专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

US08786298B2 Apparatus and method for near field scan calibration 失效
标题翻译：用于近场扫描校准的装置和方法
公开(公告)号：US08786298B2
公开(公告)日：2014-07-22
申请号：US13323842
申请日：2011-12-13
申请人： Soon Il Yeo , Jae Kyung Wee , Pil Soo Lee
发明人： Soon Il Yeo , Jae Kyung Wee , Pil Soo Lee
IPC分类号： G01R31/00 , G01R35/00 , G01R29/08
CPC分类号： G01R35/00 , G01R29/0814 , G01R29/0892
摘要： Disclosed are a method and an apparatus of near field scan calibration, and more particularly, a method and an apparatus for near field scan calibration for calibrating a characteristic of an antenna for near field scan measurement of a semiconductor chip. The apparatus for near field scan calibration includes: a plane-type text fixture having a plane shape; an antenna positioned spaced apart from the plane-type test fixture by a set spacing distance and acquiring data including a magnetic field; and a spectrum analyzer analyzing the data acquired by the antenna.
摘要翻译：公开了近场扫描校准的方法和装置，更具体地，涉及用于校准半导体芯片的近场扫描测量的天线的特性的近场扫描校准的方法和装置。用于近场扫描校准的装置包括：具有平面形状的平面型文本夹具; 天线，其与平面型测试夹具间隔一定距离并获取包括磁场的数据; 以及分析由天线获取的数据的频谱分析仪。

2. 发明申请

US20120161803A1 APPARATUS AND METHOD FOR NEAR FIELD SCAN CALIBRATION 失效
标题翻译：近场扫描校准的装置和方法
公开(公告)号：US20120161803A1
公开(公告)日：2012-06-28
申请号：US13323842
申请日：2011-12-13
申请人： SOON IL YEO , Jae Kyung Wee , Pil Soo Lee
发明人： SOON IL YEO , Jae Kyung Wee , Pil Soo Lee
IPC分类号： G01R35/00
CPC分类号： G01R35/00 , G01R29/0814 , G01R29/0892
摘要： Disclosed are a method and an apparatus of near field scan calibration, and more particularly, a method and an apparatus for near field scan calibration for calibrating a characteristic of an antenna for near field scan measurement of a semiconductor chip. The apparatus for near field scan calibration includes: a plane-type text fixture having a plane shape; an antenna positioned spaced apart from the plane-type test fixture by a set spacing distance and acquiring data including a magnetic field; and a spectrum analyzer analyzing the data acquired by the antenna.
摘要翻译：公开了近场扫描校准的方法和装置，更具体地，涉及用于校准半导体芯片的近场扫描测量的天线的特性的近场扫描校准的方法和装置。用于近场扫描校准的装置包括：具有平面形状的平面型文本夹具; 天线，其与平面型测试夹具间隔一定距离并获取包括磁场的数据; 以及分析由天线获取的数据的频谱分析仪。

3. 发明授权

US06583654B2 Clock synchronization device 失效
标题翻译：时钟同步装置
公开(公告)号：US06583654B2
公开(公告)日：2003-06-24
申请号：US10139889
申请日：2002-05-06
申请人： Se Jun Kim , Jae Kyung Wee
发明人： Se Jun Kim , Jae Kyung Wee
IPC分类号： H03L700
CPC分类号： H03L7/0812 , H03L7/089
摘要： A clock synchronization device is disclosed that includes a phase detecting unit for detecting a phase difference between an external clock signal and an internal clock signal, a binary code generating unit for outputting a binary code value according to output signals from the phase detecting unit, a code converting unit for converting the binary code value from the binary code generating unit into a thermometer code value, a D/A converting unit for outputting a voltage corresponding to the thermometer code value from the code converting unit and a clock synchronization control unit for outputting the internal clock signal from the external clock signal according to the output voltage from the D/A converting unit. As the result, the clock synchronization device is controlled by employing the D/A converting unit for converting the binary code to the thermometer code in order to decrease the number of the registers, the leakage current and the chip size.
摘要翻译：公开了一种时钟同步装置，包括用于检测外部时钟信号和内部时钟信号之间的相位差的相位检测单元，用于根据来自相位检测单元的输出信号输出二进制码值的二进制码产生单元，代码转换单元，用于将来自二进制代码生成单元的二进制代码值转换为温度计代码值; D / A转换单元，用于从代码转换单元输出与温度计代码值相对应的电压;以及时钟同步控制单元，用于输出来自外部时钟信号的内部时钟信号根据来自D / A转换单元的输出电压。结果，通过采用用于将二进制码转换为温度计代码的D / A转换单元来控制时钟同步装置，以便减少寄存器的数量，漏电流和芯片尺寸。

