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热词
    • 10. 发明授权
    • Thermally enhanced test socket
    • 热增强测试插座
    • US06072322A
    • 2000-06-06
    • US631
    • 1997-12-30
    • Ram S. ViswanathMartin M. Maxwell
    • Ram S. ViswanathMartin M. Maxwell
    • G01R1/04G01R31/28G01R31/02
    • G01R31/2863G01R1/0483G01R31/2874
    • A test socket having a heat slug for removing heat from an electronic device positioned within the socket. In one embodiment the test socket includes a burn-in board electrically coupled to a test unit that generates a series of test signals to test the performance of the electronic device. Examples of electronic devices that can be tested by the test socket are integrated circuit packages such as tape carrier packages (TCP), ball grid arrays (BGA), pin grid arrays (PGA), land grid arrays (LGA), and other packages. The integrated circuit package is positioned within the socket which electrically connects the package to a printed circuit board, such as a burn-in board. The test socket includes an opening in which a heat slug is disposed. The heat slug has a contact surface that contacts the integrated circuit device under test. In another embodiment, the socket includes a lid having a heat slug attached to the lid, which heat slug has a contact surface that contacts an integrated circuit device under test.
    • 一种测试插座,其具有用于从位于插座内的电子设备移除热量的热塞。 在一个实施例中,测试插座包括电耦合到测试单元的老化板,其生成一系列测试信号以测试电子设备的性能。 可以通过测试插座测试的电子设备的例子是集成电路封装,例如带状载体封装(TCP),球栅阵列(BGA),引脚格栅阵列(PGA),光栅阵列(LGA)和其它封装。 集成电路封装位于插座内,该插座将封装电连接到印刷电路板,例如老化板。 测试插座包括其中设置有热塞的开口。 散热片具有与待测集成电路器件接触的接触表面。 在另一个实施例中,插座包括具有附接到盖子的散热片的盖子,该热塞具有接触被测试集成电路器件的接触表面。