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    • 7. 发明授权
    • Method and apparatus for detecting free fall of electronic device
    • 用于检测电子设备自由落体的方法和装置
    • US07328615B2
    • 2008-02-12
    • US11236595
    • 2005-09-28
    • Woong KwonKyung-shik RohWoo-sup HanYoung-bo ShimSang-min Suh
    • Woong KwonKyung-shik RohWoo-sup HanYoung-bo ShimSang-min Suh
    • G01P15/00
    • G11B19/04G01P15/00G01P15/0891G01P15/18
    • A method and apparatus for detecting a free fall of an electronic device. The method includes: sensing a falling acceleration of the electronic device using an acceleration sensor; determining whether the sensed falling acceleration is less than a predetermined threshold; when the sensed falling acceleration is less than the predetermined threshold, determining whether the falling acceleration is a statistical constant, which has a statistical significance, and is maintained for a predetermined time; and when the falling acceleration is a statistical constant and maintained for a predetermined time, determining that the electronic device falls freely. Accordingly, it is possible to exactly detect a free fall of an electronic device, irrespective of an error of the acceleration of gravity generated when a falling acceleration of the electronic device is measured, due to ambient conditions, e.g., a temperature change and a rotation acceleration generated when the electronic device rotates.
    • 一种用于检测电子设备的自由落体的方法和装置。 该方法包括:使用加速度传感器感测电子装置的下降加速度; 确定所感测的下降加速度是否小于预定阈值; 当感测到的下降加速度小于预定阈值时,确定下降加速度是否具有统计意义的统计常数,并保持预定时间; 并且当下降加速度是统计常数并保持预定时间时,确定电子设备自由落下。 因此,可以精确地检测电子设备的自由落体,而不管由于环境条件(例如温度变化和旋转)而测量电子设备的下降加速度时产生的重力加速度的误差 当电子设备旋转时产生的加速度。
    • 10. 发明申请
    • Method and apparatus for detecting free fall of electronic device
    • 用于检测电子设备自由落体的方法和装置
    • US20060070439A1
    • 2006-04-06
    • US11236595
    • 2005-09-28
    • Woong KwonKyung-shik RohWoo-sup HanYoung-bo ShimSang-min Suh
    • Woong KwonKyung-shik RohWoo-sup HanYoung-bo ShimSang-min Suh
    • G01P15/00
    • G11B19/04G01P15/00G01P15/0891G01P15/18
    • A method and apparatus for detecting a free fall of an electronic device. The method includes: sensing a falling acceleration of the electronic device using an acceleration sensor; determining whether the sensed falling acceleration is less than a predetermined threshold; when the sensed falling acceleration is less than the predetermined threshold, determining whether the falling acceleration is a statistical constant, which has a statistical significance, and is maintained for a predetermined time; and when the falling acceleration is a statistical constant and maintained for a predetermined time, determining that the electronic device falls freely. Accordingly, it is possible to exactly detect a free fall of an electronic device, irrespective of an error of the acceleration of gravity generated when a falling acceleration of the electronic device is measured, due to ambient conditions, e.g., a temperature change and a rotation acceleration generated when the electronic device rotates.
    • 一种用于检测电子设备的自由落体的方法和装置。 该方法包括:使用加速度传感器感测电子装置的下降加速度; 确定所感测的下降加速度是否小于预定阈值; 当感测到的下降加速度小于预定阈值时,确定下降加速度是否具有统计意义的统计常数,并保持预定时间; 并且当下降加速度是统计常数并保持预定时间时,确定电子设备自由落下。 因此,可以精确地检测电子设备的自由落体,而不管由于环境条件(例如温度变化和旋转)而测量电子设备的下降加速度时产生的重力加速度的误差 当电子设备旋转时产生的加速度。