoms or C.sub.1-6 alkyl radicals), a C.sub.1-6 alkyl radical (which may be substituted by aryl radicals) or ##STR2## wherein each or r.sup.1 and r.sup.2 denotes a C.sub.1-6 alkyl radical or a phenyl radical)X denotes oxygen atom or sulfur atom;A denotes ##STR3## B denotes ##STR4## D denotes ##STR5## n, m and l denote 0 or 1, (wherein r.sup.3, r.sup.4, r.sup.6, r.sup.7, r.sup.9 and r.sup.10, respectively, denotes hydrogen atom, halogen atom, C.sub.1-6 alkyl radical, the radical expressed by the formula --Y-- r.sup.12 (wherein r.sup.12 denotes hydrogen atom, cyano radical, C.sub.1-6 alkyl radical (which may be substituted by C.sub.1-6 alkoxycarbonyl radicals,) cycloalkyl radical, C.sub.1-6 alkoxycarbonyl radical, C.sub.1-6 alkylcarbamoyl radical, C.sub.1-6 alkylthiocarbamoyl radical, phenylcarbamoyl radical (which may be substituted by halogen atom), phenylthiocarbamoyl radical (which may be substituted by halogen atoms), or C.sub.1-6 alkylcarbonyl radical (which may be substituted by halogen atoms); Y denotes oxygen atom, sulfur atom, --SO--, --SO.sub.2 --, or the radical expressed by the formula ##STR6## (r.sup.13 : hydrogen atom, C.sub.1-6 alkyl radical)), or oxo-radicals or the radical expressed by the formula NOr.sup.14 where r.sup.3 or r.sup.4 ; r.sup.6 and r.sup.7 or r.sup.9 and r.sup.10 are combined (wherein r.sup.14 denotes hydrogen atom, C.sub.1-6 alkyl radical, C.sub.1-6 alkylcarbonyl radical, or C.sub.1-6 alkylcarbamoyl radical), provided, however, that r.sup.6 may form a double bond in combination with r.sup.3 or r.sup.9 ; k, k' and k" denote 0, 1 or 2, respectively;r.sup.5, r.sup.8 and r.sup.11 each denote hydrogen atom or C.sub.1-6 alkyl radical;When A is ##STR7## however, m denotes 1. Further, A and B, or B and D do not simultaneously denote oxygen atoms or sulfur atoms.)R.sub.2 denotes a phenyl radical (which may be substituted by --Z--r.sup.15 (wherein r.sup.15 denotes hydrogen atom, C.sub.1-6 alkyl radical (which may be substituted by C.sub.1-6 alkoxycarbonyl radicals or halogen atoms), phenyl radicals, cycloalkyl radicals, the pyridyl radicals (which may be substituted by halogen atoms or C.sub.1-6 haloalkyl radicals), C.sub.1-6 alkylcarbamoyl radicals, or C.sub.1-6 alkylcarbonyl radicals; Z denotes oxygen atom, sulfur atom or the radicals expressed by the formula ##STR8## (wherein r.sup.14 denotes hydrogen atom or C.sub.1-6 alkyl radical), C.sub.1-6 alkyl radicals, halogen atoms or nitro radicals), a cycloalkyl radical, a naphthyl radical, a benzthiazolyl radical (which may be substituted by C.sub.1-6 alkoxy radicals or C.sub.1-6 alkylamino radicals or halophenylamino radicals), or a C.sub.1-6 alkyl radical which may be substituted by halogen atoms);its producing processes and an acaricidal composition comprising its compound as active ingredient(s).
    • 7. 发明授权
    • Exhaust gas treatment system
    • 废气处理系统
    • US08591633B2
    • 2013-11-26
    • US13610131
    • 2012-09-11
    • Tai OhuchiTakashi OkabeTsuyoshi Asano
    • Tai OhuchiTakashi OkabeTsuyoshi Asano
    • B01D53/22
    • C01B3/501B01D53/22B01D2256/16B01D2257/553B01D2258/0216C01B3/503C01B33/043C01B2203/0405C01B2203/0465C23C16/4412C23C16/52F23J15/006F23J2215/30H01J37/32844Y02C20/30Y02E60/324
    • An exhaust gas treatment system treats a mixed gas containing at least hydrogen and monosilane discharged from a semiconductor fabrication equipment. The exhaust gas treatment system includes a pump unit which emits the mixed gas discharged from the semiconductor fabrication equipment, a compressor which compresses the mixed gas emitted by the pump unit and sends the mixed gas to a rear stage, a gas accommodation unit which collects and accommodates the compressed mixed gas, a flow rate control unit which controls a flow rate of the mixed gas supplied from the gas accommodation unit, and a membrane separation unit which causes the hydrogen to selectively permeate therethrough and separates the monosilane and the hydrogen from the mixed gas. Accordingly, the exhaust gas treatment system may be stably operated in a state where a change in pressure of the mixed gas discharged from the semiconductor fabrication equipment is alleviated.
    • 废气处理系统处理从半导体制造设备排出的至少含有氢和甲硅烷的混合气体。 排气处理系统包括排出从半导体制造装置排出的混合气体的泵单元,压缩由泵单元排出的混合气体并将混合气体送入后段的压缩机,收集和 容纳压缩混合气体,流量控制单元,其控制从气体调节单元供应的混合气体的流量;以及膜分离单元,其使氢气选择性渗透通过其中,从混合气体中分离出甲硅烷和氢气 加油站。 因此,废气处理系统可以在从半导体制造装置排出的混合气体的压力变化得到缓解的状态下稳定地运行。