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    • 5. 发明授权
    • Semiconductor device
    • 半导体器件
    • US08629526B2
    • 2014-01-14
    • US13233941
    • 2011-09-15
    • Tsuyoshi OhtaMasatoshi AraiMiwako Suzuki
    • Tsuyoshi OhtaMasatoshi AraiMiwako Suzuki
    • H01L29/47
    • H01L29/872H01L29/0619H01L29/36H01L29/402H01L29/66136H01L29/66143H01L29/861
    • According to one embodiment, a semiconductor device includes a first semiconductor layer of a first conductivity type, a plurality of second semiconductor regions of a second conductivity type, a third semiconductor region of the second conductivity type and a first electrode. The second regions are provided separately on a first major surface side of the first layer. The third region is provided on the first major surface side of the first layer so as to surround the second regions. The first electrode is provided on the first layer and the second regions. The first layer has a first portion and a second portion. The second portion has a lower resistivity than the first portion. The second portion is provided between the second regions and between the first portion and the first major surface and is provided outside the third region and between the first portion and the first major surface.
    • 根据一个实施例,半导体器件包括第一导电类型的第一半导体层,第二导电类型的多个第二半导体区域,第二导电类型的第三半导体区域和第一电极。 第二区域分别设置在第一层的第一主表面侧。 第三区域设置在第一层的第一主表面侧,以围绕第二区域。 第一电极设置在第一层和第二区域上。 第一层具有第一部分和第二部分。 第二部分具有比第一部分更低的电阻率。 第二部分设置在第二区域之间以及第一部分与第一主表面之间,并且设置在第三区域的外部以及第一部分与第一主表面之间。
    • 6. 发明授权
    • Image sensor, semiconductor device and image sensing method
    • 图像传感器,半导体器件和图像感测方法
    • US08576319B2
    • 2013-11-05
    • US12929004
    • 2010-12-22
    • Masatoshi KuretaMasatoshi AraiTakeharu EtohKonoe EtohToshiaki Akino
    • Masatoshi KuretaMasatoshi AraiTakeharu EtohKonoe EtohToshiaki Akino
    • H04N3/14H04N5/335H04N9/04
    • H04N5/335H01L27/14806H04N5/3592H04N5/37213H04N5/3728
    • An image sensor and an image sensing method can obtain image signals with a high S/N ratio in a high-speed image pickup operation. Signal charges are input to input transfer stage 31 of CCD memory 30. Final transfer stage 32 is formed so as to be connected to the input transfer stage 31 and able to transfer signal charges to the input transfer stage 31. In an accumulation mode, read gate 42 and drain gate 40 are not turned on and the next transfer operation of the CCD memory 30 is conducted. The accumulated signal charges are transferred on a stage by stage basis and the signal charges obtained at the first image pickup timing are transferred again straightly to the input transfer stage 31. In this state, the signal charges obtained newly at photoelectric conversion section 20 at the next image pickup timing are injected into the input transfer stage 31 by way of input gate 21. As a result of this operation, the signal charges obtained at the last image pickup timing are added to the signal charges accumulated in the input transfer stage 31 so that integrated signal charges obtained by adding the two sets of signal charges are accumulated in the input transfer stage 31.
