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1. 发明申请

US20230081742A1 GESTURE RECOGNITION 有权
公开(公告)号：US20230081742A1
公开(公告)日：2023-03-16
申请号：US17904214
申请日：2021-02-26
申请人： TRINAMIX GMBH
发明人： Jakob UNGER , Peter SCHILLEN , Patrick SCHINDLER , Christian LENNARTZ , Robert SEND
IPC分类号： G06V10/143 , G06V10/60 , G06V40/20 , G06V20/59
摘要： Disclosed herein is a detector for gesture detection including an illumination source configured for projecting an illumination pattern including a plurality of illumination features on an area including an object, where the object includes at least partially a human hand.

2. 发明申请

US20230078604A1 DETECTOR FOR OBJECT RECOGNITION 有权
公开(公告)号：US20230078604A1
公开(公告)日：2023-03-16
申请号：US17795890
申请日：2021-01-29
申请人： TRINAMIX GMBH
发明人： Benjamin REIN , Patrick SCHINDLER , Friedrich SCHICK , Jakob UNGER , Peter SCHILLEN , Nils BERNER
IPC分类号： G06T7/70 , G06T7/521 , G06T7/60 , G06V10/141 , G06V10/60
摘要： A detector for object recognition includes an illumination source for projecting an illumination pattern on an area including at least one object; an optical sensor having a light-sensitive area and configured for determining a first image including a two-dimensional image of the area, and a second image including a plurality of reflection features generated in response to illumination, each reflection feature including a beam profile; an evaluation device for determining beam profile information for each reflection feature by analyzing their beam profiles, determining a three-dimensional image using the determined beam profile information, identifying the reflection features located inside and/or outside an image region, determining a depth level from the beam profile information of the reflection features located inside and/or outside of the image region, determining a material property of the object from the beam profile information, and determining a position and/or orientation of the object.

3. 发明公开

US20240020864A1 AUTO CALIBRATION FROM EPIPOLAR LINE DISTANCE IN PROJECTION PATTERN 审中-公开
公开(公告)号：US20240020864A1
公开(公告)日：2024-01-18
申请号：US18363420
申请日：2023-08-01
申请人： TRINAMIX GMBH
发明人： Patrick SCHINDLER , Friedrich SCHICK , Christian LENNARTZ , Peter SCHILLEN , Jakob UNGER
IPC分类号： G06T7/521 , G06T7/80
CPC分类号： G06T7/521 , G06T7/80
摘要： A detector for determining a position of at least one object, the detector including:

at least one projector for illuminating the object with at least one illumination pattern;
at least one sensor element having a matrix of optical sensors; and
at least one evaluation device configured for determining initial distance information of reflection features by analysis of their respective beam profiles, where the evaluation device is configured for performing a calibration method.

4. 发明公开

US20240241255A1 DETECTOR FOR IDENTIFYING AT LEAST ONE MATERIAL PROPERTY 审中-公开
公开(公告)号：US20240241255A1
公开(公告)日：2024-07-18
申请号：US18425144
申请日：2024-01-29
申请人： TrinamiX GmbH
发明人： Friedrich SCHICK , Peter SCHILLEN , Patrick SCHINDLER , Andre SCHMIDT , Michael EBERSPACH , Christian LENNARTZ , Robert SEND , Lars DIESSELBERG , Heiko HENGEN , Ingmar BRUDER , Jakob UNGER , Christian BONSIGNORE
IPC分类号： G01S17/46 , G01B11/22 , G01C21/16 , G01S17/66 , G06T5/20 , G06T5/70 , G06T7/20 , G06T7/521 , G06T7/73 , G06V10/145 , G06V10/60 , G06V10/764 , H04N23/56 , H04N23/74
CPC分类号： G01S17/46 , G01B11/22 , G01C21/16 , G01S17/66 , G06T5/20 , G06T5/70 , G06T7/20 , G06T7/521 , G06T7/73 , G06V10/145 , G06V10/60 , G06V10/764 , H04N23/56 , H04N23/74
摘要： Described herein is a detector for identifying at least one material property m. The detector includes at least one sensor element including a matrix of optical sensors, the optical sensors each having a light-sensitive area. The sensor element is configured for recording at least one reflection image of a light beam originating from at least one object. The detector includes at least one evaluation device configured for determining the material property m by evaluation of at least one beam profile of the reflection image and evaluation of a material feature ϕ2m.

5. 发明公开

US20240011891A1 ENHANCED MATERIAL DETECTION BY STEREO BEAM PROFILE ANALYSIS 审中-公开
公开(公告)号：US20240011891A1
公开(公告)日：2024-01-11
申请号：US18363488
申请日：2023-08-24
申请人： TRINAMIX GMBH
发明人： Patrick SCHINDLER , Ruben HUEHNERBEIN , Christian LENNARTZ , Jakob UNGER
IPC分类号： G01N21/01 , H04N13/254 , H04N13/239 , G06V10/764 , G06V10/145 , G06V10/147 , G06V10/60 , G06V10/75
CPC分类号： G01N21/01 , H04N13/254 , H04N13/239 , G06V10/764 , G06V10/145 , G06V10/147 , G06V10/60 , G06V10/759 , G06V10/751 , G01N2021/0106 , G01N2021/177
摘要： A detector (110) for determining at least one material property of at least one object (112) is proposed. The detector (110) comprises

at least one projector (116) configured for illuminating the object (112) with at least one illumination pattern (118) comprising a plurality of illumination features (120);
at least one first camera (122) having at least one first sensor element, wherein the first sensor element has a matrix of first optical sensors, the first optical sensors each having a light-sensitive area, wherein each first optical sensor is designed to generate at least one sensor signal in response to an illumination of its respective light-sensitive area by a reflection light beam propagating from the object (112) to the first camera (122), wherein the first camera (122) is configured for imaging at least one first reflection image comprising a plurality of first reflection features generated by the object (112) in response to illumination by the illumination features (120), wherein the first camera (122) is arranged such that the first reflection image is imaged under a first direction of view to the object (112);
at least one second camera (124) having at least one second sensor element, wherein the second sensor element has a matrix of second optical sensors, the second optical sensors each having a light-sensitive area, wherein each second optical sensor is designed to generate at least one sensor signal in response to an illumination of its respective light-sensitive area by a reflection light beam propagating from the object (112) to the second camera (124), wherein the second camera (124) is configured for imaging at least one second reflection image comprising a plurality of second reflection features generated by the object (112) in response to illumination by the illumination feature (120), wherein the second camera (124) is arranged such that the second reflection image is imaged under a second direction of view to the object (112), wherein the first direction of view and the second direction of view differ;
at least one evaluation device (126) configured for evaluating the first reflection image and the second reflection image, wherein the evaluation comprises matching the first reflection features and the second reflection features and determining a combined material property of matched pairs of first and second reflection features by analysis of their beam profiles.

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