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    • 6. 发明授权
    • Method of producing a hollow body of semiconductor material
    • 生产半导体材料的中空体的方法
    • US3853974A
    • 1974-12-10
    • US33429473
    • 1973-02-21
    • SIEMENS AG
    • REUSCHEL KDIETZE W
    • C01B33/02C23C16/01C23C16/24B01J17/28B29C13/04
    • C23C16/24C01B33/02C23C16/01Y10S148/007Y10S148/025Y10S148/027Y10S148/049Y10S148/073Y10S148/122
    • An at least unilaterally open hollow body of silicon or other semiconductor material is produced by thermally reducing a gaseous compound of the same material and precipitating the segregated material upon a heated carrier of different material, preferably graphite or other industrial carbon, and thereafter removing the resulting hollow semiconductor body from the carrier. The gaseous compound is supplied to the heated carrier in mixture with a reduction gas, preferably hydrogen, in a molar ratio that substantially corresponds to the reaction equilibrium at the carrier temperature obtaining at the beginning of the reduction and precipitation process. After the precipitated hollow body has reached a layer thickness of a few microns, the molar ratio is changed so as to increase the rate of precipitation. The method can be modified by changing the throughput of the gaseous mixtures from a lower to a higher value after a layer thickness of a few microns has been reached and then continuing the precipitation at a higher rate until the desired full layer thickness is obtained.
    • 通过热还原相同材料的气态化合物并将分离的材料沉淀在不同材料,优选石墨或其它工业碳的加热载体上,然后除去所得到的至少单向开放的硅或其它半导体材料的中空体 中空半导体体从载体。 将气态化合物与还原气体(优选氢气)混合加入到加热的载体中,其摩尔比基本上对应于在还原和沉淀过程开始时获得的载体温度下的反应平衡。 在沉淀的中空体已经达到几微米的层厚度之后,改变摩尔比以增加沉淀速率。 可以通过在达到几微米的层厚度之后将气态混合物的生产量从较低值改变为更高的值,然后以更高的速率继续沉淀直到获得所需的全层厚度来修改该方法。