    • 图像传感器和图像感测方法可以在高速图像拾取操作中获得具有高S / N比的图像信号。 信号电荷被输入到CCD存储器30的输入传送级31.最终传送级32被形成为连接到输入传送级31并且能够将信号电荷传送到输入传送级31.在累加模式下,读取 门42和漏极门40不导通,并且进行CCD存储器30的下一个传送操作。 累积的信号电荷逐级传送,并且在第一摄像定时获得的信号电荷被直接传送到输入传送级31.在这种状态下,在光电转换部20新获得的信号电荷 下一个图像拾取定时通过输入门21被注入到输入传送级31.作为该操作的结果,在最后图像拾取定时获得的信号电荷被加到累积在输入传送级31中的信号电荷 通过添加两组信号电荷而获得的积分信号电荷被积累在输入传送级31中。
    • 9. 发明申请
    • SEMICONDUCTOR DEVICE
    • 半导体器件
    • US20120241853A1
    • 2012-09-27
    • US13236588
    • 2011-09-19
    • Tsuyoshi OHTAMasatoshi AraiMiwako Suzuki
    • Tsuyoshi OHTAMasatoshi AraiMiwako Suzuki
    • H01L29/78
    • H01L29/7813H01L29/0619H01L29/407H01L29/42368H01L29/456H01L29/47H01L29/66143H01L29/7806H01L29/872H01L29/8725
    • A semiconductor layer has a second impurity concentration. First trenches are formed in the semiconductor layer to extend downward from an upper surface of the semiconductor layer. Each of insulation layers is formed along each of the inner walls of the first trenches. Each of conductive layers is formed to bury each of the first trenches via each of the insulation layers, and extends downward from the upper surface of the semiconductor layer to a first position. A first semiconductor diffusion layer reaches a second position from the upper surface of the semiconductor layer, is positioned between the first trenches, and has a third impurity concentration lower than the second impurity concentration. A length from the upper surface of the semiconductor layer to the second position is equal to or less than half a length from the upper surface of the semiconductor layer to the first position.
    • 半导体层具有第二杂质浓度。 第一沟槽形成在半导体层中,从半导体层的上表面向下延伸。 每个绝缘层沿着第一沟槽的每个内壁形成。 每个导电层被形成为经由每个绝缘层埋入每个第一沟槽,并且从半导体层的上表面向下延伸到第一位置。 第一半导体扩散层从半导体层的上表面到达第二位置,位于第一沟槽之间,并且具有低于第二杂质浓度的第三杂质浓度。 从半导体层的上表面到第二位置的长度等于或小于从半导体层的上表面到第一位置的一半长度。
    • 10. 发明申请
    • Image sensor, semiconductor device and image sensing method
    • 图像传感器,半导体器件和图像感测方法
    • US20110157448A1
    • 2011-06-30
    • US12929004
    • 2010-12-22
    • Masatoshi KuretaMasatoshi AraiTakeharu EtohKonoe EtohToshiaki Akino
    • Masatoshi KuretaMasatoshi AraiTakeharu EtohKonoe EtohToshiaki Akino
    • H04N5/335H01L27/148
    • H04N5/335H01L27/14806H04N5/3592H04N5/37213H04N5/3728
    • An image sensor and an image sensing method can obtain image signals with a high S/N ratio in a high-speed image pickup operation. Signal charges are input to input transfer stage 31 of CCD memory 30. Final transfer stage 32 is formed so as to be connected to the input transfer stage 31 and able to transfer signal charges to the input transfer stage 31. In an accumulation mode, read gate 42 and drain gate 40 are not turned on and the next transfer operation of the CCD memory 30 is conducted. The accumulated signal charges are transferred on a stage by stage basis and the signal charges obtained at the first image pickup timing are transferred again straightly to the input transfer stage 31. In this state, the signal charges obtained newly at photoelectric conversion section 20 at the next image pickup timing are injected into the input transfer stage 31 by way of input gate 21. As a result of this operation, the signal charges obtained at the last image pickup timing are added to the signal charges accumulated in the input transfer stage 31 so that integrated signal charges obtained by adding the two sets of signal charges are accumulated in the input transfer stage 31.
    • 图像传感器和图像感测方法可以在高速图像拾取操作中获得具有高S / N比的图像信号。 信号电荷被输入到CCD存储器30的输入传送级31.最终传送级32被形成为连接到输入传送级31并且能够将信号电荷传送到输入传送级31.在累加模式下,读取 门42和漏极门40不导通,并且进行CCD存储器30的下一个传送操作。 累积的信号电荷逐级传送,并且在第一摄像定时获得的信号电荷被直接传送到输入传送级31.在这种状态下,在光电转换部20新获得的信号电荷 下一个图像拾取定时通过输入门21被注入到输入传送级31.作为该操作的结果,在最后图像拾取定时获得的信号电荷被加到累积在输入传送级31中的信号电荷 通过添加两组信号电荷而获得的积分信号电荷被积累在输入传送级31中。