4. 发明授权

US06366118B2 Antifuse repair circuit 失效
标题翻译：防腐修复电路
公开(公告)号：US06366118B2
公开(公告)日：2002-04-02
申请号：US09790019
申请日：2001-02-21
申请人： Jin Keun Oh , Jae Kyung Wee , Chang Hyuk Lee , Phil Jung Kim
发明人： Jin Keun Oh , Jae Kyung Wee , Chang Hyuk Lee , Phil Jung Kim
IPC分类号： G06F738
CPC分类号： G11C17/18 , G11C29/785
摘要： An antifuse repair circuit is disclosed for selectively programming a specific antifuse to replace a defective cell with a redundant cell. The antifuse repair circuit includes: (a) a special test mode decoder for selecting an antifuse box according to an address signal; (b) a bank selector for selecting an antifuse bank according to the output signal from the special test mode decoder and the address signal; (c) a special address multiplexer for selecting a specific antifuse within an antifuse bank selected by the bank selector according to the output signal from the bank selector and the address signal; (d) a negative voltage generator for generating a negative voltage to program an antifuse device; (e) a power-up detector for detecting the supply voltage to generate a plurality of control signals in order to detect whether the antifuse device is programmed; (f) a unit antifuse circuit for programming the antifuse device according to the signals from the special test mode detector, the special address multiplexer, the negative voltage generator and the power-up detector; and (g) a repair circuit responsive to the output signal from the unit antifuse circuit and an external control signal to replace a defective cell with a redundant cell.
摘要翻译：公开了一种反熔丝修复电路，用于选择性地编程特定反熔丝以用冗余单元替换有缺陷的单元。反熔丝修复电路包括：（a）专用测试模式解码器，用于根据地址信号选择反熔丝; （b）根据来自特殊测试模式解码器的输出信号和地址信号选择反熔丝组的存储体选择器; （c）专用地址多路复用器，用于根据来自存储体选择器的输出信号和地址信号，选择由存储体选择器选择的反熔丝库内的特定反熔丝; （d）用于产生负电压以编程反熔丝装置的负电压发生器; （e）上电检测器，用于检测电源电压以产生多个控制信号，以便检测反熔丝装置是否被编程; （f）用于根据来自特殊测试模式检测器，专用地址多路复用器，负电压发生器和上电检测器的信号对反熔丝装置进行编程的单元反熔丝电路; 和（g）响应于来自单元反熔丝电路的输出信号的修复电路和外部控制信号以用冗余单元替换有缺陷的单元。

5. 发明授权

US06240033B1 Antifuse circuitry for post-package DRAM repair 有权
标题翻译：用于后封装DRAM修复的防漏电路
公开(公告)号：US06240033B1
公开(公告)日：2001-05-29
申请号：US09479665
申请日：2000-01-10
申请人： Woodward Yang , Joo Sun Choi , Jae Kyung Wee , Young Ho Seol , Jin Keun Oh , Phil Jung Kim , Ho Youe Cho
发明人： Woodward Yang , Joo Sun Choi , Jae Kyung Wee , Young Ho Seol , Jin Keun Oh , Phil Jung Kim , Ho Youe Cho
IPC分类号： G11C700
CPC分类号： G11C29/781 , G11C17/18
摘要： The anti-fuse circuit includes three sub-blocks: a multiplexer having inputs of control signals and addresses and yielding the activation of a programming signal and program addresses; a programming voltage generator consisting of an oscillator and a charge pump; and an anti-fuse unit circuits for the program/read of anti-fuse states. For an anti-fuse program at the special test mode, a program address generation circuit having inputs of control signals and addresses activates the programming voltage generator and makes a special or program address for selection of anti-fuse. In the normal mode, the program address generation circuit and an internal power generator remain at an inactive state. In anti-fuse unit circuit, the program address and the programming voltage signal from the programming voltage generator serve to switch the terminal of the anti-fuse up to a programming voltage level when the anti-fuse is selected for programming of anti-fuse elements.
摘要翻译：反熔丝电路包括三个子块：具有控制信号和地址的输入并产生编程信号和程序地址的激活的多路复用器; 由振荡器和电荷泵组成的编程电压发生器; 以及用于编程/读取反熔丝状态的反熔丝单元电路。对于在特殊测试模式下的反熔丝程序，具有控制信号和地址的输入的程序地址产生电路激活编程电压发生器，并产生用于选择反熔丝的特殊或程序地址。在正常模式中，程序地址产生电路和内部发电机保持在非工作状态。在反熔丝单元电路中，编程电压发生器的程序地址和编程电压信号用于在反熔丝被选择用于编程抗熔丝元件时将反熔丝的端子切换到编程电压电平。

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式